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Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>. 2023;13(4):558-570. doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>","mla":"Feng, Li, et al. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 558–70, doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>.","short":"L. Feng, J. Zhang, T.S. Kiong, K. Ding, N. Amin, F.U. Hamelmann, IEEE Journal of Photovoltaics 13 (2023) 558–570.","chicago":"Feng, Li, Jingwei Zhang, Tiong Sieh Kiong, Kun Ding, Nowshad Amin, and Frank U. Hamelmann. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i> 13, no. 4 (2023): 558–70. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>.","apa":"Feng, L., Zhang, J., Kiong, T. S., Ding, K., Amin, N., &#38; Hamelmann, F. U. (2023). Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>, <i>13</i>(4), 558–570. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>","bibtex":"@article{Feng_Zhang_Kiong_Ding_Amin_Hamelmann_2023, title={Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves}, volume={13}, DOI={<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>}, number={4}, journal={IEEE Journal of Photovoltaics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Feng, Li and Zhang, Jingwei and Kiong, Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.}, year={2023}, pages={558–570} }","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Kiong, Tiong Sieh</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Amin, Nowshad</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank U.</span>: Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. 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Hamelmann, “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves,” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, pp. 558–570, 2023."},"status":"public","doi":"10.1109/JPHOTOV.2023.3275251","intvolume":"        13","date_updated":"2026-03-17T15:28:45Z","page":"558-570","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","_id":"3492","year":"2023","language":[{"iso":"eng"}]},{"volume":5,"date_created":"2023-09-01T08:53:43Z","title":"Design of Schottky Contacts for Optimum Performance of Thin-Film Silicon Solar Cells","issue":"1","publication":"IEEE Journal of Photovoltaics","publication_status":"published","main_file_link":[{"url":"https://doi.org/10.1109/JPHOTOV.2014.2362306","open_access":"1"}],"user_id":"245590","oa":"1","publication_identifier":{"eissn":["2156-3403"],"issn":["2156-3381"]},"type":"journal_article","date_updated":"2026-03-17T15:28:45Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","page":"22-27","doi":"10.1109/JPHOTOV.2014.2362306","intvolume":"         5","status":"public","citation":{"ieee":"A. 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Design of Schottky Contacts for Optimum Performance of Thin-Film Silicon Solar Cells. <i>IEEE Journal of Photovoltaics</i>. 2015;5(1):22-27. doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2014.2362306\">10.1109/JPHOTOV.2014.2362306</a>"},"author":[{"last_name":"Corpus-Mendoza","full_name":"Corpus-Mendoza, Asiel Neftali","first_name":"Asiel Neftali"},{"first_name":"Maria Merlyne","full_name":"De Souza, Maria Merlyne","last_name":"De Souza"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"}],"language":[{"iso":"eng"}],"_id":"3520","year":"2015"}]