---
_id: '1966'
author:
- first_name: André
  full_name: Kirsch, André
  id: '229807'
  last_name: Kirsch
- first_name: Andrei
  full_name: Günter, Andrei
  id: '225747'
  last_name: Günter
  orcid: 0000-0002-7836-9700
- first_name: Matthias
  full_name: König, Matthias
  id: '213498'
  last_name: König
  orcid: 0000-0002-4915-0750
citation:
  alphadin: '<span style="font-variant:small-caps;">Kirsch, André</span> ; <span style="font-variant:small-caps;">Günter,
    Andrei</span> ; <span style="font-variant:small-caps;">König, Matthias</span>:
    Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using
    Features. In: <i>12th International Conference on Pattern Recognition Systems</i> :
    IEEE, 2022'
  ama: 'Kirsch A, Günter A, König M. Predicting Alignability of Point Cloud Pairs
    for Point Cloud Registration Using Features. In: <i>12th International Conference
    on Pattern Recognition Systems</i>. IEEE; 2022. doi:<a href="https://doi.org/10.1109/ICPRS54038.2022.9854071">10.1109/ICPRS54038.2022.9854071</a>'
  apa: 'Kirsch, A., Günter, A., &#38; König, M. (2022). Predicting Alignability of
    Point Cloud Pairs for Point Cloud Registration Using Features. In <i>12th International
    Conference on Pattern Recognition Systems</i>. Saint-Étienne: IEEE. <a href="https://doi.org/10.1109/ICPRS54038.2022.9854071">https://doi.org/10.1109/ICPRS54038.2022.9854071</a>'
  bibtex: '@inproceedings{Kirsch_Günter_König_2022, title={Predicting Alignability
    of Point Cloud Pairs for Point Cloud Registration Using Features}, DOI={<a href="https://doi.org/10.1109/ICPRS54038.2022.9854071">10.1109/ICPRS54038.2022.9854071</a>},
    booktitle={12th International Conference on Pattern Recognition Systems}, publisher={IEEE},
    author={Kirsch, André and Günter, Andrei and König, Matthias}, year={2022} }'
  chicago: Kirsch, André, Andrei Günter, and Matthias König. “Predicting Alignability
    of Point Cloud Pairs for Point Cloud Registration Using Features.” In <i>12th
    International Conference on Pattern Recognition Systems</i>. IEEE, 2022. <a href="https://doi.org/10.1109/ICPRS54038.2022.9854071">https://doi.org/10.1109/ICPRS54038.2022.9854071</a>.
  ieee: A. Kirsch, A. Günter, and M. König, “Predicting Alignability of Point Cloud
    Pairs for Point Cloud Registration Using Features,” in <i>12th International Conference
    on Pattern Recognition Systems</i>, Saint-Étienne, 2022.
  mla: Kirsch, André, et al. “Predicting Alignability of Point Cloud Pairs for Point
    Cloud Registration Using Features.” <i>12th International Conference on Pattern
    Recognition Systems</i>, IEEE, 2022, doi:<a href="https://doi.org/10.1109/ICPRS54038.2022.9854071">10.1109/ICPRS54038.2022.9854071</a>.
  short: 'A. Kirsch, A. Günter, M. König, in: 12th International Conference on Pattern
    Recognition Systems, IEEE, 2022.'
conference:
  end_date: 2022-06-10
  location: Saint-Étienne
  name: 12th International Conference on Pattern Recognition Systems
  start_date: 2022-06-07
date_created: 2022-05-24T13:55:09Z
date_updated: 2026-03-17T15:29:16Z
doi: 10.1109/ICPRS54038.2022.9854071
keyword:
- alignability prediction
- point cloud registration
- overlap metric
- descriptors
language:
- iso: eng
main_file_link:
- url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9854071
project:
- _id: A838A474-C7DA-11E9-B0AE-1F4CB252D58D
  name: 'DORIOT: Dynamische Laufzeitumgebung für organisch (dis-)aggregierende IoT-Prozesse'
publication: 12th International Conference on Pattern Recognition Systems
publication_status: published
publisher: IEEE
quality_controlled: '1'
related_material:
  record:
  - id: '5270'
    relation: popular_science
    status: public
status: public
title: Predicting Alignability of Point Cloud Pairs for Point Cloud Registration Using
  Features
type: conference
user_id: '216459'
year: '2022'
...