[{"quality_controlled":"1","volume":2,"date_created":"2022-09-24T09:06:15Z","title":"Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1","extern":"1","user_id":"245590","publication_identifier":{"eissn":["1751-8830"],"issn":["1751-8822"]},"type":"journal_article","publication_status":"published","publication":"IET Science, Measurement & Technology","issue":"3","status":"public","author":[{"first_name":"Sven","id":"219522","orcid":"0000-0001-7203-7396","full_name":"Battermann, Sven","last_name":"Battermann"},{"last_name":"Papatsoris","full_name":"Papatsoris, A.D.","first_name":"A.D."},{"first_name":"V.","last_name":"Beauvois","full_name":"Beauvois, V."},{"first_name":"I.D.","full_name":"Flintoft, I.D.","last_name":"Flintoft"},{"last_name":"Pous","full_name":"Pous, M.","first_name":"M."},{"first_name":"V.","full_name":"Degardin, V.","last_name":"Degardin"},{"first_name":"P.","last_name":"Degauque","full_name":"Degauque, P."},{"first_name":"F.","last_name":"Silva","full_name":"Silva, F."},{"full_name":"Marvin, A.C.","last_name":"Marvin","first_name":"A.C."},{"first_name":"J.","last_name":"Newbury","full_name":"Newbury, J."},{"last_name":"Liénard","full_name":"Liénard, M.","first_name":"M."},{"last_name":"Garbe","full_name":"Garbe, H.","first_name":"H."},{"full_name":"Catrysse, J.","last_name":"Catrysse","first_name":"J."},{"first_name":"D.W.","full_name":"Welsh, D.W.","last_name":"Welsh"},{"last_name":"Vantomme","full_name":"Vantomme, K.","first_name":"K."}],"citation":{"ama":"Battermann S, Papatsoris AD, Beauvois V, et al. Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. <i>IET Science, Measurement &#38; Technology</i>. 2008;2(3):146-153. doi:<a href=\"https://doi.org/10.1049/iet-smt:20070055\">10.1049/iet-smt:20070055</a>","mla":"Battermann, Sven, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 1.” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, Institution of Engineering and Technology (IET), 2008, pp. 146–53, doi:<a href=\"https://doi.org/10.1049/iet-smt:20070055\">10.1049/iet-smt:20070055</a>.","short":"S. Battermann, A.D. Papatsoris, V. Beauvois, I.D. Flintoft, M. Pous, V. Degardin, P. Degauque, F. Silva, A.C. Marvin, J. Newbury, M. Liénard, H. Garbe, J. Catrysse, D.W. Welsh, K. Vantomme, IET Science, Measurement &#38; Technology 2 (2008) 146–153.","chicago":"Battermann, Sven, A.D. Papatsoris, V. Beauvois, I.D. Flintoft, M. Pous, V. Degardin, P. Degauque, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 1.” <i>IET Science, Measurement &#38; Technology</i> 2, no. 3 (2008): 146–53. <a href=\"https://doi.org/10.1049/iet-smt:20070055\">https://doi.org/10.1049/iet-smt:20070055</a>.","apa":"Battermann, S., Papatsoris, A. D., Beauvois, V., Flintoft, I. D., Pous, M., Degardin, V., … Vantomme, K. (2008). Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. <i>IET Science, Measurement &#38; Technology</i>, <i>2</i>(3), 146–153. <a href=\"https://doi.org/10.1049/iet-smt:20070055\">https://doi.org/10.1049/iet-smt:20070055</a>","bibtex":"@article{Battermann_Papatsoris_Beauvois_Flintoft_Pous_Degardin_Degauque_Silva_Marvin_Newbury_et al._2008, title={Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1}, volume={2}, DOI={<a href=\"https://doi.org/10.1049/iet-smt:20070055\">10.1049/iet-smt:20070055</a>}, number={3}, journal={IET Science, Measurement &#38; Technology}, publisher={Institution of Engineering and Technology (IET)}, author={Battermann, Sven and Papatsoris, A.D. and Beauvois, V. and Flintoft, I.D. and Pous, M. and Degardin, V. and Degauque, P. and Silva, F. and Marvin, A.C. and Newbury, J. and et al.}, year={2008}, pages={146–153} }","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Papatsoris, A.D.