SubNanometer Depth Profiling of Native Metal Oxide Layers Within Single FixedAngle XRay Photoelectron Spectra
M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J. Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).