[{"_id":"6013","year":"2008","language":[{"iso":"eng"}],"citation":{"ieee":"B. Cahill <i>et al.</i>, “Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers,” in <i>2008 11th International Biennial Baltic Electronics Conference</i>, Tallinn, 2008, pp. 79–82.","apa":"Cahill, B., Giannitsis, A. T., Land, R., Gastrock, G., Pliquett, U., Nacke, T., … Beckmann, D. (2008). Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers. In Institute of Electrical and Electronics Engineers (IEEE) (Ed.), <i>2008 11th International Biennial Baltic Electronics Conference</i> (pp. 79–82). Tallinn: IEEE. <a href=\"https://doi.org/10.1109/BEC.2008.4657482\">https://doi.org/10.1109/BEC.2008.4657482</a>","bibtex":"@inproceedings{Cahill_Giannitsis_Land_Gastrock_Pliquett_Nacke_Min_Beckmann_2008, title={Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers}, DOI={<a href=\"https://doi.org/10.1109/BEC.2008.4657482\">10.1109/BEC.2008.4657482</a>}, booktitle={2008 11th International Biennial Baltic Electronics Conference}, publisher={IEEE}, author={Cahill, Brian and Giannitsis, A. T. and Land, R. and Gastrock, G. and Pliquett, U. and Nacke, T. and Min, M. and Beckmann, D.}, editor={Institute of Electrical and Electronics Engineers (IEEE)Editor}, year={2008}, pages={79–82} }","alphadin":"<span style=\"font-variant:small-caps;\">Cahill, Brian</span> ; <span style=\"font-variant:small-caps;\">Giannitsis, A. T.</span> ; <span style=\"font-variant:small-caps;\">Land, R.</span> ; <span style=\"font-variant:small-caps;\">Gastrock, G.</span> ; <span style=\"font-variant:small-caps;\">Pliquett, U.</span> ; <span style=\"font-variant:small-caps;\">Nacke, T.</span> ; <span style=\"font-variant:small-caps;\">Min, M.</span> ; <span style=\"font-variant:small-caps;\">Beckmann, D.</span>: Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers. In: <span style=\"font-variant:small-caps;\">Institute of Electrical and Electronics Engineers (IEEE)</span> (Hrsg.): <i>2008 11th International Biennial Baltic Electronics Conference</i> : IEEE, 2008, S. 79–82","short":"B. Cahill, A.T. Giannitsis, R. Land, G. Gastrock, U. Pliquett, T. Nacke, M. Min, D. Beckmann, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2008 11th International Biennial Baltic Electronics Conference, IEEE, 2008, pp. 79–82.","chicago":"Cahill, Brian, A. T. Giannitsis, R. Land, G. Gastrock, U. Pliquett, T. Nacke, M. Min, and D. Beckmann. “Optimization of Electrowetting Electrodes: Analysis of the Leakage Current Characteristics of Various Dielectric Layers.” In <i>2008 11th International Biennial Baltic Electronics Conference</i>, edited by Institute of Electrical and Electronics Engineers (IEEE), 79–82. IEEE, 2008. <a href=\"https://doi.org/10.1109/BEC.2008.4657482\">https://doi.org/10.1109/BEC.2008.4657482</a>.","ama":"Cahill B, Giannitsis AT, Land R, et al. Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers. In: Institute of Electrical and Electronics Engineers (IEEE), ed. <i>2008 11th International Biennial Baltic Electronics Conference</i>. IEEE; 2008:79-82. doi:<a href=\"https://doi.org/10.1109/BEC.2008.4657482\">10.1109/BEC.2008.4657482</a>","mla":"Cahill, Brian, et al. “Optimization of Electrowetting Electrodes: Analysis of the Leakage Current Characteristics of Various Dielectric Layers.” <i>2008 11th International Biennial Baltic Electronics Conference</i>, edited by Institute of Electrical and Electronics Engineers (IEEE), IEEE, 2008, pp. 79–82, doi:<a href=\"https://doi.org/10.1109/BEC.2008.4657482\">10.1109/BEC.2008.4657482</a>."},"author":[{"last_name":"Cahill","orcid":"0000-0002-7325-5114","full_name":"Cahill, Brian","first_name":"Brian","id":"257249","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-7325-5114/work/187033154"},{"full_name":"Giannitsis, A. T.","last_name":"Giannitsis","first_name":"A. T."},{"first_name":"R.","last_name":"Land","full_name":"Land, R."},{"first_name":"G.","full_name":"Gastrock, G.","last_name":"Gastrock"},{"first_name":"U.","last_name":"Pliquett","full_name":"Pliquett, U."},{"first_name":"T.","last_name":"Nacke","full_name":"Nacke, T."},{"first_name":"M.","last_name":"Min","full_name":"Min, M."},{"full_name":"Beckmann, D.","last_name":"Beckmann","first_name":"D."}],"status":"public","conference":{"location":"Tallinn","name":"2008 International Biennial Baltic Electronics Conference (BEC2008)","end_date":"2008-10-08","start_date":"2008-10-06"},"doi":"10.1109/BEC.2008.4657482","date_updated":"2026-03-17T15:29:25Z","publisher":"IEEE","page":"79-82","type":"conference","publication_identifier":{"isbn":["978-1-4244-2059-9"]},"corporate_editor":["Institute of Electrical and Electronics Engineers (IEEE)"],"user_id":"220548","publication":"2008 11th International Biennial Baltic Electronics Conference","publication_status":"published","date_created":"2025-06-27T11:24:44Z","title":"Optimization of electrowetting electrodes: Analysis of the leakage current characteristics of various dielectric layers"}]