</span> ; <span style=\"font-variant:small-caps;\">Beauvois, V.</span> ; <span style=\"font-variant:small-caps;\">Flintoft, I.D.</span> ; <span style=\"font-variant:small-caps;\">Pous, M.</span> ; <span style=\"font-variant:small-caps;\">Degardin, V.</span> ; <span style=\"font-variant:small-caps;\">Degauque, P.</span> ; <span style=\"font-variant:small-caps;\">Silva, F.</span> ; u. a.</span>: Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1. In: <i>IET Science, Measurement &#38; Technology</i> Bd. 2, Institution of Engineering and Technology (IET) (2008), Nr. 3, S. 146–153","ieee":"S. Battermann <i>et al.</i>, “Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 1,” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, pp. 146–153, 2008."},"date_updated":"2026-03-17T15:28:29Z","page":"146-153","publisher":"Institution of Engineering and Technology (IET)","doi":"10.1049/iet-smt:20070055","intvolume":"         2","language":[{"iso":"eng"}],"_id":"2128","year":"2008"},{"volume":2,"date_created":"2022-09-24T09:06:17Z","title":"Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2","quality_controlled":"1","publication":"IET Science, Measurement & Technology","issue":"3","publication_status":"published","extern":"1","user_id":"219522","publication_identifier":{"issn":["1751-8822"],"eissn":["1751-8830"]},"type":"journal_article","date_updated":"2026-03-17T15:28:29Z","publisher":"Institution of Engineering and Technology (IET)","page":"154-159","doi":"10.1049/iet-smt:20070056","intvolume":"         2","status":"public","citation":{"alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Silva, F.</span> ; <span style=\"font-variant:small-caps;\">Garbe, H.</span> ; <span style=\"font-variant:small-caps;\">Pous, M.</span> ; <span style=\"font-variant:small-caps;\">Marvin, A.C.</span> ; <span style=\"font-variant:small-caps;\">Degardin, V.</span> ; <span style=\"font-variant:small-caps;\">Welsh, D.W.</span> ; <span style=\"font-variant:small-caps;\">Newbury, J.</span> ; u. a.</span>: Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. In: <i>IET Science, Measurement &#38; Technology</i> Bd. 2, Institution of Engineering and Technology (IET) (2008), Nr. 3, S. 154–159","bibtex":"@article{Battermann_Silva_Garbe_Pous_Marvin_Degardin_Welsh_Newbury_Papatsoris_Catrysse_et al._2008, title={Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2}, volume={2}, DOI={<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>}, number={3}, journal={IET Science, Measurement &#38; Technology}, publisher={Institution of Engineering and Technology (IET)}, author={Battermann, Sven and Silva, F. and Garbe, H. and Pous, M. and Marvin, A.C. and Degardin, V. and Welsh, D.W. and Newbury, J. and Papatsoris, A.D. and Catrysse, J. and et al.}, year={2008}, pages={154–159} }","apa":"Battermann, S., Silva, F., Garbe, H., Pous, M., Marvin, A. C., Degardin, V., … Liénard, M. (2008). Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. <i>IET Science, Measurement &#38; Technology</i>, <i>2</i>(3), 154–159. <a href=\"https://doi.org/10.1049/iet-smt:20070056\">https://doi.org/10.1049/iet-smt:20070056</a>","ieee":"S. Battermann <i>et al.</i>, “Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2,” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, pp. 154–159, 2008.","mla":"Battermann, Sven, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 2.” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 3, Institution of Engineering and Technology (IET), 2008, pp. 154–59, doi:<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>.","ama":"Battermann S, Silva F, Garbe H, et al. Electromagnetic compatibility analysis of unstructured mains networks for high-speed data transmission: Part 2. <i>IET Science, Measurement &#38; Technology</i>. 