[{"type":"journal_article","publication_identifier":{"eissn":["2156-3403"],"issn":["2156-3381"]},"user_id":"245590","alternative_id":["3490","3493"],"publication_status":"published","issue":"4","publication":"IEEE Journal of Photovoltaics","title":"Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves","date_created":"2023-08-28T09:35:35Z","volume":13,"year":"2023","_id":"3492","language":[{"iso":"eng"}],"citation":{"chicago":"Feng, Li, Jingwei Zhang, Tiong Sieh Kiong, Kun Ding, Nowshad Amin, and Frank U. Hamelmann. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i> 13, no. 4 (2023): 558–70. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>.","short":"L. Feng, J. Zhang, T.S. Kiong, K. Ding, N. Amin, F.U. Hamelmann, IEEE Journal of Photovoltaics 13 (2023) 558–570.","ama":"Feng L, Zhang J, Kiong TS, Ding K, Amin N, Hamelmann FU. Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>. 2023;13(4):558-570. doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>","mla":"Feng, Li, et al. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 558–70, doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>.","ieee":"L. Feng, J. Zhang, T. S. Kiong, K. Ding, N. Amin, and F. U. Hamelmann, “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves,” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, pp. 558–570, 2023.","apa":"Feng, L., Zhang, J., Kiong, T. S., Ding, K., Amin, N., &#38; Hamelmann, F. U. (2023). Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>, <i>13</i>(4), 558–570. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>","bibtex":"@article{Feng_Zhang_Kiong_Ding_Amin_Hamelmann_2023, title={Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves}, volume={13}, DOI={<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>}, number={4}, journal={IEEE Journal of Photovoltaics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Feng, Li and Zhang, Jingwei and Kiong, Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.}, year={2023}, pages={558–570} }","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Kiong, Tiong Sieh</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Amin, Nowshad</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank U.</span>: Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. In: <i>IEEE Journal of Photovoltaics</i> Bd. 13, Institute of Electrical and Electronics Engineers (IEEE) (2023), Nr. 4, S. 558–570"},"author":[{"first_name":"Li","id":"237630","full_name":"Feng, Li","last_name":"Feng"},{"first_name":"Jingwei","last_name":"Zhang","full_name":"Zhang, Jingwei"},{"full_name":"Kiong, Tiong Sieh","last_name":"Kiong","first_name":"Tiong Sieh"},{"full_name":"Ding, Kun","last_name":"Ding","first_name":"Kun"},{"full_name":"Amin, Nowshad","last_name":"Amin","first_name":"Nowshad"},{"full_name":"Hamelmann, Frank U.","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank U."}],"status":"public","intvolume":"        13","doi":"10.1109/JPHOTOV.2023.3275251","page":"558-570","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","date_updated":"2026-03-17T15:28:45Z"},{"main_file_link":[{"open_access":"1","url":"https://doi.org/10.3390/app13031448"}],"alternative_id":["3491"],"user_id":"245590","oa":"1","tmp":{"short":"CC BY (4.0)","legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)","image":"/images/cc_by.png"},"type":"journal_article","publication_identifier":{"eissn":["2076-3417"]},"issue":"3","publication_status":"published","publication":"Applied Sciences","quality_controlled":"1","volume":13,"date_created":"2023-05-12T15:17:05Z","title":"Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions","language":[{"iso":"eng"}],"_id":"2916","year":"2023","article_number":"1448","status":"public","citation":{"chicago":"Feng, Li, Nowshad Amin, Jingwei Zhang, Kun Ding, and Frank Hamelmann. “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions.” <i>Applied Sciences</i> 13, no. 3 (2023). <a href=\"https://doi.org/10.3390/app13031448\">https://doi.org/10.3390/app13031448</a>.","short":"L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, Applied Sciences 13 (2023).","ama":"Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. <i>Applied Sciences</i>. 2023;13(3). doi:<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>","mla":"Feng, Li, et al. “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions.” <i>Applied Sciences</i>, vol. 13, no. 3, 1448, MDPI AG, 2023, doi:<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>.","ieee":"L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions,” <i>Applied Sciences</i>, vol. 13, no. 3, 2023.","bibtex":"@article{Feng_Amin_Zhang_Ding_Hamelmann_2023, title={Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions}, volume={13}, DOI={<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>}, number={31448}, journal={Applied Sciences}, publisher={MDPI AG}, author={Feng, Li and Amin, Nowshad and Zhang, Jingwei and Ding, Kun and Hamelmann, Frank}, year={2023} }","apa":"Feng, L., Amin, N., Zhang, J., Ding, K., &#38; Hamelmann, F. (2023). Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. <i>Applied Sciences</i>, <i>13</i>(3). <a href=\"https://doi.org/10.3390/app13031448\">https://doi.org/10.3390/app13031448</a>","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Amin, Nowshad</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. In: <i>Applied Sciences</i> Bd. 13, MDPI AG (2023), Nr. 3"},"author":[{"first_name":"Li","id":"237630","full_name":"Feng, Li","last_name":"Feng"},{"first_name":"Nowshad","full_name":"Amin, Nowshad","last_name":"Amin"},{"full_name":"Zhang, Jingwei","last_name":"Zhang","first_name":"Jingwei"},{"last_name":"Ding","full_name":"Ding, Kun","first_name":"Kun"},{"id":"208487","first_name":"Frank","last_name":"Hamelmann","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874"}],"date_updated":"2026-03-17T15:28:38Z","publisher":"MDPI AG","doi":"10.3390/app13031448","intvolume":"        13"},{"status":"public","citation":{"ieee":"J. Zhang <i>et al.</i>, “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics,” <i>Energies</i>, vol. 15, no. 18, 2022.","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Yang, Zenan</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xihui</span> ; <span style=\"font-variant:small-caps;\">Liu, Yongjie</span> ; <span style=\"font-variant:small-caps;\">Chen, Ling</span>: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. In: <i>Energies</i> Bd. 15, MDPI AG (2022), Nr. 18","bibtex":"@article{Zhang_Yang_Ding_Feng_Hamelmann_Chen_Liu_Chen_2022, title={Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics}, volume={15}, DOI={<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>}, number={186567}, journal={Energies}, publisher={MDPI AG}, author={Zhang, Jingwei and Yang, Zenan and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xihui and Liu, Yongjie and Chen, Ling}, year={2022} }","apa":"Zhang, J., Yang, Z., Ding, K., Feng, L., Hamelmann, F., Chen, X., … Chen, L. (2022). Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. <i>Energies</i>, <i>15</i>(18). <a href=\"https://doi.org/10.3390/en15186567\">https://doi.org/10.3390/en15186567</a>","chicago":"Zhang, Jingwei, Zenan Yang, Kun Ding, Li Feng, Frank Hamelmann, Xihui Chen, Yongjie Liu, and Ling Chen. “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics.” <i>Energies</i> 15, no. 18 (2022). <a href=\"https://doi.org/10.3390/en15186567\">https://doi.org/10.3390/en15186567</a>.","short":"J. Zhang, Z. Yang, K. Ding, L. Feng, F. Hamelmann, X. Chen, Y. Liu, L. Chen, Energies 15 (2022).","mla":"Zhang, Jingwei, et al. “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics.” <i>Energies</i>, vol. 15, no. 18, 6567, MDPI AG, 2022, doi:<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>.","ama":"Zhang J, Yang Z, Ding K, et al. Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. <i>Energies</i>. 