---
_id: '6009'
author:
- first_name: Kerstin
  full_name: Büchner, Kerstin
  last_name: Büchner
- first_name: Nadja
  full_name: Ehrhardt, Nadja
  last_name: Ehrhardt
- first_name: Brian
  full_name: Cahill, Brian
  id: '257249'
  last_name: Cahill
  orcid: 0000-0002-7325-5114
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-7325-5114/work/187034083
- first_name: Christian
  full_name: Hoffmann, Christian
  last_name: Hoffmann
citation:
  alphadin: '<span style="font-variant:small-caps;">Büchner, Kerstin</span> ; <span
    style="font-variant:small-caps;">Ehrhardt, Nadja</span> ; <span style="font-variant:small-caps;">Cahill,
    Brian</span> ; <span style="font-variant:small-caps;">Hoffmann, Christian</span>:
    Internal reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer
    growth onto tantalum pentoxide. In: <i>Thin Solid Films</i> Bd. 519, Elsevier
    BV (2011), Nr. 19, S. 6480–6485'
  ama: Büchner K, Ehrhardt N, Cahill B, Hoffmann C. Internal reflection ellipsometry
    for real-time monitoring of polyelectrolyte multilayer growth onto tantalum pentoxide.
    <i>Thin Solid Films</i>. 2011;519(19):6480-6485. doi:<a href="https://doi.org/10.1016/j.tsf.2011.04.215">10.1016/j.tsf.2011.04.215</a>
  apa: Büchner, K., Ehrhardt, N., Cahill, B., &#38; Hoffmann, C. (2011). Internal
    reflection ellipsometry for real-time monitoring of polyelectrolyte multilayer
    growth onto tantalum pentoxide. <i>Thin Solid Films</i>, <i>519</i>(19), 6480–6485.
    <a href="https://doi.org/10.1016/j.tsf.2011.04.215">https://doi.org/10.1016/j.tsf.2011.04.215</a>
  bibtex: '@article{Büchner_Ehrhardt_Cahill_Hoffmann_2011, title={Internal reflection
    ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto
    tantalum pentoxide}, volume={519}, DOI={<a href="https://doi.org/10.1016/j.tsf.2011.04.215">10.1016/j.tsf.2011.04.215</a>},
    number={19}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Büchner,
    Kerstin and Ehrhardt, Nadja and Cahill, Brian and Hoffmann, Christian}, year={2011},
    pages={6480–6485} }'
  chicago: 'Büchner, Kerstin, Nadja Ehrhardt, Brian Cahill, and Christian Hoffmann.
    “Internal Reflection Ellipsometry for Real-Time Monitoring of Polyelectrolyte
    Multilayer Growth onto Tantalum Pentoxide.” <i>Thin Solid Films</i> 519, no. 19
    (2011): 6480–85. <a href="https://doi.org/10.1016/j.tsf.2011.04.215">https://doi.org/10.1016/j.tsf.2011.04.215</a>.'
  ieee: K. Büchner, N. Ehrhardt, B. Cahill, and C. Hoffmann, “Internal reflection
    ellipsometry for real-time monitoring of polyelectrolyte multilayer growth onto
    tantalum pentoxide,” <i>Thin Solid Films</i>, vol. 519, no. 19, pp. 6480–6485,
    2011.
  mla: Büchner, Kerstin, et al. “Internal Reflection Ellipsometry for Real-Time Monitoring
    of Polyelectrolyte Multilayer Growth onto Tantalum Pentoxide.” <i>Thin Solid Films</i>,
    vol. 519, no. 19, Elsevier BV, 2011, pp. 6480–85, doi:<a href="https://doi.org/10.1016/j.tsf.2011.04.215">10.1016/j.tsf.2011.04.215</a>.
  short: K. Büchner, N. Ehrhardt, B. Cahill, C. Hoffmann, Thin Solid Films 519 (2011)
    6480–6485.
date_created: 2025-06-27T11:24:35Z
date_updated: 2026-03-17T15:29:25Z
doi: 10.1016/j.tsf.2011.04.215
intvolume: '       519'
issue: '19'
language:
- iso: eng
page: 6480-6485
publication: Thin Solid Films
publication_identifier:
  issn:
  - 0040-6090
publication_status: published
publisher: Elsevier BV
status: public
title: Internal reflection ellipsometry for real-time monitoring of polyelectrolyte
  multilayer growth onto tantalum pentoxide
type: journal_article
user_id: '220548'
volume: 519
year: '2011'
...