@article{3492,
  author       = {Feng, Li and Zhang, Jingwei and Kiong, Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.},
  issn         = {2156-3403},
  journal      = {IEEE Journal of Photovoltaics},
  number       = {4},
  pages        = {558--570},
  publisher    = {Institute of Electrical and Electronics Engineers (IEEE)},
  title        = {{Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves}},
  doi          = {10.1109/JPHOTOV.2023.3275251},
  volume       = {13},
  year         = {2023},
}

@article{2916,
  author       = {Feng, Li and Amin, Nowshad and Zhang, Jingwei and Ding, Kun and Hamelmann, Frank},
  issn         = {2076-3417},
  journal      = {Applied Sciences},
  number       = {3},
  publisher    = {MDPI AG},
  title        = {{Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions}},
  doi          = {10.3390/app13031448},
  volume       = {13},
  year         = {2023},
}

@article{2861,
  author       = {Zhang, Jingwei and Yang, Zenan and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xihui and Liu, Yongjie and Chen, Ling},
  issn         = {1996-1073},
  journal      = {Energies},
  number       = {18},
  publisher    = {MDPI AG},
  title        = {{Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics}},
  doi          = {10.3390/en15186567},
  volume       = {15},
  year         = {2022},
}

@article{2917,
  author       = {Feng, Li and Amin, N. and Zhang, J. and Ding, K. and Hamelmann, Frank},
  journal      = {EU PVSEC Proceedings},
  publisher    = {WIP},
  title        = {{Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation}},
  doi          = {10.4229/EUPVSEC20212021-4AV.2.18},
  year         = {2021},
}

@inproceedings{2918,
  author       = {Zhang, Jingwei and Feng, Li and Kun, Ding and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling},
  booktitle    = {2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)},
  location     = {Chengdu, China},
  pages        = {783--787},
  publisher    = {IEEE},
  title        = {{Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters}},
  doi          = {10.1109/ICIEA51954.2021.9516437},
  year         = {2021},
}

@article{3506,
  author       = {Aleksandrova, Mariya and Ivanova, Tatyana and Koch, Sascha and Hamelmann, Frank and Karashanova, Daniela and Gesheva, Kostadinka},
  issn         = {0976-397X},
  journal      = {Advanced Materials Letters},
  number       = {10},
  pages        = {1--7},
  publisher    = {International Association of Advanced Materials},
  title        = {{Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications}},
  doi          = {10.5185/amlett.2020.101567},
  volume       = {11},
  year         = {2020},
}

@inproceedings{3507,
  author       = {Feng, Li and Hamelmann, Frank and Zhang, J. and Ding, K. and Hempelmann, S. and Diehl, M. and Pfeil, T. and Brandt, S. and Friedrich, W. and Amin, N.},
  location     = {Lisbon, Portugal},
  publisher    = {WIP},
  title        = {{Performance Analysis of Polycrystalline Module Based on Faults Causes}},
  doi          = {10.4229/EUPVSEC20202020-4AV.2.50},
  year         = {2020},
}

@inproceedings{3508,
  author       = {Zhang, Jingwei and Liu, Yongjie and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xiang},
  booktitle    = {47th IEEE Photovoltaic Specialists Conference (PVSC)},
  location     = {Calgary, AB, Canada},
  pages        = {2509--2512},
  publisher    = {IEEE},
  title        = {{Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions}},
  doi          = {10.1109/PVSC45281.2020.9300720},
  year         = {2020},
}

@inproceedings{3509,
  author       = {Ding, Kun and Chen, Xiang and Zhang, Jingwei and Feng, Li and Hamelmann, Frank and Weng, Shuai},
  booktitle    = {2020 47th IEEE Photovoltaic Specialists Conference (PVSC)},
  location     = {Calgary, AB, Canada},
  pages        = {2532--2537},
  publisher    = {IEEE},
  title        = {{Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM}},
  doi          = {10.1109/PVSC45281.2020.9300587},
  year         = {2020},
}

@inproceedings{3510,
  author       = {Feng, Li and Hamelmann, Frank and Zhang, Jingwei and Ding, Kun and Diehl, Matthias and Pfeil, Thomas and Brandt, Steffen and Friedrich, Werner and Amin, Nowshad},
  booktitle    = {2020 47th IEEE Photovoltaic Specialists Conference (PVSC)},
  location     = {Calgary, AB, Canada},
  pages        = {2496--2501},
  publisher    = {IEEE},
  title        = {{A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors}},
  doi          = {10.1109/PVSC45281.2020.9300796},
  year         = {2020},
}

