---
_id: '4571'
author:
- first_name: Martin
  full_name: Wortmann, Martin
  last_name: Wortmann
- first_name: Klaus
  full_name: Viertel, Klaus
  id: '215306'
  last_name: Viertel
  orcid: 0000-0001-8851-8434
- first_name: Michael
  full_name: Westphal, Michael
  last_name: Westphal
- first_name: Dominik
  full_name: Graulich, Dominik
  last_name: Graulich
- first_name: Yang
  full_name: Yang, Yang
  last_name: Yang
- first_name: Maik
  full_name: Gärner, Maik
  last_name: Gärner
- first_name: Jan
  full_name: Schmalhorst, Jan
  last_name: Schmalhorst
- first_name: Natalie
  full_name: Frese, Natalie
  last_name: Frese
- first_name: Timo
  full_name: Kuschel, Timo
  last_name: Kuschel
citation:
  alphadin: '<span style="font-variant:small-caps;"><span style="font-variant:small-caps;">Wortmann,
    Martin</span> ; <span style="font-variant:small-caps;">Viertel, Klaus</span> ;
    <span style="font-variant:small-caps;">Westphal, Michael</span> ; <span style="font-variant:small-caps;">Graulich,
    Dominik</span> ; <span style="font-variant:small-caps;">Yang, Yang</span> ; <span
    style="font-variant:small-caps;">Gärner, Maik</span> ; <span style="font-variant:small-caps;">Schmalhorst,
    Jan</span> ; <span style="font-variant:small-caps;">Frese, Natalie</span> ; u. a.</span>:
    Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle
    X‐Ray Photoelectron Spectra. In: <i>Small Methods</i> Bd. 8, Wiley (2024), Nr. 3'
  ama: Wortmann M, Viertel K, Westphal M, et al. Sub‐Nanometer Depth Profiling of
    Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.
    <i>Small Methods</i>. 2024;8(3). doi:<a href="https://doi.org/10.1002/smtd.202300944">10.1002/smtd.202300944</a>
  apa: Wortmann, M., Viertel, K., Westphal, M., Graulich, D., Yang, Y., Gärner, M.,
    … Kuschel, T. (2024). Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers
    Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. <i>Small Methods</i>, <i>8</i>(3).
    <a href="https://doi.org/10.1002/smtd.202300944">https://doi.org/10.1002/smtd.202300944</a>
  bibtex: '@article{Wortmann_Viertel_Westphal_Graulich_Yang_Gärner_Schmalhorst_Frese_Kuschel_2024,
    title={Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single
    Fixed‐Angle X‐Ray Photoelectron Spectra}, volume={8}, DOI={<a href="https://doi.org/10.1002/smtd.202300944">10.1002/smtd.202300944</a>},
    number={3}, journal={Small Methods}, publisher={Wiley}, author={Wortmann, Martin
    and Viertel, Klaus and Westphal, Michael and Graulich, Dominik and Yang, Yang
    and Gärner, Maik and Schmalhorst, Jan and Frese, Natalie and Kuschel, Timo}, year={2024}
    }'
  chicago: Wortmann, Martin, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang
    Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese, and Timo Kuschel. “Sub‐Nanometer
    Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron
    Spectra.” <i>Small Methods</i> 8, no. 3 (2024). <a href="https://doi.org/10.1002/smtd.202300944">https://doi.org/10.1002/smtd.202300944</a>.
  ieee: M. Wortmann <i>et al.</i>, “Sub‐Nanometer Depth Profiling of Native Metal
    Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra,” <i>Small
    Methods</i>, vol. 8, no. 3, 2024.
  mla: Wortmann, Martin, et al. “Sub‐Nanometer Depth Profiling of Native Metal Oxide
    Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” <i>Small Methods</i>,
    vol. 8, no. 3, Wiley, 2024, doi:<a href="https://doi.org/10.1002/smtd.202300944">10.1002/smtd.202300944</a>.
  short: M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J.
    Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).
date_created: 2024-05-08T13:37:49Z
date_updated: 2026-03-17T15:29:02Z
doi: 10.1002/smtd.202300944
intvolume: '         8'
issue: '3'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
publication: Small Methods
publication_identifier:
  eissn:
  - 2366-9608
  issn:
  - 2366-9608
publication_status: published
publisher: Wiley
status: public
title: Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle
  X‐Ray Photoelectron Spectra
type: journal_article
user_id: '220548'
volume: 8
year: '2024'
...