[{"department":[{"_id":"102"}],"quality_controlled":"1","date_created":"2023-02-12T22:58:02Z","title":"Time Domain Measurements to detect Defects on Open Area Test Sites","user_id":"220548","extern":"1","publication_identifier":{"isbn":["1-902009-13-4"]},"type":"conference","publication_status":"published","status":"public","conference":{"name":"EMC York 2004","location":"York","end_date":"2004-07-02","start_date":"2004-07-01"},"citation":{"ieee":"S. Battermann and H. Garbe, “Time Domain Measurements to detect Defects on Open Area Test Sites,” presented at the EMC York 2004, York, 2004.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Garbe, Heyno</span>: Time Domain Measurements to detect Defects on Open Area Test Sites. In: . York : York EMC Services, 2004","apa":"Battermann, S., &#38; Garbe, H. (2004). Time Domain Measurements to detect Defects on Open Area Test Sites. Presented at the EMC York 2004, York: York EMC Services.","bibtex":"@inproceedings{Battermann_Garbe_2004, place={York}, title={Time Domain Measurements to detect Defects on Open Area Test Sites}, publisher={York EMC Services}, author={Battermann, Sven and Garbe, Heyno}, year={2004} }","short":"S. Battermann, H. Garbe, in: York EMC Services, York, 2004.","chicago":"Battermann, Sven, and Heyno Garbe. “Time Domain Measurements to Detect Defects on Open Area Test Sites.” York: York EMC Services, 2004.","mla":"Battermann, Sven, and Heyno Garbe. <i>Time Domain Measurements to Detect Defects on Open Area Test Sites</i>. York EMC Services, 2004.","ama":"Battermann S, Garbe H. Time Domain Measurements to detect Defects on Open Area Test Sites. In: York: York EMC Services; 2004."},"author":[{"id":"219522","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7203-7396/work/172778515","first_name":"Sven","last_name":"Battermann","full_name":"Battermann, Sven","orcid":"0000-0001-7203-7396"},{"full_name":"Garbe, Heyno","last_name":"Garbe","first_name":"Heyno"}],"place":"York","date_updated":"2026-03-17T15:28:32Z","publisher":"York EMC Services","language":[{"iso":"eng"}],"_id":"2410","year":"2004"}]