---
_id: '2292'
author:
- first_name: Philipp
  full_name: Viertel, Philipp
  id: '216274'
  last_name: Viertel
  orcid: 0000-0002-7274-4290
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-7274-4290/work/181737429
- first_name: Matthias
  full_name: König, Matthias
  id: '213498'
  last_name: König
  orcid: 0000-0002-4915-0750
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-4915-0750/work/181737430
- first_name: Jan
  full_name: Rexilius, Jan
  id: '245736'
  last_name: Rexilius
  orcid: 0000-0002-4579-214X
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-4579-214X/work/181737431
citation:
  alphadin: '<span style="font-variant:small-caps;">Viertel, Philipp</span> ; <span
    style="font-variant:small-caps;">König, Matthias</span> ; <span style="font-variant:small-caps;">Rexilius,
    Jan</span>: Metric-Based Few-Shot Learning for Pollen Grain Image Classification.
    In: <span style="font-variant:small-caps;">De Marsico, M.</span> ; <span style="font-variant:small-caps;">Sanniti
    di Baja, G.</span> ; <span style="font-variant:small-caps;">Fred , A.</span> (Hrsg.):
    <i>Proceedings of the 12th International Conference on Pattern Recognition Applications
    and Methods - ICPRAM</i>, 2023, S. 418–425'
  ama: 'Viertel P, König M, Rexilius J. Metric-Based Few-Shot Learning for Pollen
    Grain Image Classification. In: De Marsico M, Sanniti di Baja G, Fred  A, eds.
    <i>Proceedings of the 12th International Conference on Pattern Recognition Applications
    and Methods - ICPRAM</i>. ; 2023:418-425. doi:<a href="https://doi.org/10.5220/0011727900003411">10.5220/0011727900003411</a>'
  apa: Viertel, P., König, M., &#38; Rexilius, J. (2023). Metric-Based Few-Shot Learning
    for Pollen Grain Image Classification. In M. De Marsico, G. Sanniti di Baja, &#38;
    A. Fred  (Eds.), <i>Proceedings of the 12th International Conference on Pattern
    Recognition Applications and Methods - ICPRAM</i> (pp. 418–425). Lisbon, Portugal.
    <a href="https://doi.org/10.5220/0011727900003411">https://doi.org/10.5220/0011727900003411</a>
  bibtex: '@inproceedings{Viertel_König_Rexilius_2023, title={Metric-Based Few-Shot
    Learning for Pollen Grain Image Classification}, DOI={<a href="https://doi.org/10.5220/0011727900003411">10.5220/0011727900003411</a>},
    booktitle={Proceedings of the 12th International Conference on Pattern Recognition
    Applications and Methods - ICPRAM}, author={Viertel, Philipp and König, Matthias
    and Rexilius, Jan}, editor={De Marsico, Maria  and Sanniti di Baja, Gabriella  and
    Fred , AnaEditors}, year={2023}, pages={418–425} }'
  chicago: Viertel, Philipp, Matthias König, and Jan Rexilius. “Metric-Based Few-Shot
    Learning for Pollen Grain Image Classification.” In <i>Proceedings of the 12th
    International Conference on Pattern Recognition Applications and Methods - ICPRAM</i>,
    edited by Maria  De Marsico, Gabriella  Sanniti di Baja, and Ana Fred , 418–25,
    2023. <a href="https://doi.org/10.5220/0011727900003411">https://doi.org/10.5220/0011727900003411</a>.
  ieee: P. Viertel, M. König, and J. Rexilius, “Metric-Based Few-Shot Learning for
    Pollen Grain Image Classification,” in <i>Proceedings of the 12th International
    Conference on Pattern Recognition Applications and Methods - ICPRAM</i>, Lisbon,
    Portugal, 2023, pp. 418–425.
  mla: Viertel, Philipp, et al. “Metric-Based Few-Shot Learning for Pollen Grain Image
    Classification.” <i>Proceedings of the 12th International Conference on Pattern
    Recognition Applications and Methods - ICPRAM</i>, edited by Maria  De Marsico
    et al., 2023, pp. 418–25, doi:<a href="https://doi.org/10.5220/0011727900003411">10.5220/0011727900003411</a>.
  short: 'P. Viertel, M. König, J. Rexilius, in: M. De Marsico, G. Sanniti di Baja,
    A. Fred  (Eds.), Proceedings of the 12th International Conference on Pattern Recognition
    Applications and Methods - ICPRAM, 2023, pp. 418–425.'
conference:
  end_date: 2023-02-24
  location: Lisbon, Portugal
  name: 12th International Conference on Pattern Recognition Applications and Methods
  start_date: 2023-02-22
date_created: 2023-01-09T09:05:03Z
date_updated: 2026-03-17T15:28:31Z
department:
- _id: '102'
doi: 10.5220/0011727900003411
editor:
- first_name: 'Maria '
  full_name: 'De Marsico, Maria '
  last_name: De Marsico
- first_name: 'Gabriella '
  full_name: 'Sanniti di Baja, Gabriella '
  last_name: Sanniti di Baja
- first_name: Ana
  full_name: Fred , Ana
  last_name: 'Fred '
language:
- iso: eng
page: 418-425
publication: Proceedings of the 12th International Conference on Pattern Recognition
  Applications and Methods - ICPRAM
publication_identifier:
  isbn:
  - 978-989-758-626-2
publication_status: published
quality_controlled: '1'
status: public
title: Metric-Based Few-Shot Learning for Pollen Grain Image Classification
type: conference
user_id: '245736'
year: '2023'
...