[{"user_id":"220548","type":"journal_article","publication_identifier":{"issn":["0169-4332"]},"project":[{"_id":"f89a05bb-bcea-11ed-9442-ed382659bc06","name":"Bielefelder Institut für Angewandte Materialforschung"}],"publication":"Applied Surface Science","publication_status":"published","volume":713,"title":"Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe","date_created":"2026-02-05T14:19:41Z","language":[{"iso":"eng"}],"year":"2025","_id":"6571","article_number":"164356","status":"public","author":[{"first_name":"Martin","full_name":"Wortmann, Martin","last_name":"Wortmann"},{"first_name":"Beatrice","last_name":"Bednarz","full_name":"Bednarz, Beatrice"},{"full_name":"Nezafat, Negin Beryani","last_name":"Nezafat","first_name":"Negin Beryani"},{"id":"215306","first_name":"Klaus","last_name":"Viertel","full_name":"Viertel, Klaus","orcid":"0000-0001-8851-8434"},{"first_name":"Olga","full_name":"Kuschel, Olga","last_name":"Kuschel"},{"first_name":"Jan","full_name":"Schmalhorst, Jan","last_name":"Schmalhorst"},{"last_name":"Ennen","full_name":"Ennen, Inga","first_name":"Inga"},{"last_name":"Gärner","full_name":"Gärner, Maik","first_name":"Maik"},{"id":"257163","first_name":"Natalie","full_name":"Frese, Natalie","last_name":"Frese"},{"full_name":"Jakob, Gerhard","last_name":"Jakob","first_name":"Gerhard"},{"full_name":"Wollschläger, Joachim","last_name":"Wollschläger","first_name":"Joachim"},{"last_name":"Schierning","full_name":"Schierning, Gabi","first_name":"Gabi"},{"full_name":"Hütten, Andreas","last_name":"Hütten","first_name":"Andreas"},{"first_name":"Timo","last_name":"Kuschel","full_name":"Kuschel, Timo"}],"citation":{"ieee":"M. Wortmann <i>et al.</i>, “Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” <i>Applied Surface Science</i>, vol. 713, 2025.","bibtex":"@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et al._2025, title={Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe}, volume={713}, DOI={<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>}, number={164356}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Wortmann, Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese, Natalie and Jakob, Gerhard and et al.}, year={2025} }","apa":"Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst, J., … Kuschel, T. (2025). Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied Surface Science</i>, <i>713</i>. <a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">https://doi.org/10.1016/j.apsusc.2025.164356</a>","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Wortmann, Martin</span> ; <span style=\"font-variant:small-caps;\">Bednarz, Beatrice</span> ; <span style=\"font-variant:small-caps;\">Nezafat, Negin Beryani</span> ; <span style=\"font-variant:small-caps;\">Viertel, Klaus</span> ; <span style=\"font-variant:small-caps;\">Kuschel, Olga</span> ; <span style=\"font-variant:small-caps;\">Schmalhorst, Jan</span> ; <span style=\"font-variant:small-caps;\">Ennen, Inga</span> ; <span style=\"font-variant:small-caps;\">Gärner, Maik</span> ; u. a.</span>: Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In: <i>Applied Surface Science</i> Bd. 713, Elsevier BV (2025)","chicago":"Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel, Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i> 713 (2025). <a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">https://doi.org/10.1016/j.apsusc.2025.164356</a>.","short":"M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel, Applied Surface Science 713 (2025).","ama":"Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied Surface Science</i>. 2025;713. doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>","mla":"Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i>, vol. 713, 164356, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>."},"publisher":"Elsevier BV","date_updated":"2026-03-17T15:29:32Z","intvolume":"       713","doi":"10.1016/j.apsusc.2025.164356"}]