@inproceedings{1966,
  author       = {Kirsch, André and Günter, Andrei and König, Matthias},
  booktitle    = {12th International Conference on Pattern Recognition Systems},
  keywords     = {alignability prediction, point cloud registration, overlap metric, descriptors},
  location     = {Saint-Étienne},
  publisher    = {IEEE},
  title        = {{Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features}},
  doi          = {10.1109/ICPRS54038.2022.9854071},
  year         = {2022},
}