2008;2(3):154-159. doi:<a href=\"https://doi.org/10.1049/iet-smt:20070056\">10.1049/iet-smt:20070056</a>","short":"S. Battermann, F. Silva, H. Garbe, M. Pous, A.C. Marvin, V. Degardin, D.W. Welsh, J. Newbury, A.D. Papatsoris, J. Catrysse, I.D. Flintoft, K. Vantomme, P. Degauque, V. Beauvois, M. Liénard, IET Science, Measurement &#38; Technology 2 (2008) 154–159.","chicago":"Battermann, Sven, F. Silva, H. Garbe, M. Pous, A.C. Marvin, V. Degardin, D.W. Welsh, et al. “Electromagnetic Compatibility Analysis of Unstructured Mains Networks for High-Speed Data Transmission: Part 2.” <i>IET Science, Measurement &#38; Technology</i> 2, no. 3 (2008): 154–59. <a href=\"https://doi.org/10.1049/iet-smt:20070056\">https://doi.org/10.1049/iet-smt:20070056</a>."},"author":[{"last_name":"Battermann","full_name":"Battermann, Sven","orcid":"0000-0001-7203-7396","id":"219522","first_name":"Sven"},{"last_name":"Silva","full_name":"Silva, F.","first_name":"F."},{"full_name":"Garbe, H.","last_name":"Garbe","first_name":"H."},{"first_name":"M.","last_name":"Pous","full_name":"Pous, M."},{"full_name":"Marvin, A.C.","last_name":"Marvin","first_name":"A.C."},{"last_name":"Degardin","full_name":"Degardin, V.","first_name":"V."},{"last_name":"Welsh","full_name":"Welsh, D.W.","first_name":"D.W."},{"last_name":"Newbury","full_name":"Newbury, J.","first_name":"J."},{"first_name":"A.D.","last_name":"Papatsoris","full_name":"Papatsoris, A.D."},{"first_name":"J.","full_name":"Catrysse, J.","last_name":"Catrysse"},{"first_name":"I.D.","full_name":"Flintoft, I.D.","last_name":"Flintoft"},{"first_name":"K.","full_name":"Vantomme, K.","last_name":"Vantomme"},{"first_name":"P.","full_name":"Degauque, P.","last_name":"Degauque"},{"last_name":"Beauvois","full_name":"Beauvois, V.","first_name":"V."},{"last_name":"Liénard","full_name":"Liénard, M.","first_name":"M."}],"language":[{"iso":"eng"}],"_id":"2129","year":"2008"},{"_id":"2131","year":"2008","language":[{"iso":"eng"}],"doi":"10.1049/iet-smt:20070012","intvolume":"         2","date_updated":"2026-03-17T15:28:29Z","page":"18-24","publisher":"Institution of Engineering and Technology (IET)","author":[{"last_name":"Roje","full_name":"Roje, V.","first_name":"V."},{"first_name":"S.","full_name":"Cecil, S.","last_name":"Cecil"},{"last_name":"Battermann","orcid":"0000-0001-7203-7396","full_name":"Battermann, Sven","first_name":"Sven","id":"219522"},{"first_name":"P.","full_name":"Beerten, P.","last_name":"Beerten"},{"last_name":"Skrzypczynski","full_name":"Skrzypczynski, J.","first_name":"J."},{"last_name":"Lamedschwandner","full_name":"Lamedschwandner, K.","first_name":"K."},{"first_name":"V.","full_name":"Beauvois, V.","last_name":"Beauvois"},{"first_name":"J.","full_name":"Paul, J.","last_name":"Paul"},{"full_name":"Renard, M.","last_name":"Renard","first_name":"M."},{"first_name":"H.","last_name":"Garbe","full_name":"Garbe, H."},{"full_name":"Rubinstein, A.","last_name":"Rubinstein","first_name":"A."},{"first_name":"C.","last_name":"Christopoulos","full_name":"Christopoulos, C."},{"first_name":"F.","full_name":"Rachidi, F.","last_name":"Rachidi"},{"last_name":"Antonijevic","full_name":"Antonijevic, S.","first_name":"S."},{"full_name":"Zhang, Y.","last_name":"Zhang","first_name":"Y."},{"full_name":"Doric, V.","last_name":"Doric","first_name":"V."},{"first_name":"T.","full_name":"Nakovits, T.","last_name":"Nakovits"},{"first_name":"J.","last_name":"Welinder","full_name":"Welinder, J."