[{"department":[{"_id":"102"}],"quality_controlled":"1","date_created":"2023-01-09T09:05:03Z","title":"Metric-Based Few-Shot Learning for Pollen Grain Image Classification","user_id":"261203","type":"conference","publication_identifier":{"isbn":["978-989-758-626-2"]},"publication_status":"published","publication":"Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM","status":"public","conference":{"name":"12th International Conference on Pattern Recognition Applications and Methods","location":"Lisbon, Portugal","end_date":"2023-02-24","start_date":"2023-02-22"},"author":[{"orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-7274-4290/work/181737429","id":"216274","first_name":"Philipp","full_name":"Viertel, Philipp","orcid":"0000-0002-7274-4290","last_name":"Viertel"},{"full_name":"König, Matthias","orcid":"0000-0002-4915-0750","last_name":"König","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-4915-0750/work/181737430","id":"213498","first_name":"Matthias"},{"last_name":"Rexilius","orcid":"0000-0002-4579-214X","full_name":"Rexilius, Jan","first_name":"Jan","id":"245736","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-4579-214X/work/181737431"}],"citation":{"ieee":"P. Viertel, M. König, and J. Rexilius, “Metric-Based Few-Shot Learning for Pollen Grain Image Classification,” in <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, Lisbon, Portugal, 2023, pp. 418–425.","bibtex":"@inproceedings{Viertel_König_Rexilius_2023, title={Metric-Based Few-Shot Learning for Pollen Grain Image Classification}, DOI={<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>}, booktitle={Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM}, author={Viertel, Philipp and König, Matthias and Rexilius, Jan}, editor={De Marsico, Maria  and Sanniti di Baja, Gabriella  and Fred , AnaEditors}, year={2023}, pages={418–425} }","apa":"Viertel, P., König, M., &#38; Rexilius, J. (2023). Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In M. De Marsico, G. Sanniti di Baja, &#38; A. Fred  (Eds.), <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i> (pp. 418–425). Lisbon, Portugal. <a href=\"https://doi.org/10.5220/0011727900003411\">https://doi.org/10.5220/0011727900003411</a>","alphadin":"<span style=\"font-variant:small-caps;\">Viertel, Philipp</span> ; <span style=\"font-variant:small-caps;\">König, Matthias</span> ; <span style=\"font-variant:small-caps;\">Rexilius, Jan</span>: Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: <span style=\"font-variant:small-caps;\">De Marsico, M.</span> ; <span style=\"font-variant:small-caps;\">Sanniti di Baja, G.</span> ; <span style=\"font-variant:small-caps;\">Fred , A.</span> (Hrsg.): <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, 2023, S. 418–425","short":"P. Viertel, M. König, J. Rexilius, in: M. De Marsico, G. Sanniti di Baja, A. Fred  (Eds.), Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM, 2023, pp. 418–425.","chicago":"Viertel, Philipp, Matthias König, and Jan Rexilius. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” In <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, edited by Maria  De Marsico, Gabriella  Sanniti di Baja, and Ana Fred , 418–25, 2023. <a href=\"https://doi.org/10.5220/0011727900003411\">https://doi.org/10.5220/0011727900003411</a>.","ama":"Viertel P, König M, Rexilius J. Metric-Based Few-Shot Learning for Pollen Grain Image Classification. In: De Marsico M, Sanniti di Baja G, Fred  A, eds. <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>. ; 2023:418-425. doi:<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>","mla":"Viertel, Philipp, et al. “Metric-Based Few-Shot Learning for Pollen Grain Image Classification.” <i>Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, edited by Maria  De Marsico et al., 2023, pp. 418–25, doi:<a href=\"https://doi.org/10.5220/0011727900003411\">10.5220/0011727900003411</a>."},"date_updated":"2026-06-10T11:41:59Z","page":"418-425","doi":"10.5220/0011727900003411","language":[{"iso":"eng"}],"_id":"2292","editor":[{"last_name":"De Marsico","full_name":"De Marsico, Maria ","first_name":"Maria "},{"first_name":"Gabriella ","last_name":"Sanniti di Baja","full_name":"Sanniti di Baja, Gabriella "},{"first_name":"Ana","full_name":"Fred , Ana","last_name":"Fred "}],"year":"2023"}]