Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe
M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel, Applied Surface Science 713 (2025).