},{"first_name":"A.A.","last_name":"Kucharski","full_name":"Kucharski, A.A."},{"full_name":"Preineder, H.","last_name":"Preineder","first_name":"H."}],"citation":{"chicago":"Roje, V., S. Cecil, Sven Battermann, P. Beerten, J. Skrzypczynski, K. Lamedschwandner, V. Beauvois, et al. “Near-Field Coupling of Wireless Devices and Long Communications Cables.” <i>IET Science, Measurement &#38; Technology</i> 2, no. 1 (2008): 18–24. <a href=\"https://doi.org/10.1049/iet-smt:20070012\">https://doi.org/10.1049/iet-smt:20070012</a>.","short":"V. Roje, S. Cecil, S. Battermann, P. Beerten, J. Skrzypczynski, K. Lamedschwandner, V. Beauvois, J. Paul, M. Renard, H. Garbe, A. Rubinstein, C. Christopoulos, F. Rachidi, S. Antonijevic, Y. Zhang, V. Doric, T. Nakovits, J. Welinder, A.A. Kucharski, H. Preineder, IET Science, Measurement &#38; Technology 2 (2008) 18–24.","mla":"Roje, V., et al. “Near-Field Coupling of Wireless Devices and Long Communications Cables.” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 1, Institution of Engineering and Technology (IET), 2008, pp. 18–24, doi:<a href=\"https://doi.org/10.1049/iet-smt:20070012\">10.1049/iet-smt:20070012</a>.","ama":"Roje V, Cecil S, Battermann S, et al. Near-field coupling of wireless devices and long communications cables. <i>IET Science, Measurement &#38; Technology</i>. 2008;2(1):18-24. doi:<a href=\"https://doi.org/10.1049/iet-smt:20070012\">10.1049/iet-smt:20070012</a>","ieee":"V. Roje <i>et al.</i>, “Near-field coupling of wireless devices and long communications cables,” <i>IET Science, Measurement &#38; Technology</i>, vol. 2, no. 1, pp. 18–24, 2008.","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Roje, V.</span> ; <span style=\"font-variant:small-caps;\">Cecil, S.</span> ; <span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Beerten, P.</span> ; <span style=\"font-variant:small-caps;\">Skrzypczynski, J.</span> ; <span style=\"font-variant:small-caps;\">Lamedschwandner, K.</span> ; <span style=\"font-variant:small-caps;\">Beauvois, V.</span> ; <span style=\"font-variant:small-caps;\">Paul, J.</span> ; u. a.</span>: Near-field coupling of wireless devices and long communications cables. In: <i>IET Science, Measurement &#38; Technology</i> Bd. 2, Institution of Engineering and Technology (IET) (2008), Nr. 1, S. 18–24","apa":"Roje, V., Cecil, S., Battermann, S., Beerten, P., Skrzypczynski, J., Lamedschwandner, K., … Preineder, H. (2008). Near-field coupling of wireless devices and long communications cables. <i>IET Science, Measurement &#38; Technology</i>, <i>2</i>(1), 18–24. <a href=\"https://doi.org/10.1049/iet-smt:20070012\">https://doi.org/10.1049/iet-smt:20070012</a>","bibtex":"@article{Roje_Cecil_Battermann_Beerten_Skrzypczynski_Lamedschwandner_Beauvois_Paul_Renard_Garbe_et al._2008, title={Near-field coupling of wireless devices and long communications cables}, volume={2}, DOI={<a href=\"https://doi.org/10.1049/iet-smt:20070012\">10.1049/iet-smt:20070012</a>}, number={1}, journal={IET Science, Measurement &#38; Technology}, publisher={Institution of Engineering and Technology (IET)}, author={Roje, V. and Cecil, S. and Battermann, Sven and Beerten, P. and Skrzypczynski, J. and Lamedschwandner, K. and Beauvois, V. and Paul, J. and Renard, M. and Garbe, H. and et al.}, year={2008}, pages={18–24} }"},"status":"public","issue":"1","publication_status":"published","publication":"IET Science, Measurement & Technology","publication_identifier":{"eissn":["1751-8830"],"issn":["1751-8822"]},"type":"journal_article","user_id":"245590","date_created":"2022-09-24T09:06:19Z","title":"Near-field coupling of wireless devices and long communications cables","volume":2}]