---
_id: '5971'
article_number: '222402 '
author:
- first_name: Christian
  full_name: Schröder, Christian
  id: '35809'
  last_name: Schröder
  orcid: 0000-0002-6391-6548
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-6391-6548/work/186776136
- first_name: Bereket
  full_name: Ghebretinsae, Bereket
  last_name: Ghebretinsae
- first_name: Martin
  full_name: Lonsky, Martin
  last_name: Lonsky
- first_name: Mohanad
  full_name: Al Mamoori, Mohanad
  last_name: Al Mamoori
- first_name: Fabrizio
  full_name: Porrati, Fabrizio
  last_name: Porrati
- first_name: Michael
  full_name: Huth, Michael
  last_name: Huth
- first_name: Jens
  full_name: Müller, Jens
  last_name: Müller
citation:
  alphadin: '<span style="font-variant:small-caps;">Schröder, Christian</span> ; <span
    style="font-variant:small-caps;">Ghebretinsae, Bereket</span> ; <span style="font-variant:small-caps;">Lonsky,
    Martin</span> ; <span style="font-variant:small-caps;">Al Mamoori, Mohanad</span>
    ; <span style="font-variant:small-caps;">Porrati, Fabrizio</span> ; <span style="font-variant:small-caps;">Huth,
    Michael</span> ; <span style="font-variant:small-caps;">Müller, Jens</span>: Origin
    of magnetic switching cascades in nanostructured Co3Fe tetrapods. In: <i>Applied
    Physics Letters</i> Bd. 126, AIP Publishing (2025), Nr. 22'
  ama: Schröder C, Ghebretinsae B, Lonsky M, et al. Origin of magnetic switching cascades
    in nanostructured Co3Fe tetrapods. <i>Applied Physics Letters</i>. 2025;126(22).
    doi:<a href="https://doi.org/10.1063/5.0254061">10.1063/5.0254061</a>
  apa: Schröder, C., Ghebretinsae, B., Lonsky, M., Al Mamoori, M., Porrati, F., Huth,
    M., &#38; Müller, J. (2025). Origin of magnetic switching cascades in nanostructured
    Co3Fe tetrapods. <i>Applied Physics Letters</i>, <i>126</i>(22). <a href="https://doi.org/10.1063/5.0254061">https://doi.org/10.1063/5.0254061</a>
  bibtex: '@article{Schröder_Ghebretinsae_Lonsky_Al Mamoori_Porrati_Huth_Müller_2025,
    title={Origin of magnetic switching cascades in nanostructured Co3Fe tetrapods},
    volume={126}, DOI={<a href="https://doi.org/10.1063/5.0254061">10.1063/5.0254061</a>},
    number={22222402}, journal={Applied Physics Letters}, publisher={AIP Publishing},
    author={Schröder, Christian and Ghebretinsae, Bereket and Lonsky, Martin and Al
    Mamoori, Mohanad and Porrati, Fabrizio and Huth, Michael and Müller, Jens}, year={2025}
    }'
  chicago: Schröder, Christian, Bereket Ghebretinsae, Martin Lonsky, Mohanad Al Mamoori,
    Fabrizio Porrati, Michael Huth, and Jens Müller. “Origin of Magnetic Switching
    Cascades in Nanostructured Co3Fe Tetrapods.” <i>Applied Physics Letters</i> 126,
    no. 22 (2025). <a href="https://doi.org/10.1063/5.0254061">https://doi.org/10.1063/5.0254061</a>.
  ieee: C. Schröder <i>et al.</i>, “Origin of magnetic switching cascades in nanostructured
    Co3Fe tetrapods,” <i>Applied Physics Letters</i>, vol. 126, no. 22, 2025.
  mla: Schröder, Christian, et al. “Origin of Magnetic Switching Cascades in Nanostructured
    Co3Fe Tetrapods.” <i>Applied Physics Letters</i>, vol. 126, no. 22, 222402, AIP
    Publishing, 2025, doi:<a href="https://doi.org/10.1063/5.0254061">10.1063/5.0254061</a>.
