[{"volume":8,"date_created":"2024-05-08T13:37:49Z","title":"Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra","publication_status":"published","issue":"3","publication":"Small Methods","main_file_link":[{"open_access":"1"}],"user_id":"220548","oa":"1","type":"journal_article","publication_identifier":{"issn":["2366-9608"],"eissn":["2366-9608"]},"date_updated":"2026-03-17T15:29:02Z","publisher":"Wiley","doi":"10.1002/smtd.202300944","intvolume":"         8","status":"public","author":[{"full_name":"Wortmann, Martin","last_name":"Wortmann","first_name":"Martin"},{"full_name":"Viertel, Klaus","orcid":"0000-0001-8851-8434","last_name":"Viertel","id":"215306","first_name":"Klaus"},{"first_name":"Michael","last_name":"Westphal","full_name":"Westphal, Michael"},{"last_name":"Graulich","full_name":"Graulich, Dominik","first_name":"Dominik"},{"first_name":"Yang","last_name":"Yang","full_name":"Yang, Yang"},{"full_name":"Gärner, Maik","last_name":"Gärner","first_name":"Maik"},{"last_name":"Schmalhorst","full_name":"Schmalhorst, Jan","first_name":"Jan"},{"last_name":"Frese","full_name":"Frese, Natalie","first_name":"Natalie"},{"last_name":"Kuschel","full_name":"Kuschel, Timo","first_name":"Timo"}],"citation":{"short":"M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J. Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).","chicago":"Wortmann, Martin, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese, and Timo Kuschel. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” <i>Small Methods</i> 8, no. 3 (2024). <a href=\"https://doi.org/10.1002/smtd.202300944\">https://doi.org/10.1002/smtd.202300944</a>.","ama":"Wortmann M, Viertel K, Westphal M, et al. Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. <i>Small Methods</i>. 2024;8(3). doi:<a href=\"https://doi.org/10.1002/smtd.202300944\">10.1002/smtd.202300944</a>","mla":"Wortmann, Martin, et al. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” <i>Small Methods</i>, vol. 8, no. 3, Wiley, 2024, doi:<a href=\"https://doi.org/10.1002/smtd.202300944\">10.1002/smtd.202300944</a>.","ieee":"M. Wortmann <i>et al.</i>, “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra,” <i>Small Methods</i>, vol. 8, no. 3, 2024.","bibtex":"@article{Wortmann_Viertel_Westphal_Graulich_Yang_Gärner_Schmalhorst_Frese_Kuschel_2024, title={Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra}, volume={8}, DOI={<a href=\"https://doi.org/10.1002/smtd.202300944\">10.1002/smtd.202300944</a>}, number={3}, journal={Small Methods}, publisher={Wiley}, author={Wortmann, Martin and Viertel, Klaus and Westphal, Michael and Graulich, Dominik and Yang, Yang and Gärner, Maik and Schmalhorst, Jan and Frese, Natalie and Kuschel, Timo}, year={2024} }","apa":"Wortmann, M., Viertel, K., Westphal, M., Graulich, D., Yang, Y., Gärner, M., … Kuschel, T. (2024). Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. <i>Small Methods</i>, <i>8</i>(3). <a href=\"https://doi.org/10.1002/smtd.202300944\">https://doi.org/10.1002/smtd.202300944</a>","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Wortmann, Martin</span> ; <span style=\"font-variant:small-caps;\">Viertel, Klaus</span> ; <span style=\"font-variant:small-caps;\">Westphal, Michael</span> ; <span style=\"font-variant:small-caps;\">Graulich, Dominik</span> ; <span style=\"font-variant:small-caps;\">Yang, Yang</span> ; <span style=\"font-variant:small-caps;\">Gärner, Maik</span> ; <span style=\"font-variant:small-caps;\">Schmalhorst, Jan</span> ; <span style=\"font-variant:small-caps;\">Frese, Natalie</span> ; u. a.</span>: Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. In: <i>Small Methods</i> Bd. 8, Wiley (2024), Nr. 3"},"language":[{"iso":"eng"}],"_id":"4571","year":"2024"}]