[{"quality_controlled":"1","related_material":{"record":[{"relation":"popular_science","status":"public","id":"5270"}]},"date_created":"2022-05-24T13:55:09Z","title":"Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features","project":[{"_id":"A838A474-C7DA-11E9-B0AE-1F4CB252D58D","name":"DORIOT: Dynamische Laufzeitumgebung für organisch (dis-)aggregierende IoT-Prozesse"}],"type":"conference","main_file_link":[{"url":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9854071"}],"user_id":"216459","keyword":["alignability prediction","point cloud registration","overlap metric","descriptors"],"publication_status":"published","publication":"12th International Conference on Pattern Recognition Systems","author":[{"full_name":"Kirsch, André","last_name":"Kirsch","id":"229807","first_name":"André"},{"first_name":"Andrei","id":"225747","orcid":"0000-0002-7836-9700","full_name":"Günter, Andrei","last_name":"Günter"},{"first_name":"Matthias","id":"213498","last_name":"König","orcid":"0000-0002-4915-0750","full_name":"König, Matthias"}],"citation":{"bibtex":"@inproceedings{Kirsch_Günter_König_2022, title={Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features}, DOI={<a href=\"https://doi.org/10.1109/ICPRS54038.2022.9854071\">10.1109/ICPRS54038.2022.9854071</a>}, booktitle={12th International Conference on Pattern Recognition Systems}, publisher={IEEE}, author={Kirsch, André and Günter, Andrei and König, Matthias}, year={2022} }","apa":"Kirsch, A., Günter, A., &#38; König, M. (2022). Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features. In <i>12th International Conference on Pattern Recognition Systems</i>. Saint-Étienne: IEEE. <a href=\"https://doi.org/10.1109/ICPRS54038.2022.9854071\">https://doi.org/10.1109/ICPRS54038.2022.9854071</a>","alphadin":"<span style=\"font-variant:small-caps;\">Kirsch, André</span> ; <span style=\"font-variant:small-caps;\">Günter, Andrei</span> ; <span style=\"font-variant:small-caps;\">König, Matthias</span>: Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features. In: <i>12th International Conference on Pattern Recognition Systems</i> : IEEE, 2022","ieee":"A. Kirsch, A. Günter, and M. König, “Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features,” in <i>12th International Conference on Pattern Recognition Systems</i>, Saint-Étienne, 2022.","ama":"Kirsch A, Günter A, König M. Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features. In: <i>12th International Conference on Pattern Recognition Systems</i>. IEEE; 2022. doi:<a href=\"https://doi.org/10.1109/ICPRS54038.2022.9854071\">10.1109/ICPRS54038.2022.9854071</a>","mla":"Kirsch, André, et al. “Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features.” <i>12th International Conference on Pattern Recognition Systems</i>, IEEE, 2022, doi:<a href=\"https://doi.org/10.1109/ICPRS54038.2022.9854071\">10.1109/ICPRS54038.2022.9854071</a>.","chicago":"Kirsch, André, Andrei Günter, and Matthias König. “Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using Features.” In <i>12th International Conference on Pattern Recognition Systems</i>. IEEE, 2022. <a href=\"https://doi.org/10.1109/ICPRS54038.2022.9854071\">https://doi.org/10.1109/ICPRS54038.2022.9854071</a>.","short":"A. Kirsch, A. Günter, M. König, in: 12th International Conference on Pattern Recognition Systems, IEEE, 2022."},"status":"public","conference":{"location":"Saint-Étienne","name":"12th International Conference on Pattern Recognition Systems","start_date":"2022-06-07","end_date":"2022-06-10"},"doi":"10.1109/ICPRS54038.2022.9854071","date_updated":"2026-03-17T15:29:16Z","publisher":"IEEE","_id":"1966","year":"2022","language":[{"iso":"eng"}]}]