---
_id: '3492'
alternative_id:
- '3490'
- '3493'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Tiong Sieh
full_name: Kiong, Tiong Sieh
last_name: Kiong
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
- first_name: Frank U.
full_name: Hamelmann, Frank U.
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Zhang,
Jingwei ; Kiong, Tiong Sieh
; Ding, Kun ; Amin,
Nowshad ; Hamelmann, Frank U.:
Estimating Crack Effects on Electrical Characteristics of PV Modules Based on
Monitoring Data and – Curves. In: IEEE Journal of Photovoltaics Bd. 13,
Institute of Electrical and Electronics Engineers (IEEE) (2023), Nr. 4, S. 558–570'
ama: Feng L, Zhang J, Kiong TS, Ding K, Amin N, Hamelmann FU. Estimating Crack Effects
on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.
IEEE Journal of Photovoltaics. 2023;13(4):558-570. doi:10.1109/JPHOTOV.2023.3275251
apa: Feng, L., Zhang, J., Kiong, T. S., Ding, K., Amin, N., & Hamelmann, F.
U. (2023). Estimating Crack Effects on Electrical Characteristics of PV Modules
Based on Monitoring Data and – Curves. IEEE Journal of Photovoltaics, 13(4),
558–570. https://doi.org/10.1109/JPHOTOV.2023.3275251
bibtex: '@article{Feng_Zhang_Kiong_Ding_Amin_Hamelmann_2023, title={Estimating Crack
Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and
– Curves}, volume={13}, DOI={10.1109/JPHOTOV.2023.3275251},
number={4}, journal={IEEE Journal of Photovoltaics}, publisher={Institute of Electrical
and Electronics Engineers (IEEE)}, author={Feng, Li and Zhang, Jingwei and Kiong,
Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.}, year={2023},
pages={558–570} }'
chicago: 'Feng, Li, Jingwei Zhang, Tiong Sieh Kiong, Kun Ding, Nowshad Amin, and
Frank U. Hamelmann. “Estimating Crack Effects on Electrical Characteristics of
PV Modules Based on Monitoring Data and – Curves.” IEEE Journal of Photovoltaics
13, no. 4 (2023): 558–70. https://doi.org/10.1109/JPHOTOV.2023.3275251.'
ieee: L. Feng, J. Zhang, T. S. Kiong, K. Ding, N. Amin, and F. U. Hamelmann, “Estimating
Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring
Data and – Curves,” IEEE Journal of Photovoltaics, vol. 13, no. 4, pp.
558–570, 2023.
mla: Feng, Li, et al. “Estimating Crack Effects on Electrical Characteristics of
PV Modules Based on Monitoring Data and – Curves.” IEEE Journal of Photovoltaics,
vol. 13, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 2023,
pp. 558–70, doi:10.1109/JPHOTOV.2023.3275251.
short: L. Feng, J. Zhang, T.S. Kiong, K. Ding, N. Amin, F.U. Hamelmann, IEEE Journal
of Photovoltaics 13 (2023) 558–570.
date_created: 2023-08-28T09:35:35Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/JPHOTOV.2023.3275251
intvolume: ' 13'
issue: '4'
language:
- iso: eng
page: 558-570
publication: IEEE Journal of Photovoltaics
publication_identifier:
eissn:
- 2156-3403
issn:
- 2156-3381
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Estimating Crack Effects on Electrical Characteristics of PV Modules Based
on Monitoring Data and – Curves
type: journal_article
user_id: '245590'
volume: 13
year: '2023'
...
