---
_id: '6013'
author:
- first_name: Brian
  full_name: Cahill, Brian
  id: '257249'
  last_name: Cahill
  orcid: 0000-0002-7325-5114
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-7325-5114/work/187033154
- first_name: A. T.
  full_name: Giannitsis, A. T.
  last_name: Giannitsis
- first_name: R.
  full_name: Land, R.
  last_name: Land
- first_name: G.
  full_name: Gastrock, G.
  last_name: Gastrock
- first_name: U.
  full_name: Pliquett, U.
  last_name: Pliquett
- first_name: T.
  full_name: Nacke, T.
  last_name: Nacke
- first_name: M.
  full_name: Min, M.
  last_name: Min
- first_name: D.
  full_name: Beckmann, D.
  last_name: Beckmann
citation:
  alphadin: '<span style="font-variant:small-caps;">Cahill, Brian</span> ; <span style="font-variant:small-caps;">Giannitsis,
    A. T.</span> ; <span style="font-variant:small-caps;">Land, R.</span> ; <span
    style="font-variant:small-caps;">Gastrock, G.</span> ; <span style="font-variant:small-caps;">Pliquett,
    U.</span> ; <span style="font-variant:small-caps;">Nacke, T.</span> ; <span style="font-variant:small-caps;">Min,
    M.</span> ; <span style="font-variant:small-caps;">Beckmann, D.</span>: Optimization
    of electrowetting electrodes: Analysis of the leakage current characteristics
    of various dielectric layers. In: <span style="font-variant:small-caps;">Institute
    of Electrical and Electronics Engineers (IEEE)</span> (Hrsg.): <i>2008 11th International
    Biennial Baltic Electronics Conference</i> : IEEE, 2008, S. 79–82'
  ama: 'Cahill B, Giannitsis AT, Land R, et al. Optimization of electrowetting electrodes:
    Analysis of the leakage current characteristics of various dielectric layers.
    In: Institute of Electrical and Electronics Engineers (IEEE), ed. <i>2008 11th
    International Biennial Baltic Electronics Conference</i>. IEEE; 2008:79-82. doi:<a
    href="https://doi.org/10.1109/BEC.2008.4657482">10.1109/BEC.2008.4657482</a>'
  apa: 'Cahill, B., Giannitsis, A. T., Land, R., Gastrock, G., Pliquett, U., Nacke,
    T., … Beckmann, D. (2008). Optimization of electrowetting electrodes: Analysis
    of the leakage current characteristics of various dielectric layers. In Institute
    of Electrical and Electronics Engineers (IEEE) (Ed.), <i>2008 11th International
    Biennial Baltic Electronics Conference</i> (pp. 79–82). Tallinn: IEEE. <a href="https://doi.org/10.1109/BEC.2008.4657482">https://doi.org/10.1109/BEC.2008.4657482</a>'
  bibtex: '@inproceedings{Cahill_Giannitsis_Land_Gastrock_Pliquett_Nacke_Min_Beckmann_2008,
    title={Optimization of electrowetting electrodes: Analysis of the leakage current
    characteristics of various dielectric layers}, DOI={<a href="https://doi.org/10.1109/BEC.2008.4657482">10.1109/BEC.2008.4657482</a>},
    booktitle={2008 11th International Biennial Baltic Electronics Conference}, publisher={IEEE},
    author={Cahill, Brian and Giannitsis, A. T. and Land, R. and Gastrock, G. and
    Pliquett, U. and Nacke, T. and Min, M. and Beckmann, D.}, editor={Institute of
    Electrical and Electronics Engineers (IEEE)Editor}, year={2008}, pages={79–82}
    }'
  chicago: 'Cahill, Brian, A. T. Giannitsis, R. Land, G. Gastrock, U. Pliquett, T.
    Nacke, M. Min, and D. Beckmann. “Optimization of Electrowetting Electrodes: Analysis
    of the Leakage Current Characteristics of Various Dielectric Layers.” In <i>2008
    11th International Biennial Baltic Electronics Conference</i>, edited by Institute
    of Electrical and Electronics Engineers (IEEE), 79–82. IEEE, 2008. <a href="https://doi.org/10.1109/BEC.2008.4657482">https://doi.org/10.1109/BEC.2008.4657482</a>.'
  ieee: 'B. Cahill <i>et al.</i>, “Optimization of electrowetting electrodes: Analysis
    of the leakage current characteristics of various dielectric layers,” in <i>2008
    11th International Biennial Baltic Electronics Conference</i>, Tallinn, 2008,
    pp. 79–82.'
  mla: 'Cahill, Brian, et al. “Optimization of Electrowetting Electrodes: Analysis
    of the Leakage Current Characteristics of Various Dielectric Layers.” <i>2008
    11th International Biennial Baltic Electronics Conference</i>, edited by Institute
    of Electrical and Electronics Engineers (IEEE), IEEE, 2008, pp. 79–82, doi:<a
    href="https://doi.org/10.1109/BEC.2008.4657482">10.1109/BEC.2008.4657482</a>.'
  short: 'B. Cahill, A.T. Giannitsis, R. Land, G. Gastrock, U. Pliquett, T. Nacke,
    M. Min, D. Beckmann, in: Institute of Electrical and Electronics Engineers (IEEE)
    (Ed.), 2008 11th International Biennial Baltic Electronics Conference, IEEE, 2008,
    pp. 79–82.'
conference:
  end_date: 2008-10-08
  location: Tallinn
  name: 2008 International Biennial Baltic Electronics Conference (BEC2008)
  start_date: 2008-10-06
corporate_editor:
- Institute of Electrical and Electronics Engineers (IEEE)
date_created: 2025-06-27T11:24:44Z
date_updated: 2026-03-17T15:29:25Z
doi: 10.1109/BEC.2008.4657482
language:
- iso: eng
page: 79-82
publication: 2008 11th International Biennial Baltic Electronics Conference
publication_identifier:
  isbn:
  - 978-1-4244-2059-9
publication_status: published
publisher: IEEE
status: public
title: 'Optimization of electrowetting electrodes: Analysis of the leakage current
  characteristics of various dielectric layers'
type: conference
user_id: '220548'
year: '2008'
...