2022;15(18). doi:<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>"},"author":[{"first_name":"Jingwei","last_name":"Zhang","full_name":"Zhang, Jingwei"},{"full_name":"Yang, Zenan","last_name":"Yang","first_name":"Zenan"},{"full_name":"Ding, Kun","last_name":"Ding","first_name":"Kun"},{"id":"237630","first_name":"Li","full_name":"Feng, Li","last_name":"Feng"},{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"},{"last_name":"Chen","full_name":"Chen, Xihui","first_name":"Xihui"},{"first_name":"Yongjie","full_name":"Liu, Yongjie","last_name":"Liu"},{"last_name":"Chen","full_name":"Chen, Ling","first_name":"Ling"}],"publisher":"MDPI AG","date_updated":"2026-03-17T15:28:38Z","intvolume":"        15","doi":"10.3390/en15186567","language":[{"iso":"eng"}],"year":"2022","_id":"2861","article_number":"6567","quality_controlled":"1","volume":15,"title":"Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics","date_created":"2023-05-09T09:23:40Z","user_id":"245590","main_file_link":[{"open_access":"1","url":"https://www.mdpi.com/1996-1073/15/18/6567"}],"type":"journal_article","publication_identifier":{"eissn":["1996-1073"]},"oa":"1","tmp":{"short":"CC BY (4.0)","legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)","image":"/images/cc_by.png"},"publication":"Energies","issue":"18","publication_status":"published"},{"publication_status":"published","publication":"EU PVSEC Proceedings","type":"journal_article","user_id":"245590","main_file_link":[{"url":"https://www.eupvsec-proceedings.com/proceedings?paper=50327"}],"title":"Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation","date_created":"2023-05-12T15:23:46Z","year":"2021","_id":"2917","language":[{"iso":"eng"}],"doi":"10.4229/EUPVSEC20212021-4AV.2.18","publisher":"WIP","date_updated":"2026-03-17T15:28:38Z","citation":{"chicago":"Feng, Li, N. Amin, J. Zhang, K. Ding, and Frank Hamelmann. “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.” <i>EU PVSEC Proceedings</i>, 2021. <a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18</a>.","short":"L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, EU PVSEC Proceedings (2021).","ama":"Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. <i>EU PVSEC Proceedings</i>. 2021. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>","mla":"Feng, Li, et al. “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.” <i>EU PVSEC Proceedings</i>, WIP, 2021, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>.","ieee":"L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation,” <i>EU PVSEC Proceedings</i>, 2021.","apa":"Feng, L., Amin, N., Zhang, J., Ding, K., &#38; Hamelmann, F. (2021). Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. <i>EU PVSEC Proceedings</i>. <a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18</a>","bibtex":"@article{Feng_Amin_Zhang_Ding_Hamelmann_2021, title={Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>}, journal={EU PVSEC Proceedings}, publisher={WIP}, author={Feng, Li and Amin, N. and Zhang, J. and Ding, K. and Hamelmann, Frank}, year={2021} }","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Amin, N.</span> ; <span style=\"font-variant:small-caps;\">Zhang, J.</span> ; <span style=\"font-variant:small-caps;\">Ding, K.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. In: <i>EU PVSEC Proceedings</i>, WIP (2021)"},"author":[{"last_name":"Feng","full_name":"Feng, Li","id":"237630","first_name":"Li"},{"full_name":"Amin, N.","last_name":"Amin","first_name":"N."},{"first_name":"J.","full_name":"Zhang, J.","last_name":"Zhang"},{"last_name":"Ding","full_name":"Ding, K.","first_name":"K."},{"last_name":"Hamelmann","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","id":"208487","first_name":"Frank"}],"status":"public"},{"user_id":"245590","type":"conference","publication_identifier":{"eisbn":["978-1-6654-2248-2"]},"publication_status":"published","publication":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)","title":"Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters","date_created":"2023-05-12T15:26:12Z","language":[{"iso":"eng"}],"year":"2021","_id":"2918","conference":{"name":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)","location":"Chengdu, China"},"status":"public","citation":{"bibtex":"@inproceedings{Zhang_Feng_Kun_Hamelmann_Chen_Chen_Chen_2021, title={Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters}, DOI={<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>}, booktitle={2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)}, publisher={IEEE}, author={Zhang, Jingwei and Feng, Li and Kun, Ding and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling}, year={2021}, pages={783–787} }","apa":"Zhang, J., Feng, L., Kun, D., Hamelmann, F., Chen, X., Chen, X., &#38; Chen, L. (2021). Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> (pp. 783–787). Chengdu, China: IEEE. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Kun, Ding</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xihui</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span> ; <span style=\"font-variant:small-caps;\">Chen, Ling</span>: Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> : IEEE, 2021, S. 783–787","ieee":"J. Zhang <i>et al.</i>, “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters,” in <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, Chengdu, China, 2021, pp. 783–787.","ama":"Zhang J, Feng L, Kun D, et al. Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>. IEEE; 2021:783-787. doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>","mla":"Zhang, Jingwei, et al. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, IEEE, 2021, pp. 783–87, doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>.","short":"J. Zhang, L. Feng, D. Kun, F. Hamelmann, X. Chen, X. Chen, L. Chen, in: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), IEEE, 2021, pp. 783–787.","chicago":"Zhang, Jingwei, Li Feng, Ding Kun, Frank Hamelmann, Xihui Chen, Xiang Chen, and Ling Chen. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, 783–87. IEEE, 2021. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>."},"author":[{"full_name":"Zhang, Jingwei","last_name":"Zhang","first_name":"Jingwei"},{"full_name":"Feng, Li","last_name":"Feng","id":"237630","first_name":"Li"},{"first_name":"Ding","full_name":"Kun, Ding","last_name":"Kun"},{"id":"208487","first_name":"Frank","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann"},{"first_name":"Xihui","full_name":"Chen, Xihui","last_name":"Chen"},{"full_name":"Chen, Xiang","last_name":"Chen","first_name":"Xiang"},{"last_name":"Chen","full_name":"Chen, Ling","first_name":"Ling"}],"page":"783-787","publisher":"IEEE","date_updated":"2026-03-17T15:28:38Z","doi":"10.1109/ICIEA51954.2021.9516437"},{"user_id":"245590","type":"journal_article","publication_identifier":{"eissn":["0976-397X"]},"issue":"10","publication":"Advanced Materials Letters","publication_status":"published","volume":11,"title":"Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications","date_created":"2023-08-31T13:34:32Z","language":[{"iso":"eng"}],"year":"2020","_id":"3506","status":"public","citation":{"ieee":"M. Aleksandrova, T. Ivanova, S. Koch, F. Hamelmann, D. Karashanova, and K. Gesheva, “Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications,” <i>Advanced Materials Letters</i>, vol. 11, no. 10, pp. 1–7, 2020.","alphadin":"<span style=\"font-variant:small-caps;\">Aleksandrova, Mariya</span> ; <span style=\"font-variant:small-caps;\">Ivanova, Tatyana</span> ; <span style=\"font-variant:small-caps;\">Koch, Sascha</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Karashanova, Daniela</span> ; <span style=\"font-variant:small-caps;\">Gesheva, Kostadinka</span>: Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications. In: <i>Advanced Materials Letters</i> Bd. 11, International Association of Advanced Materials (2020), Nr. 10, S. 1–7","bibtex":"@article{Aleksandrova_Ivanova_Koch_Hamelmann_Karashanova_Gesheva_2020, title={Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications}, volume={11}, DOI={<a href=\"https://doi.org/10.5185/amlett.2020.101567\">10.5185/amlett.2020.101567</a>}, number={10}, journal={Advanced Materials Letters}, publisher={International Association of Advanced Materials}, author={Aleksandrova, Mariya and Ivanova, Tatyana and Koch, Sascha and Hamelmann, Frank and Karashanova, Daniela and Gesheva, Kostadinka}, year={2020}, pages={1–7} }","apa":"Aleksandrova, M., Ivanova, T., Koch, S., Hamelmann, F., Karashanova, D., &#38; Gesheva, K. (2020). Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications. <i>Advanced Materials Letters</i>, <i>11</i>(10), 1–7. <a href=\"https://doi.org/10.5185/amlett.2020.101567\">https://doi.org/10.5185/amlett.2020.101567</a>","chicago":"Aleksandrova, Mariya, Tatyana Ivanova, Sascha Koch, Frank Hamelmann, Daniela Karashanova, and Kostadinka Gesheva. “Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications.” <i>Advanced Materials Letters</i> 11, no. 10 (2020): 1–7. <a href=\"https://doi.org/10.5185/amlett.2020.101567\">https://doi.org/10.5185/amlett.2020.101567</a>.","short":"M. Aleksandrova, T. Ivanova, S. Koch, F. Hamelmann, D. Karashanova, K. Gesheva, Advanced Materials Letters 11 (2020) 1–7.","mla":"Aleksandrova, Mariya, et al. “Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications.” <i>Advanced Materials Letters</i>, vol. 11, no. 10, International Association of Advanced Materials, 2020, pp. 1–7, doi:<a href=\"https://doi.org/10.5185/amlett.2020.101567\">10.5185/amlett.2020.101567</a>.","ama":"Aleksandrova M, Ivanova T, Koch S, Hamelmann F, Karashanova D, Gesheva K. Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications. <i>Advanced Materials Letters</i>. 2020;11(10):1-7. doi:<a href=\"https://doi.org/10.5185/amlett.2020.101567\">10.5185/amlett.2020.101567</a>"},"author":[{"last_name":"Aleksandrova","full_name":"Aleksandrova, Mariya","first_name":"Mariya"},{"last_name":"Ivanova","full_name":"Ivanova, Tatyana","first_name":"Tatyana"},{"full_name":"Koch, Sascha","last_name":"Koch","first_name":"Sascha"},{"last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","first_name":"Frank","id":"208487"},{"full_name":"Karashanova, Daniela","last_name":"Karashanova","first_name":"Daniela"},{"full_name":"Gesheva, Kostadinka","last_name":"Gesheva","first_name":"Kostadinka"}],"publisher":"International Association of Advanced Materials","page":"1-7","date_updated":"2026-03-17T15:28:45Z","intvolume":"        11","doi":"10.5185/amlett.2020.101567"},{"conference":{"end_date":"2020-09-11","start_date":"2020-09-07","location":"Lisbon, Portugal","name":"37th European Photovoltaic Solar Energy Conference and Exhibition"},"status":"public","author":[{"first_name":"Li","id":"237630","last_name":"Feng","full_name":"Feng, Li"},{"first_name":"Frank","id":"208487","last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank"},{"last_name":"Zhang","full_name":"Zhang, J.","first_name":"J."},{"full_name":"Ding, K.","last_name":"Ding","first_name":"K."},{"first_name":"S.","full_name":"Hempelmann, S.","last_name":"Hempelmann"},{"full_name":"Diehl, M.","last_name":"Diehl","first_name":"M."},{"first_name":"T.","full_name":"Pfeil, T.","last_name":"Pfeil"},{"full_name":"Brandt, S.","last_name":"Brandt","first_name":"S."},{"first_name":"W.","full_name":"Friedrich, W.","last_name":"Friedrich"},{"first_name":"N.","last_name":"Amin","full_name":"Amin, N."}],"citation":{"alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Zhang, J.</span> ; <span style=\"font-variant:small-caps;\">Ding, K.</span> ; <span style=\"font-variant:small-caps;\">Hempelmann, S.</span> ; <span style=\"font-variant:small-caps;\">Diehl, M.</span> ; <span style=\"font-variant:small-caps;\">Pfeil, T.</span> ; <span style=\"font-variant:small-caps;\">Brandt, S.</span> ; u. a.</span>: Performance Analysis of Polycrystalline Module Based on Faults Causes. In:  : WIP, 2020","apa":"Feng, L., Hamelmann, F., Zhang, J., Ding, K., Hempelmann, S., Diehl, M., … Amin, N. (2020). Performance Analysis of Polycrystalline Module Based on Faults Causes. Presented at the 37th European Photovoltaic Solar Energy Conference and Exhibition, Lisbon, Portugal: WIP. <a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50</a>","bibtex":"@inproceedings{Feng_Hamelmann_Zhang_Ding_Hempelmann_Diehl_Pfeil_Brandt_Friedrich_Amin_2020, title={Performance Analysis of Polycrystalline Module Based on Faults Causes}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>}, publisher={WIP}, author={Feng, Li and Hamelmann, Frank and Zhang, J. and Ding, K. and Hempelmann, S. and Diehl, M. and Pfeil, T. and Brandt, S. and Friedrich, W. and Amin, N.}, year={2020} }","ieee":"L. Feng <i>et al.</i>, “Performance Analysis of Polycrystalline Module Based on Faults Causes,” presented at the 37th European Photovoltaic Solar Energy Conference and Exhibition, Lisbon, Portugal, 2020.","mla":"Feng, Li, et al. <i>Performance Analysis of Polycrystalline Module Based on Faults Causes</i>. WIP, 2020, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>.","ama":"Feng L, Hamelmann F, Zhang J, et al. Performance Analysis of Polycrystalline Module Based on Faults Causes. In: WIP; 2020. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>","short":"L. Feng, F. Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, N. Amin, in: WIP, 2020.","chicago":"Feng, Li, Frank Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, and N. Amin. “Performance Analysis of Polycrystalline Module Based on Faults Causes.” WIP, 2020. <a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50</a>."},"publisher":"WIP","date_updated":"2026-03-17T15:28:45Z","doi":"10.4229/EUPVSEC20202020-4AV.2.50","language":[{"iso":"eng"}],"year":"2020","_id":"3507","title":"Performance Analysis of Polycrystalline Module Based on Faults Causes","jel":["C6"],"date_created":"2023-09-01T08:32:56Z","user_id":"216459","main_file_link":[{"open_access":"1","url":"https://www.researchgate.net/publication/344960005_PERFORMANCE_ANALYSIS_OF_POLYCRYSTALLINE_MODULE_BASED_ON_FAULTS_CAUSES"}],"type":"conference","oa":"1","publication_status":"published"},{"language":[{"iso":"eng"}],"_id":"3508","year":"2020","date_updated":"2026-03-17T15:28:45Z","page":"2509-2512","publisher":"IEEE","doi":"10.1109/PVSC45281.2020.9300720","status":"public","conference":{"start_date":"2020-06-15","end_date":"2020-08-21","name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)","location":"Calgary, AB, Canada"},"author":[{"last_name":"Zhang","full_name":"Zhang, Jingwei","first_name":"Jingwei"},{"full_name":"Liu, Yongjie","last_name":"Liu","first_name":"Yongjie"},{"first_name":"Kun","last_name":"Ding","full_name":"Ding, Kun"},{"last_name":"Feng","full_name":"Feng, Li","id":"237630","first_name":"Li"},{"last_name":"Hamelmann","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","id":"208487","first_name":"Frank"},{"full_name":"Chen, Xiang","last_name":"Chen","first_name":"Xiang"}],"citation":{"chicago":"Zhang, Jingwei, Yongjie Liu, Kun Ding, Li Feng, Frank Hamelmann, and Xiang Chen. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.” In <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2509–12. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">https://doi.org/10.1109/PVSC45281.2020.9300720</a>.","short":"J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, X. Chen, in: 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2509–2512.","ama":"Zhang J, Liu Y, Ding K, Feng L, Hamelmann F, Chen X. Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In: <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2509-2512. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>","mla":"Zhang, Jingwei, et al. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.” <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2509–12, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>.","ieee":"J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, and X. Chen, “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions,” in <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2509–2512.","apa":"Zhang, J., Liu, Y., Ding, K., Feng, L., Hamelmann, F., &#38; Chen, X. (2020). Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2509–2512). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">https://doi.org/10.1109/PVSC45281.2020.9300720</a>","bibtex":"@inproceedings{Zhang_Liu_Ding_Feng_Hamelmann_Chen_2020, title={Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>}, booktitle={47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Zhang, Jingwei and Liu, Yongjie and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xiang}, year={2020}, pages={2509–2512} }","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Liu, Yongjie</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span>: Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In: <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2509–2512"},"publication":"47th IEEE Photovoltaic Specialists Conference (PVSC)","publication_status":"published","user_id":"216459","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"type":"conference","date_created":"2023-09-01T08:36:48Z","title":"Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions"},{"_id":"3509","year":"2020","language":[{"iso":"eng"}],"doi":"10.1109/PVSC45281.2020.9300587","date_updated":"2026-03-17T15:28:45Z","publisher":"IEEE","page":"2532-2537","citation":{"chicago":"Ding, Kun, Xiang Chen, Jingwei Zhang, Li Feng, Frank Hamelmann, and Shuai Weng. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.” In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2532–37. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">https://doi.org/10.1109/PVSC45281.2020.9300587</a>.","short":"K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, S. Weng, in: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2532–2537.","mla":"Ding, Kun, et al. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.” <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2532–37, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>.","ama":"Ding K, Chen X, Zhang J, Feng L, Hamelmann F, Weng S. Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2532-2537. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>","ieee":"K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, and S. Weng, “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM,” in <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2532–2537.","alphadin":"<span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Weng, Shuai</span>: Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2532–2537","bibtex":"@inproceedings{Ding_Chen_Zhang_Feng_Hamelmann_Weng_2020, title={Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>}, booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Ding, Kun and Chen, Xiang and Zhang, Jingwei and Feng, Li and Hamelmann, Frank and Weng, Shuai}, year={2020}, pages={2532–2537} }","apa":"Ding, K., Chen, X., Zhang, J., Feng, L., Hamelmann, F., &#38; Weng, S. (2020). Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2532–2537). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">https://doi.org/10.1109/PVSC45281.2020.9300587</a>"},"author":[{"last_name":"Ding","full_name":"Ding, Kun","first_name":"Kun"},{"first_name":"Xiang","full_name":"Chen, Xiang","last_name":"Chen"},{"full_name":"Zhang, Jingwei","last_name":"Zhang","first_name":"Jingwei"},{"full_name":"Feng, Li","last_name":"Feng","id":"237630","first_name":"Li"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"},{"first_name":"Shuai","full_name":"Weng, Shuai","last_name":"Weng"}],"status":"public","conference":{"start_date":"2020-06-15","end_date":"2020-08-21","location":"Calgary, AB, Canada","name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)"},"publication_status":"published","publication":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","type":"conference","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"user_id":"216459","date_created":"2023-09-01T08:38:39Z","title":"Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM"},{"language":[{"iso":"eng"}],"year":"2020","_id":"3510","page":"2496-2501","publisher":"IEEE","date_updated":"2026-03-17T15:28:45Z","doi":"10.1109/PVSC45281.2020.9300796","conference":{"location":"Calgary, AB, Canada","name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)"},"status":"public","citation":{"ama":"Feng L, Hamelmann F, Zhang J, et al. A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2496-2501. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>","mla":"Feng, Li, et al. “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors.” <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2496–501, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>.","short":"L. Feng, F. Hamelmann, J. Zhang, K. Ding, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, N. Amin, in: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2496–2501.","chicago":"Feng, Li, Frank Hamelmann, Jingwei Zhang, Kun Ding, Matthias Diehl, Thomas Pfeil, Steffen Brandt, Werner Friedrich, and Nowshad Amin. “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors.” In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2496–2501. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">https://doi.org/10.1109/PVSC45281.2020.9300796</a>.","bibtex":"@inproceedings{Feng_Hamelmann_Zhang_Ding_Diehl_Pfeil_Brandt_Friedrich_Amin_2020, title={A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>}, booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Feng, Li and Hamelmann, Frank and Zhang, Jingwei and Ding, Kun and Diehl, Matthias and Pfeil, Thomas and Brandt, Steffen and Friedrich, Werner and Amin, Nowshad}, year={2020}, pages={2496–2501} }","apa":"Feng, L., Hamelmann, F., Zhang, J., Ding, K., Diehl, M., Pfeil, T., … Amin, N. (2020). A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2496–2501). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">https://doi.org/10.1109/PVSC45281.2020.9300796</a>","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Diehl, Matthias</span> ; <span style=\"font-variant:small-caps;\">Pfeil, Thomas</span> ; <span style=\"font-variant:small-caps;\">Brandt, Steffen</span> ; <span style=\"font-variant:small-caps;\">Friedrich, Werner</span> ; u. a.</span>: A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2496–2501","ieee":"L. Feng <i>et al.</i>, “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors,” in <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2496–2501."},"author":[{"id":"237630","first_name":"Li","full_name":"Feng, Li","last_name":"Feng"},{"first_name":"Frank","id":"208487","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann"},{"first_name":"Jingwei","full_name":"Zhang, Jingwei","last_name":"Zhang"},{"first_name":"Kun","last_name":"Ding","full_name":"Ding, Kun"},{"first_name":"Matthias","last_name":"Diehl","full_name":"Diehl, Matthias"},{"first_name":"Thomas","last_name":"Pfeil","full_name":"Pfeil, Thomas"},{"full_name":"Brandt, Steffen","last_name":"Brandt","first_name":"Steffen"},{"full_name":"Friedrich, Werner","last_name":"Friedrich","first_name":"Werner"},{"full_name":"Amin, Nowshad","last_name":"Amin","first_name":"Nowshad"}],"publication":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","publication_status":"published","user_id":"245590","type":"conference","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"title":"A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors","date_created":"2023-09-01T08:39:42Z"},{"issue":"7","publication":"Coatings","publication_status":"published","user_id":"245590","main_file_link":[{"url":"https://doi.org/10.3390/coatings10070650","open_access":"1"}],"type":"journal_article","publication_identifier":{"eissn":["2079-6412"]},"tmp":{"short":"CC BY (4.0)","legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)","image":"/images/cc_by.png"},"oa":"1","volume":10,"title":"Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications","date_created":"2023-09-01T08:41:28Z","article_number":"650","language":[{"iso":"eng"}],"year":"2020","_id":"3511","publisher":"MDPI AG","date_updated":"2026-03-17T15:28:45Z","intvolume":"        10","doi":"10.3390/coatings10070650","status":"public","author":[{"full_name":"Aleksandrova, Mariya","last_name":"Aleksandrova","first_name":"Mariya"},{"last_name":"Ivanova","full_name":"Ivanova, Tatyana","first_name":"Tatyana"},{"id":"208487","first_name":"Frank","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann"},{"last_name":"Strijkova","full_name":"Strijkova, Velichka","first_name":"Velichka"},{"last_name":"Gesheva","full_name":"Gesheva, Kostadinka","first_name":"Kostadinka"}],"citation":{"mla":"Aleksandrova, Mariya, et al. “Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications.” <i>Coatings</i>, vol. 10, no. 7, 650, MDPI AG, 2020, doi:<a href=\"https://doi.org/10.3390/coatings10070650\">10.3390/coatings10070650</a>.","ama":"Aleksandrova M, Ivanova T, Hamelmann F, Strijkova V, Gesheva K. Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications. <i>Coatings</i>. 2020;10(7). doi:<a href=\"https://doi.org/10.3390/coatings10070650\">10.3390/coatings10070650</a>","chicago":"Aleksandrova, Mariya, Tatyana Ivanova, Frank Hamelmann, Velichka Strijkova, and Kostadinka Gesheva. “Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications.” <i>Coatings</i> 10, no. 7 (2020). <a href=\"https://doi.org/10.3390/coatings10070650\">https://doi.org/10.3390/coatings10070650</a>.","short":"M. Aleksandrova, T. Ivanova, F. Hamelmann, V. Strijkova, K. Gesheva, Coatings 10 (2020).","alphadin":"<span style=\"font-variant:small-caps;\">Aleksandrova, Mariya</span> ; <span style=\"font-variant:small-caps;\">Ivanova, Tatyana</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Strijkova, Velichka</span> ; <span style=\"font-variant:small-caps;\">Gesheva, Kostadinka</span>: Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications. In: <i>Coatings</i> Bd. 10, MDPI AG (2020), Nr. 7","apa":"Aleksandrova, M., Ivanova, T., Hamelmann, F., Strijkova, V., &#38; Gesheva, K. (2020). Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications. <i>Coatings</i>, <i>10</i>(7). <a href=\"https://doi.org/10.3390/coatings10070650\">https://doi.org/10.3390/coatings10070650</a>","bibtex":"@article{Aleksandrova_Ivanova_Hamelmann_Strijkova_Gesheva_2020, title={Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications}, volume={10}, DOI={<a href=\"https://doi.org/10.3390/coatings10070650\">10.3390/coatings10070650</a>}, number={7650}, journal={Coatings}, publisher={MDPI AG}, author={Aleksandrova, Mariya and Ivanova, Tatyana and Hamelmann, Frank and Strijkova, Velichka and Gesheva, Kostadinka}, year={2020} }","ieee":"M. Aleksandrova, T. Ivanova, F. Hamelmann, V. Strijkova, and K. Gesheva, “Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications,” <i>Coatings</i>, vol. 10, no. 7, 2020."}},{"author":[{"id":"207629","first_name":"Grit","full_name":"Behrens, Grit","orcid":"0009-0009-0247-8204","last_name":"Behrens"},{"full_name":"Weicht, Johannes","last_name":"Weicht","first_name":"Johannes"},{"first_name":"Klaus","last_name":"Schlender","full_name":"Schlender, Klaus"},{"first_name":"Florian","last_name":"Fehring","full_name":"Fehring, Florian"},{"full_name":"Dreimann, Rouven","last_name":"Dreimann","first_name":"Rouven"},{"full_name":"Meese, Michael","last_name":"Meese","first_name":"Michael"},{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"},{"last_name":"Thiel","full_name":"Thiel, Christoph","first_name":"Christoph"},{"first_name":"Thorsten","full_name":"Försterling, Thorsten","last_name":"Försterling"},{"full_name":"Wübbenhorst, Marc","last_name":"Wübbenhorst","first_name":"Marc"}],"citation":{"ieee":"G. Behrens <i>et al.</i>, “Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings,” in <i>From Science to Society</i>, B. Otjacques, P. Hitzelberger, S. Naumann, and V. Wohlgemuth, Eds. Cham: Springer International Publishing, 2018, pp. 181–189.","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Behrens, Grit</span> ; <span style=\"font-variant:small-caps;\">Weicht, Johannes</span> ; <span style=\"font-variant:small-caps;\">Schlender, Klaus</span> ; <span style=\"font-variant:small-caps;\">Fehring, Florian</span> ; <span style=\"font-variant:small-caps;\">Dreimann, Rouven</span> ; <span style=\"font-variant:small-caps;\">Meese, Michael</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Thiel, Christoph</span> ; u. a.</span>: Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings. In: <span style=\"font-variant:small-caps;\">Otjacques, B.</span> ; <span style=\"font-variant:small-caps;\">Hitzelberger, P.</span> ; <span style=\"font-variant:small-caps;\">Naumann, S.</span> ; <span style=\"font-variant:small-caps;\">Wohlgemuth, V.</span> (Hrsg.): <i>From Science to Society</i>, <i>Progress in IS</i>. Cham : Springer International Publishing, 2018, S. 181–189","apa":"Behrens, G., Weicht, J., Schlender, K., Fehring, F., Dreimann, R., Meese, M., … Wübbenhorst, M. (2018). Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings. In B. Otjacques, P. Hitzelberger, S. Naumann, &#38; V. Wohlgemuth (Eds.), <i>From Science to Society</i> (pp. 181–189). Cham: Springer International Publishing. <a href=\"https://doi.org/10.1007/978-3-319-65687-8_16\">https://doi.org/10.1007/978-3-319-65687-8_16</a>","bibtex":"@inbook{Behrens_Weicht_Schlender_Fehring_Dreimann_Meese_Hamelmann_Thiel_Försterling_Wübbenhorst_2018, place={Cham}, series={Progress in IS}, title={Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings}, DOI={<a href=\"https://doi.org/10.1007/978-3-319-65687-8_16\">10.1007/978-3-319-65687-8_16</a>}, booktitle={From Science to Society}, publisher={Springer International Publishing}, author={Behrens, Grit and Weicht, Johannes and Schlender, Klaus and Fehring, Florian and Dreimann, Rouven and Meese, Michael and Hamelmann, Frank and Thiel, Christoph and Försterling, Thorsten and Wübbenhorst, Marc}, editor={Otjacques, Benoît and Hitzelberger, Patrik and Naumann, Stefan and Wohlgemuth, VolkerEditors}, year={2018}, pages={181–189}, collection={Progress in IS} }","short":"G. Behrens, J. Weicht, K. Schlender, F. Fehring, R. Dreimann, M. Meese, F. Hamelmann, C. Thiel, T. Försterling, M. Wübbenhorst, in: B. Otjacques, P. Hitzelberger, S. Naumann, V. Wohlgemuth (Eds.), From Science to Society, Springer International Publishing, Cham, 2018, pp. 181–189.","chicago":"Behrens, Grit, Johannes Weicht, Klaus Schlender, Florian Fehring, Rouven Dreimann, Michael Meese, Frank Hamelmann, Christoph Thiel, Thorsten Försterling, and Marc Wübbenhorst. “Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings.” In <i>From Science to Society</i>, edited by Benoît Otjacques, Patrik Hitzelberger, Stefan Naumann, and Volker Wohlgemuth, 181–89. Progress in IS. Cham: Springer International Publishing, 2018. <a href=\"https://doi.org/10.1007/978-3-319-65687-8_16\">https://doi.org/10.1007/978-3-319-65687-8_16</a>.","mla":"Behrens, Grit, et al. “Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings.” <i>From Science to Society</i>, edited by Benoît Otjacques et al., Springer International Publishing, 2018, pp. 181–89, doi:<a href=\"https://doi.org/10.1007/978-3-319-65687-8_16\">10.1007/978-3-319-65687-8_16</a>.","ama":"Behrens G, Weicht J, Schlender K, et al. Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings. In: Otjacques B, Hitzelberger P, Naumann S, Wohlgemuth V, eds. <i>From Science to Society</i>. Progress in IS. Cham: Springer International Publishing; 2018:181-189. doi:<a href=\"https://doi.org/10.1007/978-3-319-65687-8_16\">10.1007/978-3-319-65687-8_16</a>"},"place":"Cham","status":"public","doi":"10.1007/978-3-319-65687-8_16","date_updated":"2026-03-17T15:28:46Z","publisher":"Springer International Publishing","page":"181-189","_id":"3562","editor":[{"full_name":"Otjacques, Benoît","last_name":"Otjacques","first_name":"Benoît"},{"first_name":"Patrik","full_name":"Hitzelberger, Patrik","last_name":"Hitzelberger"},{"last_name":"Naumann","full_name":"Naumann, Stefan","first_name":"Stefan"},{"last_name":"Wohlgemuth","full_name":"Wohlgemuth, Volker","first_name":"Volker"}],"year":"2018","language":[{"iso":"eng"}],"date_created":"2023-09-01T12:09:55Z","title":"Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings","type":"book_chapter","publication_identifier":{"isbn":["978-3-319-65686-1"],"eissn":["2196-8713"],"eisbn":["978-3-319-65687-8"],"issn":["2196-8705"]},"alternative_id":["3670"],"user_id":"231260","publication":"From Science to Society","series_title":"Progress in IS","publication_status":"published"},{"volume":764,"date_created":"2023-09-01T08:44:14Z","title":"Thin film zinc oxide deposited by CVD and PVD","publication_status":"published","publication":"Journal of Physics: Conference Series","main_file_link":[{"url":"https://doi.org/10.1088/1742-6596/764/1/012001"}],"user_id":"245590","type":"journal_article","publication_identifier":{"eissn":["1742-6596"],"issn":["1742-6588"]},"date_updated":"2026-03-17T15:28:45Z","publisher":"IOP Publishing","doi":"10.1088/1742-6596/764/1/012001","intvolume":"       764","status":"public","author":[{"first_name":"Frank","id":"208487","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann"}],"citation":{"apa":"Hamelmann, F. (2016). Thin film zinc oxide deposited by CVD and PVD. <i>Journal of Physics: Conference Series</i>, <i>764</i>. <a href=\"https://doi.org/10.1088/1742-6596/764/1/012001\">https://doi.org/10.1088/1742-6596/764/1/012001</a>","bibtex":"@article{Hamelmann_2016, title={Thin film zinc oxide deposited by CVD and PVD}, volume={764}, DOI={<a href=\"https://doi.org/10.1088/1742-6596/764/1/012001\">10.1088/1742-6596/764/1/012001</a>}, number={012001}, journal={Journal of Physics: Conference Series}, publisher={IOP Publishing}, author={Hamelmann, Frank}, year={2016} }","alphadin":"<span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Thin film zinc oxide deposited by CVD and PVD. In: <i>Journal of Physics: Conference Series</i> Bd. 764, IOP Publishing (2016)","ieee":"F. Hamelmann, “Thin film zinc oxide deposited by CVD and PVD,” <i>Journal of Physics: Conference Series</i>, vol. 764, 2016.","ama":"Hamelmann F. Thin film zinc oxide deposited by CVD and PVD. <i>Journal of Physics: Conference Series</i>. 2016;764. doi:<a href=\"https://doi.org/10.1088/1742-6596/764/1/012001\">10.1088/1742-6596/764/1/012001</a>","mla":"Hamelmann, Frank. “Thin Film Zinc Oxide Deposited by CVD and PVD.” <i>Journal of Physics: Conference Series</i>, vol. 764, 012001, IOP Publishing, 2016, doi:<a href=\"https://doi.org/10.1088/1742-6596/764/1/012001\">10.1088/1742-6596/764/1/012001</a>.","short":"F. Hamelmann, Journal of Physics: Conference Series 764 (2016).","chicago":"Hamelmann, Frank. “Thin Film Zinc Oxide Deposited by CVD and PVD.” <i>Journal of Physics: Conference Series</i> 764 (2016). <a href=\"https://doi.org/10.1088/1742-6596/764/1/012001\">https://doi.org/10.1088/1742-6596/764/1/012001</a>."},"article_number":"012001","language":[{"iso":"eng"}],"_id":"3512","year":"2016"},{"main_file_link":[{"url":"https://doi.org/10.1088/1742-6596/682/1/012017"}],"user_id":"237837","type":"journal_article","publication_identifier":{"issn":["1742-6588"],"eissn":["1742-6596"]},"publication_status":"published","publication":"Journal of Physics: Conference Series","volume":682,"date_created":"2023-09-01T08:48:31Z","title":"Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit","language":[{"iso":"eng"}],"_id":"3515","year":"2016","article_number":"012017","status":"public","author":[{"full_name":"Weicht, J A","last_name":"Weicht","first_name":"J A"},{"first_name":"Frank","id":"208487","last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank"},{"last_name":"Behrens","orcid":"0009-0009-0247-8204","full_name":"Behrens, Grit","first_name":"Grit","id":"207629"}],"citation":{"ama":"Weicht JA, Hamelmann F, Behrens G. Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. <i>Journal of Physics: Conference Series</i>. 2016;682. doi:<a href=\"https://doi.org/10.1088/1742-6596/682/1/012017\">10.1088/1742-6596/682/1/012017</a>","mla":"Weicht, J. A., et al. “Simulation of Light-Induced Degradation of Μc-Si in a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent Circuit.” <i>Journal of Physics: Conference Series</i>, vol. 682, 012017, IOP Publishing, 2016, doi:<a href=\"https://doi.org/10.1088/1742-6596/682/1/012017\">10.1088/1742-6596/682/1/012017</a>.","short":"J.A. Weicht, F. Hamelmann, G. Behrens, Journal of Physics: Conference Series 682 (2016).","chicago":"Weicht, J A, Frank Hamelmann, and Grit Behrens. “Simulation of Light-Induced Degradation of Μc-Si in a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent Circuit.” <i>Journal of Physics: Conference Series</i> 682 (2016). <a href=\"https://doi.org/10.1088/1742-6596/682/1/012017\">https://doi.org/10.1088/1742-6596/682/1/012017</a>.","bibtex":"@article{Weicht_Hamelmann_Behrens_2016, title={Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit}, volume={682}, DOI={<a href=\"https://doi.org/10.1088/1742-6596/682/1/012017\">10.1088/1742-6596/682/1/012017</a>}, number={012017}, journal={Journal of Physics: Conference Series}, publisher={IOP Publishing}, author={Weicht, J A and Hamelmann, Frank and Behrens, Grit}, year={2016} }","apa":"Weicht, J. A., Hamelmann, F., &#38; Behrens, G. (2016). Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. <i>Journal of Physics: Conference Series</i>, <i>682</i>. <a href=\"https://doi.org/10.1088/1742-6596/682/1/012017\">https://doi.org/10.1088/1742-6596/682/1/012017</a>","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, J A</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. In: <i>Journal of Physics: Conference Series</i> Bd. 682, IOP Publishing (2016)","ieee":"J. A. Weicht, F. Hamelmann, and G. Behrens, “Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit,” <i>Journal of Physics: Conference Series</i>, vol. 682, 2016."},"date_updated":"2026-03-17T15:28:45Z","publisher":"IOP Publishing","doi":"10.1088/1742-6596/682/1/012017","intvolume":"       682"},{"_id":"3516","year":"2016","language":[{"iso":"eng"}],"article_number":"012002","author":[{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"},{"full_name":"Weicht, J A","last_name":"Weicht","first_name":"J A"},{"first_name":"Grit","id":"207629","orcid":"0009-0009-0247-8204","full_name":"Behrens, Grit","last_name":"Behrens"}],"citation":{"mla":"Hamelmann, Frank, et al. “Light-Induced Degradation of Thin Film Silicon Solar Cells.” <i>Journal of Physics: Conference Series</i>, vol. 682, 012002, IOP Publishing, 2016, doi:<a href=\"https://doi.org/10.1088/1742-6596/682/1/012002\">10.1088/1742-6596/682/1/012002</a>.","ama":"Hamelmann F, Weicht JA, Behrens G. Light-Induced Degradation of Thin Film Silicon Solar Cells. <i>Journal of Physics: Conference Series</i>. 2016;682. doi:<a href=\"https://doi.org/10.1088/1742-6596/682/1/012002\">10.1088/1742-6596/682/1/012002</a>","short":"F. Hamelmann, J.A. Weicht, G. Behrens, Journal of Physics: Conference Series 682 (2016).","chicago":"Hamelmann, Frank, J A Weicht, and Grit Behrens. “Light-Induced Degradation of Thin Film Silicon Solar Cells.” <i>Journal of Physics: Conference Series</i> 682 (2016). <a href=\"https://doi.org/10.1088/1742-6596/682/1/012002\">https://doi.org/10.1088/1742-6596/682/1/012002</a>.","alphadin":"<span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Weicht, J A</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Light-Induced Degradation of Thin Film Silicon Solar Cells. In: <i>Journal of Physics: Conference Series</i> Bd. 682, IOP Publishing (2016)","apa":"Hamelmann, F., Weicht, J. A., &#38; Behrens, G. (2016). Light-Induced Degradation of Thin Film Silicon Solar Cells. <i>Journal of Physics: Conference Series</i>, <i>682</i>. <a href=\"https://doi.org/10.1088/1742-6596/682/1/012002\">https://doi.org/10.1088/1742-6596/682/1/012002</a>","bibtex":"@article{Hamelmann_Weicht_Behrens_2016, title={Light-Induced Degradation of Thin Film Silicon Solar Cells}, volume={682}, DOI={<a href=\"https://doi.org/10.1088/1742-6596/682/1/012002\">10.1088/1742-6596/682/1/012002</a>}, number={012002}, journal={Journal of Physics: Conference Series}, publisher={IOP Publishing}, author={Hamelmann, Frank and Weicht, J A and Behrens, Grit}, year={2016} }","ieee":"F. Hamelmann, J. A. Weicht, and G. Behrens, “Light-Induced Degradation of Thin Film Silicon Solar Cells,” <i>Journal of Physics: Conference Series</i>, vol. 682, 2016."