---
_id: '2916'
alternative_id:
- '3491'
article_number: '1448'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Amin,
Nowshad ; Zhang, Jingwei
; Ding, Kun ; Hamelmann,
Frank: Module-Level Performance Evaluation for a Smart PV System Based
on Field Conditions. In: Applied Sciences Bd. 13, MDPI AG (2023), Nr. 3'
ama: Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Module-Level Performance Evaluation
for a Smart PV System Based on Field Conditions. Applied Sciences. 2023;13(3).
doi:10.3390/app13031448
apa: Feng, L., Amin, N., Zhang, J., Ding, K., & Hamelmann, F. (2023). Module-Level
Performance Evaluation for a Smart PV System Based on Field Conditions. Applied
Sciences, 13(3). https://doi.org/10.3390/app13031448
bibtex: '@article{Feng_Amin_Zhang_Ding_Hamelmann_2023, title={Module-Level Performance
Evaluation for a Smart PV System Based on Field Conditions}, volume={13}, DOI={10.3390/app13031448}, number={31448},
journal={Applied Sciences}, publisher={MDPI AG}, author={Feng, Li and Amin, Nowshad
and Zhang, Jingwei and Ding, Kun and Hamelmann, Frank}, year={2023} }'
chicago: Feng, Li, Nowshad Amin, Jingwei Zhang, Kun Ding, and Frank Hamelmann. “Module-Level
Performance Evaluation for a Smart PV System Based on Field Conditions.” Applied
Sciences 13, no. 3 (2023). https://doi.org/10.3390/app13031448.
ieee: L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Module-Level Performance
Evaluation for a Smart PV System Based on Field Conditions,” Applied Sciences,
vol. 13, no. 3, 2023.
mla: Feng, Li, et al. “Module-Level Performance Evaluation for a Smart PV System
Based on Field Conditions.” Applied Sciences, vol. 13, no. 3, 1448, MDPI
AG, 2023, doi:10.3390/app13031448.
short: L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, Applied Sciences 13 (2023).
date_created: 2023-05-12T15:17:05Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.3390/app13031448
intvolume: ' 13'
issue: '3'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://doi.org/10.3390/app13031448
oa: '1'
publication: Applied Sciences
publication_identifier:
eissn:
- 2076-3417
publication_status: published
publisher: MDPI AG
quality_controlled: '1'
status: public
title: Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '245590'
volume: 13
year: '2023'
...
---
_id: '2861'
article_number: '6567'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Zenan
full_name: Yang, Zenan
last_name: Yang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xihui
full_name: Chen, Xihui
last_name: Chen
- first_name: Yongjie
full_name: Liu, Yongjie
last_name: Liu
- first_name: Ling
full_name: Chen, Ling
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Yang, Zenan ; Ding,
Kun ; Feng, Li ; Hamelmann,
Frank ; Chen, Xihui ; Liu, Yongjie ; Chen,
Ling: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement
Learning Using Residuals of I–V Characteristics. In: Energies Bd. 15, MDPI
AG (2022), Nr. 18'
ama: Zhang J, Yang Z, Ding K, et al. Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics. Energies.
2022;15(18). doi:10.3390/en15186567
apa: Zhang, J., Yang, Z., Ding, K., Feng, L., Hamelmann, F., Chen, X., … Chen, L.
(2022). Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement
Learning Using Residuals of I–V Characteristics. Energies, 15(18).
https://doi.org/10.3390/en15186567
bibtex: '@article{Zhang_Yang_Ding_Feng_Hamelmann_Chen_Liu_Chen_2022, title={Modeling
of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals
of I–V Characteristics}, volume={15}, DOI={10.3390/en15186567},
number={186567}, journal={Energies}, publisher={MDPI AG}, author={Zhang, Jingwei
and Yang, Zenan and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xihui
and Liu, Yongjie and Chen, Ling}, year={2022} }'
chicago: Zhang, Jingwei, Zenan Yang, Kun Ding, Li Feng, Frank Hamelmann, Xihui Chen,
Yongjie Liu, and Ling Chen. “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics.” Energies
15, no. 18 (2022). https://doi.org/10.3390/en15186567.
ieee: J. Zhang et al., “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics,” Energies,
vol. 15, no. 18, 2022.
mla: Zhang, Jingwei, et al. “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics.” Energies,
vol. 15, no. 18, 6567, MDPI AG, 2022, doi:10.3390/en15186567.
