[{"language":[{"iso":"eng"}],"year":"2011","_id":"6009","status":"public","author":[{"first_name":"Kerstin","full_name":"Büchner, Kerstin","last_name":"Büchner"},{"first_name":"Nadja","full_name":"Ehrhardt, Nadja","last_name":"Ehrhardt"},{"orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-7325-5114/work/187034083","id":"257249","first_name":"Brian","last_name":"Cahill","full_name":"Cahill, Brian","orcid":"0000-0002-7325-5114"},{"first_name":"Christian","last_name":"Hoffmann","full_name":"Hoffmann, Christian"}],"citation":{"bibtex":"@article{Büchner_Ehrhardt_Cahill_Hoffmann_2011, title={Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide}, volume={519}, DOI={<a href=\"https://doi.org/10.1016/j.tsf.2011.04.215\">10.1016/j.tsf.2011.04.215</a>}, number={19}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Büchner, Kerstin and Ehrhardt, Nadja and Cahill, Brian and Hoffmann, Christian}, year={2011}, pages={6480–6485} }","apa":"Büchner, K., Ehrhardt, N., Cahill, B., &#38; Hoffmann, C. (2011). Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. <i>Thin Solid Films</i>, <i>519</i>(19), 6480–6485. <a href=\"https://doi.org/10.1016/j.tsf.2011.04.215\">https://doi.org/10.1016/j.tsf.2011.04.215</a>","alphadin":"<span style=\"font-variant:small-caps;\">Büchner, Kerstin</span> ; <span style=\"font-variant:small-caps;\">Ehrhardt, Nadja</span> ; <span style=\"font-variant:small-caps;\">Cahill, Brian</span> ; <span style=\"font-variant:small-caps;\">Hoffmann, Christian</span>: Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. In: <i>Thin Solid Films</i> Bd. 519, Elsevier BV (2011), Nr. 19, S. 6480–6485","ieee":"K. Büchner, N. Ehrhardt, B. Cahill, and C. Hoffmann, “Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide,” <i>Thin Solid Films</i>, vol. 519, no. 19, pp. 6480–6485, 2011.","ama":"Büchner K, Ehrhardt N, Cahill B, Hoffmann C. Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide. <i>Thin Solid Films</i>. 2011;519(19):6480-6485. doi:<a href=\"https://doi.org/10.1016/j.tsf.2011.04.215\">10.1016/j.tsf.2011.04.215</a>","mla":"Büchner, Kerstin, et al. “Internal Reflection Ellipsometry for Real-Time Monitoring of Polyelectrolyte Multilayer Growth onto Tantalum Pentoxide.” <i>Thin Solid Films</i>, vol. 519, no. 19, Elsevier BV, 2011, pp. 6480–85, doi:<a href=\"https://doi.org/10.1016/j.tsf.2011.04.215\">10.1016/j.tsf.2011.04.215</a>.","chicago":"Büchner, Kerstin, Nadja Ehrhardt, Brian Cahill, and Christian Hoffmann. “Internal Reflection Ellipsometry for Real-Time Monitoring of Polyelectrolyte Multilayer Growth onto Tantalum Pentoxide.” <i>Thin Solid Films</i> 519, no. 19 (2011): 6480–85. <a href=\"https://doi.org/10.1016/j.tsf.2011.04.215\">https://doi.org/10.1016/j.tsf.2011.04.215</a>.","short":"K. Büchner, N. Ehrhardt, B. Cahill, C. Hoffmann, Thin Solid Films 519 (2011) 6480–6485."},"publisher":"Elsevier BV","page":"6480-6485","date_updated":"2026-03-17T15:29:25Z","intvolume":"       519","doi":"10.1016/j.tsf.2011.04.215","user_id":"220548","publication_identifier":{"issn":["0040-6090"]},"type":"journal_article","publication":"Thin Solid Films","publication_status":"published","issue":"19","volume":519,"title":"Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide","date_created":"2025-06-27T11:24:35Z"}]