  short: C. Schröder, B. Ghebretinsae, M. Lonsky, M. Al Mamoori, F. Porrati, M. Huth,
    J. Müller, Applied Physics Letters 126 (2025).
date_created: 2025-06-27T06:56:30Z
date_updated: 2026-03-17T15:29:24Z
department:
- _id: '103'
doi: 10.1063/5.0254061
intvolume: '       126'
issue: '22'
language:
- iso: eng
project:
- _id: f89a05bb-bcea-11ed-9442-ed382659bc06
  name: Bielefelder Institut für Angewandte Materialforschung
publication: Applied Physics Letters
publication_identifier:
  eissn:
  - 1077-3118
  issn:
  - 0003-6951
publication_status: published
publisher: AIP Publishing
quality_controlled: '1'
research_group:
- _id: af778127-b366-11ed-bde2-daed2b8eafee
  name: Bielefelder Institut für Angewandte Materialforschung (BIfAM)
status: public
title: Origin of magnetic switching cascades in nanostructured Co3Fe tetrapods
type: journal_article
user_id: '220548'
volume: 126
year: '2025'
...
---
_id: '2683'
author:
- first_name: J.
  full_name: Schleiwies, J.
  last_name: Schleiwies
- first_name: G.
  full_name: Schmitz, G.
  last_name: Schmitz
- first_name: Sonja
  full_name: Heitmann, Sonja
  id: '202389'
  last_name: Heitmann
  orcid: 0000-0002-5503-2128
- first_name: A.
  full_name: Hütten, A.
  last_name: Hütten
citation:
  alphadin: '<span style="font-variant:small-caps;">Schleiwies, J.</span> ; <span
    style="font-variant:small-caps;">Schmitz, G.</span> ; <span style="font-variant:small-caps;">Heitmann,
    Sonja</span> ; <span style="font-variant:small-caps;">Hütten, A.</span>: Nanoanalysis
    of Co/Cu/NiFe thin films by tomographic atom probe. In: <i>Applied Physics Letters</i>
    Bd. 78, AIP Publishing (2001), Nr. 22, S. 3439–3441'
  ama: Schleiwies J, Schmitz G, Heitmann S, Hütten A. Nanoanalysis of Co/Cu/NiFe thin
    films by tomographic atom probe. <i>Applied Physics Letters</i>. 2001;78(22):3439-3441.
    doi:<a href="https://doi.org/10.1063/1.1374999">10.1063/1.1374999</a>
  apa: Schleiwies, J., Schmitz, G., Heitmann, S., &#38; Hütten, A. (2001). Nanoanalysis
    of Co/Cu/NiFe thin films by tomographic atom probe. <i>Applied Physics Letters</i>,
    <i>78</i>(22), 3439–3441. <a href="https://doi.org/10.1063/1.1374999">https://doi.org/10.1063/1.1374999</a>
  bibtex: '@article{Schleiwies_Schmitz_Heitmann_Hütten_2001, title={Nanoanalysis of
    Co/Cu/NiFe thin films by tomographic atom probe}, volume={78}, DOI={<a href="https://doi.org/10.1063/1.1374999">10.1063/1.1374999</a>},
    number={22}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Schleiwies,
    J. and Schmitz, G. and Heitmann, Sonja and Hütten, A.}, year={2001}, pages={3439–3441}
    }'
  chicago: 'Schleiwies, J., G. Schmitz, Sonja Heitmann, and A. Hütten. “Nanoanalysis
    of Co/Cu/NiFe Thin Films by Tomographic Atom Probe.” <i>Applied Physics Letters</i>
    78, no. 22 (2001): 3439–41. <a href="https://doi.org/10.1063/1.1374999">https://doi.org/10.1063/1.1374999</a>.'
  ieee: J. Schleiwies, G. Schmitz, S. Heitmann, and A. Hütten, “Nanoanalysis of Co/Cu/NiFe
    thin films by tomographic atom probe,” <i>Applied Physics Letters</i>, vol. 78,
    no. 22, pp. 3439–3441, 2001.
  mla: Schleiwies, J., et al. “Nanoanalysis of Co/Cu/NiFe Thin Films by Tomographic
    Atom Probe.” <i>Applied Physics Letters</i>, vol. 78, no. 22, AIP Publishing,
    2001, pp. 3439–41, doi:<a href="https://doi.org/10.1063/1.1374999">10.1063/1.1374999</a>.
  short: J. Schleiwies, G. Schmitz, S. Heitmann, A. Hütten, Applied Physics Letters
    78 (2001) 3439–3441.
date_created: 2023-03-24T13:12:58Z
date_updated: 2026-03-17T15:28:35Z
department:
- _id: '103'
doi: 10.1063/1.1374999
extern: '1'
intvolume: '        78'
issue: '22'
language:
- iso: eng
page: 3439-3441
publication: Applied Physics Letters
publication_identifier:
  eissn:
  - 1077-3118
  issn:
  - 0003-6951
publication_status: published
publisher: AIP Publishing
quality_controlled: '1'
research_group:
- _id: af778127-b366-11ed-bde2-daed2b8eafee
  name: Bielefelder Institut für Angewandte Materialforschung (BIfAM)
status: public
title: Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe
type: journal_article
user_id: '202389'
volume: 78
year: '2001'
...
