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Virtual Characterization Lab (VCL), a unified, open-source toolkit designed to bridge this gap. The VCL streamlines pre- and post-processing workflows—primarily designed for, but not limited to, molecular dynamics (MD) simulations. It enables researchers to analyze crystallography and generate essential characterization data, including X-ray Diffraction (XRD), Selected Area Electron Diffraction (SAED), Vibrational Density of States (VDOS), and Infrared (IR) spectra, all within a single, intuitive graphical user interface (GUI). By integrating every step from initial structure preparation to final data visualization, the VCL accelerates materials discovery by making virtual characterization more efficient, accessible, and directly comparable to experimental results.","lang":"eng"}],"citation":{"alphadin":"<span style=\"font-variant:small-caps;\">Jamebozorgi, Vahid</span> ; <span style=\"font-variant:small-caps;\">Quisbrok, Robin</span> ; <span style=\"font-variant:small-caps;\">Schröder, Christian</span>: <i>Virtual Characterization Lab Toolkit</i> : Vahid Jamebozorgi, self-published, 2026","bibtex":"@book{Jamebozorgi_Quisbrok_Schröder_2026, title={Virtual Characterization Lab Toolkit}, publisher={Vahid Jamebozorgi, self-published}, author={Jamebozorgi, Vahid and Quisbrok, Robin and Schröder, Christian}, year={2026} }","short":"V. Jamebozorgi, R. Quisbrok, C. Schröder, Virtual Characterization Lab Toolkit, Vahid Jamebozorgi, self-published, 2026.","mla":"Jamebozorgi, Vahid, et al. <i>Virtual Characterization Lab Toolkit</i>. Vahid Jamebozorgi, self-published, 2026.","ama":"Jamebozorgi V, Quisbrok R, Schröder C. <i>Virtual Characterization Lab Toolkit</i>. Vahid Jamebozorgi, self-published; 2026.","chicago":"Jamebozorgi, Vahid, Robin Quisbrok, and Christian Schröder. <i>Virtual Characterization Lab Toolkit</i>. Vahid Jamebozorgi, self-published, 2026.","ieee":"V. Jamebozorgi, R. Quisbrok, and C. Schröder, <i>Virtual Characterization Lab Toolkit</i>. Vahid Jamebozorgi, self-published, 2026.","apa":"Jamebozorgi, V., Quisbrok, R., &#38; Schröder, C. (2026). <i>Virtual Characterization Lab Toolkit</i>. Vahid Jamebozorgi, self-published."},"research_group":[{"_id":"af778127-b366-11ed-bde2-daed2b8eafee","name":"Bielefelder Institut für Angewandte Materialforschung (BIfAM)"}],"type":"research_data","user_id":"242086","date_created":"2026-08-24T16:29:50Z","department":[{"_id":"103"}],"date_updated":"2026-08-28T13:46:22Z","author":[{"first_name":"Vahid","id":"242086","orcid":"0009-0005-5700-3549","full_name":"Jamebozorgi, Vahid","last_name":"Jamebozorgi"},{"last_name":"Quisbrok","full_name":"Quisbrok, Robin","first_name":"Robin"},{"id":"35809","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-6391-6548/work/225113776","first_name":"Christian","last_name":"Schröder","orcid":"0000-0002-6391-6548","full_name":"Schröder, Christian"}]},{"language":[{"iso":"ger"}],"status":"public","keyword":["EMV","ISO 11452-9","DIN EN 61000-4-39","TEM-Horn","Flat Antenna"],"publication_status":"published","_id":"2141","year":"2022","publisher":"Apprimus","title":"Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39","project":[{"name":"Institute for Building Intelligence","_id":"A827C0AA-C7DA-11E9-B0AE-1F4CB252D58D"}],"conference":{"name":"EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit","location":"Köln","start_date":"2022-07-12","end_date":"2022-07-14"},"doi":"10.15488/12573","editor":[{"last_name":"Garbe","full_name":"Garbe, Heyno","first_name":"Heyno"}],"citation":{"ieee":"S. Battermann and D. Schwarzbeck, “Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39,” in <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>, Köln, 2022.","apa":"Battermann, S., &#38; Schwarzbeck, D. (2022). Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39. In H. Garbe (Ed.), <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>. Aachen: Apprimus. <a href=\"https://doi.org/10.15488/12573\">https://doi.org/10.15488/12573</a>","mla":"Battermann, Sven, and Dieter Schwarzbeck. “Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39.” <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>, edited by Heyno Garbe, Apprimus, 2022, doi:<a href=\"https://doi.org/10.15488/12573\">10.15488/12573</a>.","short":"S. Battermann, D. Schwarzbeck, in: H. Garbe (Ed.), Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, Apprimus, Aachen, 2022.","alphadin":"<span style=\"font-variant:small-caps;\">Battermann, Sven</span> ; <span style=\"font-variant:small-caps;\">Schwarzbeck, Dieter</span>: Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39. In: <span style=\"font-variant:small-caps;\">Garbe, H.</span> (Hrsg.): <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>. Aachen : Apprimus, 2022","bibtex":"@inproceedings{Battermann_Schwarzbeck_2022, place={Aachen}, title={Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39}, DOI={<a href=\"https://doi.org/10.15488/12573\">10.15488/12573</a>}, booktitle={Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit}, publisher={Apprimus}, author={Battermann, Sven and Schwarzbeck, Dieter}, editor={Garbe, HeynoEditor}, year={2022} }","chicago":"Battermann, Sven, and Dieter Schwarzbeck. “Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39.” In <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>, edited by Heyno Garbe. Aachen: Apprimus, 2022. <a href=\"https://doi.org/10.15488/12573\">https://doi.org/10.15488/12573</a>.","ama":"Battermann S, Schwarzbeck D. Störfestigkeit im Nahbereich – Vergleich der mit Antennen erzeugten Felder der ISO 11452-9 und DIN EN 61000-4-39. In: Garbe H, ed. <i>Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit</i>. Aachen: Apprimus; 2022. doi:<a href=\"https://doi.org/10.15488/12573\">10.15488/12573</a>"},"place":"Aachen","oa":"1","department":[{"_id":"102"}],"author":[{"last_name":"Battermann","orcid":"0000-0001-7203-7396","full_name":"Battermann, Sven","id":"219522","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7203-7396/work/215191089","first_name":"Sven"},{"first_name":"Dieter","full_name":"Schwarzbeck, Dieter","last_name":"Schwarzbeck"}],"date_updated":"2026-08-27T21:17:00Z","quality_controlled":"1","main_file_link":[{"url":"https://doi.org/10.15488/12573","open_access":"1"}],"type":"conference","publication":"Proceedings EMV Kongress 2022: Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit","date_created":"2022-09-24T15:39:01Z","user_id":"219522"}]