@article{3511,
  author       = {Aleksandrova, Mariya and Ivanova, Tatyana and Hamelmann, Frank and Strijkova, Velichka and Gesheva, Kostadinka},
  issn         = {2079-6412},
  journal      = {Coatings},
  number       = {7},
  publisher    = {MDPI AG},
  title        = {{Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications}},
  doi          = {10.3390/coatings10070650},
  volume       = {10},
  year         = {2020},
}

@inbook{3562,
  author       = {Behrens, Grit and Weicht, Johannes and Schlender, Klaus and Fehring, Florian and Dreimann, Rouven and Meese, Michael and Hamelmann, Frank and Thiel, Christoph and Försterling, Thorsten and Wübbenhorst, Marc},
  booktitle    = {From Science to Society},
  editor       = {Otjacques, Benoît and Hitzelberger, Patrik and Naumann, Stefan and Wohlgemuth, Volker},
  isbn         = {978-3-319-65686-1},
  issn         = {2196-8713},
  pages        = {181--189},
  publisher    = {Springer International Publishing},
  title        = {{Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings}},
  doi          = {10.1007/978-3-319-65687-8_16},
  year         = {2018},
}

@article{3512,
  author       = {Hamelmann, Frank},
  issn         = {1742-6596},
  journal      = {Journal of Physics: Conference Series},
  publisher    = {IOP Publishing},
  title        = {{Thin film zinc oxide deposited by CVD and PVD}},
  doi          = {10.1088/1742-6596/764/1/012001},
  volume       = {764},
  year         = {2016},
}

@article{3515,
  author       = {Weicht, J A and Hamelmann, Frank and Behrens, Grit},
  issn         = {1742-6596},
  journal      = {Journal of Physics: Conference Series},
  publisher    = {IOP Publishing},
  title        = {{Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit}},
  doi          = {10.1088/1742-6596/682/1/012017},
  volume       = {682},
  year         = {2016},
}

@article{3516,
  author       = {Hamelmann, Frank and Weicht, J A and Behrens, Grit},
  issn         = {1742-6596},
  journal      = {Journal of Physics: Conference Series},
  publisher    = {IOP Publishing},
  title        = {{Light-Induced Degradation of Thin Film Silicon Solar Cells}},
  doi          = {10.1088/1742-6596/682/1/012002},
  volume       = {682},
  year         = {2016},
}

@article{171,
  author       = {Weicht, Johannes and Rasch, Robin and Behrens, Grit and Hamelmann, Frank},
  journal      = {Electronic Materials Letters},
  number       = {4},
  pages        = {468--471},
  title        = {{Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules}},
  doi          = {10.1007/s13391-016-4008-x},
  volume       = {12},
  year         = {2016},
}

@inproceedings{175,
  author       = {Weicht, Johannes and Hamelmann, Frank and Behrens, Grit},
  issn         = {2196-100X},
  location     = {München},
  title        = {{Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells}},
  doi          = {10.4229/EUPVSEC20162016-3DV.1.4},
  year         = {2016},
}

@article{3561,
  author       = {Corpus-Mendoza, Asiel N. and De Souza, M. M. and Hamelmann, Frank},
  issn         = {1941-7012},
  journal      = {Journal of Renewable and Sustainable Energy},
  number       = {6},
  publisher    = {AIP Publishing},
  title        = {{Separation of bulk and contact interface degradation in thin film silicon solar cells}},
  doi          = {10.1063/1.4936592},
  volume       = {7},
  year         = {2015},
}

@inproceedings{3517,
  author       = {Weicht, Johannes A. and Hamelmann, Frank and Behrens, Grit},
  booktitle    = {2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)},
  location     = {New Orleans, LA},
  pages        = {1--4},
  publisher    = {IEEE},
  title        = {{Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells}},
  doi          = {10.1109/PVSC.2015.7356298},
  year         = {2015},
}

@inproceedings{3518,
  author       = {Weicht, J.A. and Rasch, Robin and Behrens, Grit and Hamelmann, Frank},
  publisher    = {WIP},
  title        = {{Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells}},
  doi          = {10.4229/EUPVSEC20152015-3CV.1.12},
  year         = {2015},
}