},"status":"public","doi":"10.1088/1742-6596/682/1/012002","intvolume":"       682","date_updated":"2026-03-17T15:28:45Z","publisher":"IOP Publishing","type":"journal_article","publication_identifier":{"eissn":["1742-6596"],"issn":["1742-6588"]},"main_file_link":[{"url":"https://doi.org/10.1088/1742-6596/682/1/012002"}],"user_id":"237837","publication_status":"published","publication":"Journal of Physics: Conference Series","date_created":"2023-09-01T08:49:18Z","title":"Light-Induced Degradation of Thin Film Silicon Solar Cells","volume":682},{"year":"2016","_id":"171","language":[{"iso":"eng"}],"intvolume":"        12","doi":"10.1007/s13391-016-4008-x","page":"468-471","date_updated":"2026-03-17T15:28:24Z","citation":{"ieee":"J. Weicht, R. Rasch, G. Behrens, and F. Hamelmann, “Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules,” <i>Electronic Materials Letters</i>, vol. 12, no. 4, pp. 468–471, 2016.","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, Johannes</span> ; <span style=\"font-variant:small-caps;\">Rasch, Robin</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules. In: <i>Electronic Materials Letters</i> Bd. 12 (2016), Nr. 4, S. 468–471","bibtex":"@article{Weicht_Rasch_Behrens_Hamelmann_2016, title={Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules}, volume={12}, DOI={<a href=\"https://doi.org/10.1007/s13391-016-4008-x\">10.1007/s13391-016-4008-x</a>}, number={4}, journal={Electronic Materials Letters}, author={Weicht, Johannes and Rasch, Robin and Behrens, Grit and Hamelmann, Frank}, year={2016}, pages={468–471} }","apa":"Weicht, J., Rasch, R., Behrens, G., &#38; Hamelmann, F. (2016). Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules. <i>Electronic Materials Letters</i>, <i>12</i>(4), 468–471. <a href=\"https://doi.org/10.1007/s13391-016-4008-x\">https://doi.org/10.1007/s13391-016-4008-x</a>","chicago":"Weicht, Johannes, Robin Rasch, Grit Behrens, and Frank Hamelmann. “Performance Characterization of Thin-Film-Silicon Based Solar Modules under Clouded and Clear Sky Conditions in Comparison to Crystalline Silicon Modules.” <i>Electronic Materials Letters</i> 12, no. 4 (2016): 468–71. <a href=\"https://doi.org/10.1007/s13391-016-4008-x\">https://doi.org/10.1007/s13391-016-4008-x</a>.","short":"J. Weicht, R. Rasch, G. Behrens, F. Hamelmann, Electronic Materials Letters 12 (2016) 468–471.","mla":"Weicht, Johannes, et al. “Performance Characterization of Thin-Film-Silicon Based Solar Modules under Clouded and Clear Sky Conditions in Comparison to Crystalline Silicon Modules.” <i>Electronic Materials Letters</i>, vol. 12, no. 4, 2016, pp. 468–71, doi:<a href=\"https://doi.org/10.1007/s13391-016-4008-x\">10.1007/s13391-016-4008-x</a>.","ama":"Weicht J, Rasch R, Behrens G, Hamelmann F. Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules. <i>Electronic Materials Letters</i>. 2016;12(4):468-471. doi:<a href=\"https://doi.org/10.1007/s13391-016-4008-x\">10.1007/s13391-016-4008-x</a>"},"author":[{"last_name":"Weicht","full_name":"Weicht, Johannes","first_name":"Johannes"},{"full_name":"Rasch, Robin","last_name":"Rasch","first_name":"Robin","id":"221232"},{"id":"207629","first_name":"Grit","full_name":"Behrens, Grit","orcid":"0009-0009-0247-8204","last_name":"Behrens"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"}],"status":"public","issue":"4","publication":"Electronic Materials Letters","type":"journal_article","oa":"1","user_id":"237837","main_file_link":[{"url":"https://rdcu.be/dluHK","open_access":"1"}],"alternative_id":["3513"],"title":"Performance characterization of thin-film-silicon based solar modules under clouded and clear sky conditions in comparison to crystalline silicon modules","date_created":"2019-04-17T12:25:45Z","volume":12},{"year":"2016","_id":"175","language":[{"iso":"eng"}],"author":[{"first_name":"Johannes","last_name":"Weicht","full_name":"Weicht, Johannes"},{"first_name":"Frank","id":"208487","last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank"},{"last_name":"Behrens","orcid":"0009-0009-0247-8204","full_name":"Behrens, Grit","first_name":"Grit","id":"207629","orcid_put_code_url":"https://api.orcid.org/v2.0/0009-0009-0247-8204/work/184175890"}],"citation":{"ieee":"J. Weicht, F. Hamelmann, and G. Behrens, “Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells,” presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München, 2016.","bibtex":"@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>}, author={Weicht, Johannes and Hamelmann, Frank and Behrens, Grit}, year={2016} }","apa":"Weicht, J., Hamelmann, F., &#38; Behrens, G. (2016). Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition, München. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, Johannes</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: , 2016","short":"J. Weicht, F. Hamelmann, G. Behrens, in: 2016.","chicago":"Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,” 2016. <a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4</a>.","ama":"Weicht J, Hamelmann F, Behrens G. Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In: ; 2016. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>","mla":"Weicht, Johannes, et al. <i>Changes in Temperature-Coefficient of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells</i>. 2016, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4\">10.4229/EUPVSEC20162016-3DV.1.4</a>."},"conference":{"start_date":"2016-06-20","end_date":"2016-06-24","location":"München","name":"32nd European Photovoltaic Solar Energy Conference and Exhibition"},"status":"public","doi":"10.4229/EUPVSEC20162016-3DV.1.4","date_updated":"2026-03-17T15:28:24Z","type":"conference","publication_identifier":{"issn":["2196-100X"]},"user_id":"231260","alternative_id":["3514"],"title":"Changes in temperature-coefficient of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells","date_created":"2019-04-17T13:04:49Z"},{"status":"public","author":[{"full_name":"Corpus-Mendoza, Asiel N.","last_name":"Corpus-Mendoza","first_name":"Asiel N."},{"last_name":"De Souza","full_name":"De Souza, M. M.","first_name":"M. M."},{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"}],"citation":{"ieee":"A. N. Corpus-Mendoza, M. M. De Souza, and F. Hamelmann, “Separation of bulk and contact interface degradation in thin film silicon solar cells,” <i>Journal of Renewable and Sustainable Energy</i>, vol. 7, no. 6, 2015.","alphadin":"<span style=\"font-variant:small-caps;\">Corpus-Mendoza, Asiel N.</span> ; <span style=\"font-variant:small-caps;\">De Souza, M. M.