---
_id: '1456'
author:
- first_name: Christian
  full_name: Schröder, Christian
  id: '35809'
  last_name: Schröder
  orcid: 0000-0002-6391-6548
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-6391-6548/work/96660451
- first_name: W.
  full_name: Heiland, W.
  last_name: Heiland
- first_name: R.
  full_name: Held, R.
  last_name: Held
- first_name: W.
  full_name: Loose, W.
  last_name: Loose
citation:
  alphadin: '<span style="font-variant:small-caps;">Schröder, Christian</span> ; <span
    style="font-variant:small-caps;">Heiland, W.</span> ; <span style="font-variant:small-caps;">Held,
    R.</span> ; <span style="font-variant:small-caps;">Loose, W.</span>: Analysis
    of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes. In: <i>Applied
    Physics Letters</i> Bd. 68, AIP Publishing (1996), Nr. 14, S. 1957–1959'
  ama: Schröder C, Heiland W, Held R, Loose W. Analysis of reverse current–voltage
    characteristics of Ti/6H–SiC Schottky diodes. <i>Applied Physics Letters</i>.
    1996;68(14):1957-1959. doi:<a href="https://doi.org/10.1063/1.115638">10.1063/1.115638</a>
  apa: Schröder, C., Heiland, W., Held, R., &#38; Loose, W. (1996). Analysis of reverse
    current–voltage characteristics of Ti/6H–SiC Schottky diodes. <i>Applied Physics
    Letters</i>, <i>68</i>(14), 1957–1959. <a href="https://doi.org/10.1063/1.115638">https://doi.org/10.1063/1.115638</a>
  bibtex: '@article{Schröder_Heiland_Held_Loose_1996, title={Analysis of reverse current–voltage
    characteristics of Ti/6H–SiC Schottky diodes}, volume={68}, DOI={<a href="https://doi.org/10.1063/1.115638">10.1063/1.115638</a>},
    number={14}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Schröder,
    Christian and Heiland, W. and Held, R. and Loose, W.}, year={1996}, pages={1957–1959}
    }'
  chicago: 'Schröder, Christian, W. Heiland, R. Held, and W. Loose. “Analysis of Reverse
    Current–Voltage Characteristics of Ti/6H–SiC Schottky Diodes.” <i>Applied Physics
    Letters</i> 68, no. 14 (1996): 1957–59. <a href="https://doi.org/10.1063/1.115638">https://doi.org/10.1063/1.115638</a>.'
  ieee: C. Schröder, W. Heiland, R. Held, and W. Loose, “Analysis of reverse current–voltage
    characteristics of Ti/6H–SiC Schottky diodes,” <i>Applied Physics Letters</i>,
    vol. 68, no. 14, pp. 1957–1959, 1996.
  mla: Schröder, Christian, et al. “Analysis of Reverse Current–Voltage Characteristics
    of Ti/6H–SiC Schottky Diodes.” <i>Applied Physics Letters</i>, vol. 68, no. 14,
    AIP Publishing, 1996, pp. 1957–59, doi:<a href="https://doi.org/10.1063/1.115638">10.1063/1.115638</a>.
  short: C. Schröder, W. Heiland, R. Held, W. Loose, Applied Physics Letters 68 (1996)
    1957–1959.
date_created: 2021-07-06T09:07:57Z
date_updated: 2026-03-17T15:28:21Z
doi: 10.1063/1.115638
intvolume: '        68'
issue: '14'
language:
- iso: eng
page: 1957-1959
project:
- _id: f89a05bb-bcea-11ed-9442-ed382659bc06
  name: Bielefelder Institut für Angewandte Materialforschung
publication: Applied Physics Letters
publication_identifier:
  eissn:
  - 1077-3118
  issn:
  - 0003-6951
publication_status: published
publisher: AIP Publishing
quality_controlled: '1'
status: public
title: Analysis of reverse current–voltage characteristics of Ti/6H–SiC Schottky diodes
type: journal_article
user_id: '35809'
volume: 68
year: '1996'
...