---
_id: '175'
alternative_id:
- '3514'
author:
- first_name: Johannes
  full_name: Weicht, Johannes
  last_name: Weicht
- first_name: Frank
  full_name: Hamelmann, Frank
  id: '208487'
  last_name: Hamelmann
  orcid: 0000-0001-6141-9874
- first_name: Grit
  full_name: Behrens, Grit
  id: '207629'
  last_name: Behrens
  orcid: 0009-0009-0247-8204
  orcid_put_code_url: https://api.orcid.org/v2.0/0009-0009-0247-8204/work/184175890
citation:
  alphadin: '<span style="font-variant:small-caps;">Weicht, Johannes</span> ; <span
    style="font-variant:small-caps;">Hamelmann, Frank</span> ; <span style="font-variant:small-caps;">Behrens,
    Grit</span>: Changes in temperature-coefficient of the diode model caused by light-induced
    degradation of a-Si/μc-Si solar cells. In: , 2016'
  ama: 'Weicht J, Hamelmann F, Behrens G. Changes in temperature-coefficient of the
    diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In:
    ; 2016. doi:<a href="https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4">10.4229/EUPVSEC20162016-3DV.1.4</a>'
  apa: Weicht, J., Hamelmann, F., &#38; Behrens, G. (2016). Changes in temperature-coefficient
    of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells.
    Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition,
    München. <a href="https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>
  bibtex: '@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in temperature-coefficient
    of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells},
    DOI={<a href="https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4">10.4229/EUPVSEC20162016-3DV.1.4</a>},
    author={Weicht, Johannes and Hamelmann, Frank and Behrens, Grit}, year={2016}
    }'
  chicago: Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient
    of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,”
    2016. <a href="https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>.
  ieee: J. Weicht, F. Hamelmann, and G. Behrens, “Changes in temperature-coefficient
    of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells,”
    presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition,
    München, 2016.
  mla: Weicht, Johannes, et al. <i>Changes in Temperature-Coefficient of the Diode
    Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells</i>. 2016,
    doi:<a href="https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4">10.4229/EUPVSEC20162016-3DV.1.4</a>.
  short: 'J. Weicht, F. Hamelmann, G. Behrens, in: 2016.'
conference:
  end_date: 2016-06-24
  location: München
  name: 32nd European Photovoltaic Solar Energy Conference and Exhibition
  start_date: 2016-06-20
date_created: 2019-04-17T13:04:49Z
date_updated: 2026-03-17T15:28:24Z
doi: 10.4229/EUPVSEC20162016-3DV.1.4
language:
- iso: eng
publication_identifier:
  issn:
  - 2196-100X
status: public
title: Changes in temperature-coefficient of the diode model caused by light-induced
  degradation of a-Si/μc-Si solar cells
type: conference
user_id: '231260'
year: '2016'
...