---
_id: '3555'
author:
- first_name: U
  full_name: Kleineberg, U
  last_name: Kleineberg
- first_name: D
  full_name: Menke, D
  last_name: Menke
- first_name: Frank
  full_name: Hamelmann, Frank
  id: '208487'
  last_name: Hamelmann
  orcid: 0000-0001-6141-9874
- first_name: U
  full_name: Heinzmann, U
  last_name: Heinzmann
- first_name: O
  full_name: Schmidt, O
  last_name: Schmidt
- first_name: G.H
  full_name: Fecher, G.H
  last_name: Fecher
- first_name: G
  full_name: Schoenhense, G
  last_name: Schoenhense
citation:
  alphadin: '<span style="font-variant:small-caps;">Kleineberg, U</span> ; <span style="font-variant:small-caps;">Menke,
    D</span> ; <span style="font-variant:small-caps;">Hamelmann, Frank</span> ; <span
    style="font-variant:small-caps;">Heinzmann, U</span> ; <span style="font-variant:small-caps;">Schmidt,
    O</span> ; <span style="font-variant:small-caps;">Fecher, G.H</span> ; <span style="font-variant:small-caps;">Schoenhense,
    G</span>: Photoemission microscopy with microspot-XPS by use of undulator radiation
    and a high-throughput multilayer monochromator at BESSY. In: <i>Journal of Electron
    Spectroscopy and Related Phenomena</i> Bd. 101–103, Elsevier BV (1999), S. 931–936'
  ama: Kleineberg U, Menke D, Hamelmann F, et al. Photoemission microscopy with microspot-XPS
    by use of undulator radiation and a high-throughput multilayer monochromator at
    BESSY. <i>Journal of Electron Spectroscopy and Related Phenomena</i>. 1999;101-103:931-936.
    doi:<a href="https://doi.org/10.1016/S0368-2048(98)00374-0">10.1016/S0368-2048(98)00374-0</a>
  apa: Kleineberg, U., Menke, D., Hamelmann, F., Heinzmann, U., Schmidt, O., Fecher,
    G. ., &#38; Schoenhense, G. (1999). Photoemission microscopy with microspot-XPS
    by use of undulator radiation and a high-throughput multilayer monochromator at
    BESSY. <i>Journal of Electron Spectroscopy and Related Phenomena</i>, <i>101</i>–<i>103</i>,
    931–936. <a href="https://doi.org/10.1016/S0368-2048(98)00374-0">https://doi.org/10.1016/S0368-2048(98)00374-0</a>
  bibtex: '@article{Kleineberg_Menke_Hamelmann_Heinzmann_Schmidt_Fecher_Schoenhense_1999,
    title={Photoemission microscopy with microspot-XPS by use of undulator radiation
    and a high-throughput multilayer monochromator at BESSY}, volume={101–103}, DOI={<a
    href="https://doi.org/10.1016/S0368-2048(98)00374-0">10.1016/S0368-2048(98)00374-0</a>},
    journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier
    BV}, author={Kleineberg, U and Menke, D and Hamelmann, Frank and Heinzmann, U
    and Schmidt, O and Fecher, G.H and Schoenhense, G}, year={1999}, pages={931–936}
    }'
  chicago: 'Kleineberg, U, D Menke, Frank Hamelmann, U Heinzmann, O Schmidt, G.H Fecher,
    and G Schoenhense. “Photoemission Microscopy with Microspot-XPS by Use of Undulator
    Radiation and a High-Throughput Multilayer Monochromator at BESSY.” <i>Journal
    of Electron Spectroscopy and Related Phenomena</i> 101–103 (1999): 931–36. <a
    href="https://doi.org/10.1016/S0368-2048(98)00374-0">https://doi.org/10.1016/S0368-2048(98)00374-0</a>.'
  ieee: U. Kleineberg <i>et al.</i>, “Photoemission microscopy with microspot-XPS
    by use of undulator radiation and a high-throughput multilayer monochromator at
    BESSY,” <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 101–103,
    pp. 931–936, 1999.
  mla: Kleineberg, U., et al. “Photoemission Microscopy with Microspot-XPS by Use
    of Undulator Radiation and a High-Throughput Multilayer Monochromator at BESSY.”
    <i>Journal of Electron Spectroscopy and Related Phenomena</i>, vol. 101–103, Elsevier
    BV, 1999, pp. 931–36, doi:<a href="https://doi.org/10.1016/S0368-2048(98)00374-0">10.1016/S0368-2048(98)00374-0</a>.
  short: U. Kleineberg, D. Menke, F. Hamelmann, U. Heinzmann, O. Schmidt, G.. Fecher,
    G. Schoenhense, Journal of Electron Spectroscopy and Related Phenomena 101–103
    (1999) 931–936.
date_created: 2023-09-01T10:07:44Z
date_updated: 2026-03-17T15:28:46Z
doi: 10.1016/S0368-2048(98)00374-0
language:
- iso: eng
page: 931-936
publication: Journal of Electron Spectroscopy and Related Phenomena
publication_identifier:
  issn:
  - '03682048'
publication_status: published
publisher: Elsevier BV
status: public
title: Photoemission microscopy with microspot-XPS by use of undulator radiation and
  a high-throughput multilayer monochromator at BESSY
type: journal_article
user_id: '216459'
volume: 101-103
year: '1999'
...