[{"extern":"1","_id":"2410","citation":{"ama":"Battermann S, Garbe H. Time Domain Measurements to detect Defects on Open Area Test Sites. In: York: York EMC Services; 2004.","bibtex":"@inproceedings{Battermann_Garbe_2004, place={York}, title={Time Domain Measurements to detect Defects on Open Area Test Sites}, publisher={York EMC Services}, author={Battermann, Sven and Garbe, Heyno}, year={2004} }","short":"S. Battermann, H. Garbe, in: York EMC Services, York, 2004.","ieee":"S. Battermann and H. Garbe, “Time Domain Measurements to detect Defects on Open Area Test Sites,” presented at the EMC York 2004, York, 2004.","mla":"Battermann, Sven, and Heyno Garbe. <i>Time Domain Measurements to Detect Defects on Open Area Test Sites</i>. York EMC Services, 2004.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Garbe, Heyno</span>: Time Domain Measurements to detect Defects on Open Area Test Sites. In: . York : York EMC Services, 2004","chicago":"Battermann, Sven, and Heyno Garbe. “Time Domain Measurements to Detect Defects on Open Area Test Sites.” York: York EMC Services, 2004.","apa":"Battermann, S., &#38; Garbe, H. (2004). Time Domain Measurements to detect Defects on Open Area Test Sites. Presented at the EMC York 2004, York: York EMC Services."},"department":[{"_id":"102"}],"author":[{"last_name":"Battermann","orcid":"0000-0001-7203-7396","first_name":"Sven","full_name":"Battermann, Sven","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7203-7396/work/172778515","id":"219522"},{"full_name":"Garbe, Heyno","first_name":"Heyno","last_name":"Garbe"}],"status":"public","date_updated":"2026-03-17T15:28:32Z","date_created":"2023-02-12T22:58:02Z","publication_status":"published","user_id":"220548","publication_identifier":{"isbn":["1-902009-13-4"]},"language":[{"iso":"eng"}],"conference":{"location":"York","name":"EMC York 2004","end_date":"2004-07-02","start_date":"2004-07-01"},"title":"Time Domain Measurements to detect Defects on Open Area Test Sites","quality_controlled":"1","place":"York","year":"2004","type":"conference","publisher":"York EMC Services"}]