[{"page":"64-65","publisher":"Hüthig GmbH & Co. KG","date_updated":"2026-03-17T15:28:32Z","author":[{"full_name":"Battermann, Sven","orcid":"0000-0001-7203-7396","last_name":"Battermann","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7203-7396/work/179426603","id":"219522","first_name":"Sven"}],"citation":{"short":"S. Battermann, Elektronik Industrie (2007) 64–65.","chicago":"Battermann, Sven. “Neue Perspektiven in der Störfestigkeitsuntersuchung.” <i>Elektronik Industrie</i>, no. 7 (2007): 64–65.","ama":"Battermann S. Neue Perspektiven in der Störfestigkeitsuntersuchung. <i>Elektronik Industrie</i>. 2007;(7):64-65.","mla":"Battermann, Sven. “Neue Perspektiven in der Störfestigkeitsuntersuchung.” <i>Elektronik Industrie</i>, no. 7, Hüthig GmbH &#38; Co. KG, 2007, pp. 64–65.","ieee":"S. Battermann, “Neue Perspektiven in der Störfestigkeitsuntersuchung,” <i>Elektronik Industrie</i>, no. 7, pp. 64–65, 2007.","bibtex":"@article{Battermann_2007, title={Neue Perspektiven in der Störfestigkeitsuntersuchung}, number={7}, journal={Elektronik Industrie}, publisher={Hüthig GmbH &#38; Co. KG}, author={Battermann, Sven}, year={2007}, pages={64–65} }","apa":"Battermann, S. (2007). Neue Perspektiven in der Störfestigkeitsuntersuchung. <i>Elektronik Industrie</i>, (7), 64–65.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span>: Neue Perspektiven in der Störfestigkeitsuntersuchung. In: <i>Elektronik Industrie</i>, Hüthig GmbH &#38; Co. KG (2007), Nr. 7, S. 64–65"},"status":"public","year":"2007","_id":"2403","language":[{"iso":"ger"}],"title":"Neue Perspektiven in der Störfestigkeitsuntersuchung","related_material":{"link":[{"relation":"contains","url":"https://www.all-electronics.de/wp-content/uploads/migrated/article-pdf/77860/ei07-07-064.pdf"}]},"date_created":"2023-02-11T17:23:05Z","publication_status":"published","publication":"Elektronik Industrie","issue":"7","publication_identifier":{"issn":["0174-5522"]},"type":"journal_article","oa":"1","extern":"1","user_id":"33980","main_file_link":[{"url":"https://www.all-electronics.de/wp-content/uploads/migrated/article-pdf/77860/ei07-07-064.pdf","open_access":"1"}]}]