@inproceedings{175,
  author       = {Weicht, Johannes and Hamelmann, Frank and Behrens, Grit},
  issn         = {2196-100X},
  location     = {München},
  title        = {{Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells}},
  doi          = {10.4229/EUPVSEC20162016-3DV.1.4},
  year         = {2016},
}