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Separation of bulk and contact interface degradation in thin film silicon solar cells. In: <i>Journal of Renewable and Sustainable Energy</i> Bd. 7, AIP Publishing (2015), Nr. 6","bibtex":"@article{Corpus-Mendoza_De Souza_Hamelmann_2015, title={Separation of bulk and contact interface degradation in thin film silicon solar cells}, volume={7}, DOI={<a href=\"https://doi.org/10.1063/1.4936592\">10.1063/1.4936592</a>}, number={6063115}, journal={Journal of Renewable and Sustainable Energy}, publisher={AIP Publishing}, author={Corpus-Mendoza, Asiel N. and De Souza, M. M. and Hamelmann, Frank}, year={2015} }","apa":"Corpus-Mendoza, A. N., De Souza, M. M., &#38; Hamelmann, F. (2015). Separation of bulk and contact interface degradation in thin film silicon solar cells. <i>Journal of Renewable and Sustainable Energy</i>, <i>7</i>(6). <a href=\"https://doi.org/10.1063/1.4936592\">https://doi.org/10.1063/1.4936592</a>","chicago":"Corpus-Mendoza, Asiel N., M. M. De Souza, and Frank Hamelmann. “Separation of Bulk and Contact Interface Degradation in Thin Film Silicon Solar Cells.” <i>Journal of Renewable and Sustainable Energy</i> 7, no. 6 (2015). <a href=\"https://doi.org/10.1063/1.4936592\">https://doi.org/10.1063/1.4936592</a>.","short":"A.N. Corpus-Mendoza, M.M. De Souza, F. Hamelmann, Journal of Renewable and Sustainable Energy 7 (2015).","mla":"Corpus-Mendoza, Asiel N., et al. “Separation of Bulk and Contact Interface Degradation in Thin Film Silicon Solar Cells.” <i>Journal of Renewable and Sustainable Energy</i>, vol. 7, no. 6, 063115, AIP Publishing, 2015, doi:<a href=\"https://doi.org/10.1063/1.4936592\">10.1063/1.4936592</a>.","ama":"Corpus-Mendoza AN, De Souza MM, Hamelmann F. Separation of bulk and contact interface degradation in thin film silicon solar cells. <i>Journal of Renewable and Sustainable Energy</i>. 2015;7(6). doi:<a href=\"https://doi.org/10.1063/1.4936592\">10.1063/1.4936592</a>"},"date_updated":"2026-03-17T15:28:46Z","publisher":"AIP Publishing","doi":"10.1063/1.4936592","intvolume":"         7","language":[{"iso":"eng"}],"_id":"3561","year":"2015","article_number":"063115","volume":7,"date_created":"2023-09-01T12:08:07Z","title":"Separation of bulk and contact interface degradation in thin film silicon solar cells","user_id":"245590","publication_identifier":{"eissn":["1941-7012"]},"type":"journal_article","issue":"6","publication":"Journal of Renewable and Sustainable Energy","publication_status":"published"},{"title":"Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells","date_created":"2023-09-01T08:50:21Z","publication_identifier":{"eisbn":["978-1-4799-7944-8"]},"type":"conference","user_id":"237837","publication":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","publication_status":"published","author":[{"last_name":"Weicht","full_name":"Weicht, Johannes A.","first_name":"Johannes A."},{"id":"208487","first_name":"Frank","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann"},{"orcid":"0009-0009-0247-8204","full_name":"Behrens, Grit","last_name":"Behrens","first_name":"Grit","id":"207629"}],"citation":{"ieee":"J. A. Weicht, F. Hamelmann, and G. Behrens, “Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells,” in <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i>, New Orleans, LA, 2015, pp. 1–4.","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, Johannes A.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span>: Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells. In: <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i> : IEEE, 2015, S. 1–4","apa":"Weicht, J. A., Hamelmann, F., &#38; Behrens, G. (2015). Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells. In <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i> (pp. 1–4). New Orleans, LA: IEEE. <a href=\"https://doi.org/10.1109/PVSC.2015.7356298\">https://doi.org/10.1109/PVSC.2015.7356298</a>","bibtex":"@inproceedings{Weicht_Hamelmann_Behrens_2015, title={Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells}, DOI={<a href=\"https://doi.org/10.1109/PVSC.2015.7356298\">10.1109/PVSC.2015.7356298</a>}, booktitle={2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)}, publisher={IEEE}, author={Weicht, Johannes A. and Hamelmann, Frank and Behrens, Grit}, year={2015}, pages={1–4} }","chicago":"Weicht, Johannes A., Frank Hamelmann, and Grit Behrens. “Changing in Irradiation Behavior and Temperature-Coefficient Variation Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells.” In <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i>, 1–4. IEEE, 2015. <a href=\"https://doi.org/10.1109/PVSC.2015.7356298\">https://doi.org/10.1109/PVSC.2015.7356298</a>.","short":"J.A. Weicht, F. Hamelmann, G. Behrens, in: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC), IEEE, 2015, pp. 1–4.","mla":"Weicht, Johannes A., et al. “Changing in Irradiation Behavior and Temperature-Coefficient Variation Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells.” <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i>, IEEE, 2015, pp. 1–4, doi:<a href=\"https://doi.org/10.1109/PVSC.2015.7356298\">10.1109/PVSC.2015.7356298</a>.","ama":"Weicht JA, Hamelmann F, Behrens G. Changing in irradiation behavior and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si solar cells. In: <i>2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)</i>. IEEE; 2015:1-4. doi:<a href=\"https://doi.org/10.1109/PVSC.2015.7356298\">10.1109/PVSC.2015.7356298</a>"},"conference":{"name":"2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)","location":"New Orleans, LA"},"status":"public","doi":"10.1109/PVSC.2015.7356298","page":"1-4","publisher":"IEEE","date_updated":"2026-03-17T15:28:45Z","year":"2015","_id":"3517","language":[{"iso":"eng"}]},{"date_created":"2023-09-01T08:51:36Z","title":"Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells","publication_status":"published","type":"conference","user_id":"237837","doi":"10.4229/EUPVSEC20152015-3CV.1.12","date_updated":"2026-03-17T15:28:45Z","publisher":"WIP","citation":{"chicago":"Weicht, J.A., Robin Rasch, Grit Behrens, and Frank Hamelmann. “Changing of the Parameters of the ‘Three-Diode Model’ by Light-Induced Degradation at Different Degradation Temperatures of a-Si/Μc-Si Solar Cells.” WIP, 2015. <a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12</a>.","short":"J.A. Weicht, R. Rasch, G. Behrens, F. Hamelmann, in: WIP, 2015.","mla":"Weicht, J. A., et al. <i>Changing of the Parameters of the “Three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/Μc-Si Solar Cells</i>. WIP, 2015, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>.","ama":"Weicht JA, Rasch R, Behrens G, Hamelmann F. Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. In: WIP; 2015. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>","ieee":"J. A. Weicht, R. Rasch, G. Behrens, and F. Hamelmann, “Changing of the Parameters of the ‘three-Diode Model’ by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells,” presented at the European Photovoltaic Solar Energy Conference and Exhibition, 2015.","alphadin":"<span style=\"font-variant:small-caps;\">Weicht, J.A.</span> ; <span style=\"font-variant:small-caps;\">Rasch, Robin</span> ; <span style=\"font-variant:small-caps;\">Behrens, Grit</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. In:  : WIP, 2015","bibtex":"@inproceedings{Weicht_Rasch_Behrens_Hamelmann_2015, title={Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">10.4229/EUPVSEC20152015-3CV.1.12</a>}, publisher={WIP}, author={Weicht, J.A. and Rasch, Robin and Behrens, Grit and Hamelmann, Frank}, year={2015} }","apa":"Weicht, J. A., Rasch, R., Behrens, G., &#38; Hamelmann, F. (2015). Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different Degradation Temperatures of a-Si/µc-Si Solar Cells. Presented at the European Photovoltaic Solar Energy Conference and Exhibition, WIP. <a href=\"https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12\">https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12</a>"},"author":[{"full_name":"Weicht, J.A.","last_name":"Weicht","first_name":"J.A."},{"full_name":"Rasch, Robin","last_name":"Rasch","first_name":"Robin","id":"221232"},{"full_name":"Behrens, Grit","orcid":"0009-0009-0247-8204","last_name":"Behrens","id":"207629","first_name":"Grit"},{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"}],"status":"public","conference":{"name":"European Photovoltaic Solar Energy Conference and Exhibition"},"_id":"3518","year":"2015","language":[{"iso":"eng"}]}]