[{"publication_identifier":{"issn":["2196-100X"]},"type":"conference","alternative_id":["3514"],"user_id":"231260","date_created":"2019-04-17T13:04:49Z","title":"Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells","_id":"175","year":"2016","language":[{"iso":"eng"}],"author":[{"last_name":"Weicht","full_name":"Weicht, Johannes","first_name":"Johannes"},{"first_name":"Frank","id":"208487","last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank"},{"first_name":"Grit","orcid_put_code_url":"https://api.orcid.org/v2.0/0009-0009-0247-8204/work/184175890","id":"207629","orcid":"0009-0009-0247-8204","full_name":"Behrens, Grit","last_name":"Behrens"}],"citation":{"short":"J. Weicht, F. Hamelmann, G. Behrens, in: 2016.","chicago":"Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,” 2016. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>.","ama":"Weicht J, Hamelmann F, Behrens G. Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: ; 2016. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>","mla":"Weicht, Johannes, et al. <i>Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells</i>. 2016, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>.","ieee":"J. Weicht, F. Hamelmann, and G. Behrens, “Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells,” presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München, 2016.","bibtex":"@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>}, author={Weicht, Johannes and Hamelmann, Frank and Behrens, Grit}, year={2016} }","apa":"Weicht, J., Hamelmann, F., &#38; Behrens, G. (2016). Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, Johannes</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: , 2016"},"status":"public","conference":{"start_date":"2016-06-20","end_date":"2016-06-24","name":"32nd European Photovoltaic Solar Energy Conference and Exhibition","location":"München"},"doi":"10.4229/EUPVSEC20162016-3DV.1.4","date_updated":"2026-03-17T15:28:24Z"}]