@article{3492,
  author       = {Feng, Li and Zhang, Jingwei and Kiong, Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.},
  issn         = {2156-3403},
  journal      = {IEEE Journal of Photovoltaics},
  number       = {4},
  pages        = {558--570},
  publisher    = {Institute of Electrical and Electronics Engineers (IEEE)},
  title        = {{Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves}},
  doi          = {10.1109/JPHOTOV.2023.3275251},
  volume       = {13},
  year         = {2023},
}

@article{3520,
  author       = {Corpus-Mendoza, Asiel Neftali and De Souza, Maria Merlyne and Hamelmann, Frank},
  issn         = {2156-3403},
  journal      = {IEEE Journal of Photovoltaics},
  number       = {1},
  pages        = {22--27},
  publisher    = {Institute of Electrical and Electronics Engineers (IEEE)},
  title        = {{Design of Schottky Contacts for Optimum Performance of Thin-Film Silicon Solar Cells}},
  doi          = {10.1109/JPHOTOV.2014.2362306},
  volume       = {5},
  year         = {2015},
}