---
_id: '6571'
article_number: '164356'
article_type: original
author:
- first_name: Martin
  full_name: Wortmann, Martin
  last_name: Wortmann
- first_name: Beatrice
  full_name: Bednarz, Beatrice
  last_name: Bednarz
- first_name: Negin Beryani
  full_name: Nezafat, Negin Beryani
  last_name: Nezafat
- first_name: Klaus
  full_name: Viertel, Klaus
  id: '215306'
  last_name: Viertel
  orcid: 0000-0001-8851-8434
- first_name: Olga
  full_name: Kuschel, Olga
  last_name: Kuschel
- first_name: Jan
  full_name: Schmalhorst, Jan
  last_name: Schmalhorst
- first_name: Inga
  full_name: Ennen, Inga
  last_name: Ennen
- first_name: Maik
  full_name: Gärner, Maik
  last_name: Gärner
- first_name: Natalie
  full_name: Frese, Natalie
  id: '257163'
  last_name: Frese
- first_name: Gerhard
  full_name: Jakob, Gerhard
  last_name: Jakob
- first_name: Joachim
  full_name: Wollschläger, Joachim
  last_name: Wollschläger
- first_name: Gabi
  full_name: Schierning, Gabi
  last_name: Schierning
- first_name: Andreas
  full_name: Hütten, Andreas
  last_name: Hütten
- first_name: Timo
  full_name: Kuschel, Timo
  last_name: Kuschel
citation:
  alphadin: '<span style="font-variant:small-caps;"><span style="font-variant:small-caps;">Wortmann,
    Martin</span> ; <span style="font-variant:small-caps;">Bednarz, Beatrice</span>
    ; <span style="font-variant:small-caps;">Nezafat, Negin Beryani</span> ; <span
    style="font-variant:small-caps;">Viertel, Klaus</span> ; <span style="font-variant:small-caps;">Kuschel,
    Olga</span> ; <span style="font-variant:small-caps;">Schmalhorst, Jan</span> ;
    <span style="font-variant:small-caps;">Ennen, Inga</span> ; <span style="font-variant:small-caps;">Gärner,
    Maik</span> ; u. a.</span>: Oxidation state depth profiling by self-consistent
    fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In:
    <i>Applied Surface Science</i> Bd. 713, Elsevier BV (2025)'
  ama: Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by
    self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum
    of SnTe. <i>Applied Surface Science</i>. 2025;713. doi:<a href="https://doi.org/10.1016/j.apsusc.2025.164356">10.1016/j.apsusc.2025.164356</a>
  apa: Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst,
    J., … Kuschel, T. (2025). Oxidation state depth profiling by self-consistent fitting
    of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied
    Surface Science</i>, <i>713</i>. <a href="https://doi.org/10.1016/j.apsusc.2025.164356">https://doi.org/10.1016/j.apsusc.2025.164356</a>
  bibtex: '@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et
    al._2025, title={Oxidation state depth profiling by self-consistent fitting of
    all emission peaks in the X-ray photoelectron spectrum of SnTe}, volume={713},
    DOI={<a href="https://doi.org/10.1016/j.apsusc.2025.164356">10.1016/j.apsusc.2025.164356</a>},
    number={164356}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Wortmann,
    Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and
    Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese,
    Natalie and Jakob, Gerhard and et al.}, year={2025} }'
  chicago: Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel,
    Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling
    by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum
    of SnTe.” <i>Applied Surface Science</i> 713 (2025). <a href="https://doi.org/10.1016/j.apsusc.2025.164356">https://doi.org/10.1016/j.apsusc.2025.164356</a>.
  ieee: M. Wortmann <i>et al.</i>, “Oxidation state depth profiling by self-consistent
    fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” <i>Applied
    Surface Science</i>, vol. 713, 2025.
  mla: Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent
    Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied
    Surface Science</i>, vol. 713, 164356, Elsevier BV, 2025, doi:<a href="https://doi.org/10.1016/j.apsusc.2025.164356">10.1016/j.apsusc.2025.164356</a>.
  short: M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst,
    I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten,
    T. Kuschel, Applied Surface Science 713 (2025).
date_created: 2026-02-05T14:19:41Z
date_updated: 2026-04-28T14:39:46Z
doi: 10.1016/j.apsusc.2025.164356
intvolume: '       713'
language:
- iso: eng
project:
- _id: f89a05bb-bcea-11ed-9442-ed382659bc06
  name: Bielefelder Institut für Angewandte Materialforschung
publication: Applied Surface Science
publication_identifier:
  issn:
  - 0169-4332
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: Oxidation state depth profiling by self-consistent fitting of all emission
  peaks in the X-ray photoelectron spectrum of SnTe
type: journal_article
user_id: '257163'
volume: 713
year: '2025'
...