short: J. Zhang, Z. Yang, K. Ding, L. Feng, F. Hamelmann, X. Chen, Y. Liu, L. Chen,
Energies 15 (2022).
date_created: 2023-05-09T09:23:40Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.3390/en15186567
intvolume: ' 15'
issue: '18'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://www.mdpi.com/1996-1073/15/18/6567
oa: '1'
publication: Energies
publication_identifier:
eissn:
- 1996-1073
publication_status: published
publisher: MDPI AG
quality_controlled: '1'
status: public
title: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning
Using Residuals of I–V Characteristics
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '245590'
volume: 15
year: '2022'
...
---
_id: '2917'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: N.
full_name: Amin, N.
last_name: Amin
- first_name: J.
full_name: Zhang, J.
last_name: Zhang
- first_name: K.
full_name: Ding, K.
last_name: Ding
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Amin,
N. ; Zhang, J. ; Ding,
K. ; Hamelmann, Frank: Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.
In: EU PVSEC Proceedings, WIP (2021)'
ama: Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Classification of Uncertain I-V
Curves in PV Modules Based on Current and Voltage Evaluation. EU PVSEC Proceedings.
2021. doi:10.4229/EUPVSEC20212021-4AV.2.18
apa: Feng, L., Amin, N., Zhang, J., Ding, K., & Hamelmann, F. (2021). Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.
EU PVSEC Proceedings. https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18
bibtex: '@article{Feng_Amin_Zhang_Ding_Hamelmann_2021, title={Classification of
Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation}, DOI={10.4229/EUPVSEC20212021-4AV.2.18},
journal={EU PVSEC Proceedings}, publisher={WIP}, author={Feng, Li and Amin, N.
and Zhang, J. and Ding, K. and Hamelmann, Frank}, year={2021} }'
chicago: Feng, Li, N. Amin, J. Zhang, K. Ding, and Frank Hamelmann. “Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.”
EU PVSEC Proceedings, 2021. https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18.
ieee: L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Classification of
Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation,” EU
PVSEC Proceedings, 2021.
mla: Feng, Li, et al. “Classification of Uncertain I-V Curves in PV Modules Based
on Current and Voltage Evaluation.” EU PVSEC Proceedings, WIP, 2021, doi:10.4229/EUPVSEC20212021-4AV.2.18.
short: L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, EU PVSEC Proceedings (2021).
date_created: 2023-05-12T15:23:46Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.4229/EUPVSEC20212021-4AV.2.18
language:
- iso: eng
main_file_link:
- url: https://www.eupvsec-proceedings.com/proceedings?paper=50327
publication: EU PVSEC Proceedings
publication_status: published
publisher: WIP
status: public
title: Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage
Evaluation
type: journal_article
user_id: '245590'
year: '2021'
...
---
_id: '2918'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Ding
full_name: Kun, Ding
last_name: Kun
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xihui
full_name: Chen, Xihui
last_name: Chen
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
- first_name: Ling
full_name: Chen, Ling
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Feng, Li ; Kun,
Ding ; Hamelmann, Frank ;
Chen, Xihui ; Chen,
Xiang ; Chen, Ling: Degradation
Assessment of Photovoltaic Module Based on Probability Distribution Analysis of
Model Parameters. In: 2021 IEEE 16th Conference on Industrial Electronics and
Applications (ICIEA) : IEEE, 2021, S. 783–787'
ama: 'Zhang J, Feng L, Kun D, et al. Degradation Assessment of Photovoltaic Module
Based on Probability Distribution Analysis of Model Parameters. In: 2021 IEEE
16th Conference on Industrial Electronics and Applications (ICIEA). IEEE;
2021:783-787. doi:10.1109/ICIEA51954.2021.9516437'
apa: 'Zhang, J., Feng, L., Kun, D., Hamelmann, F., Chen, X., Chen, X., & Chen,
L. (2021). Degradation Assessment of Photovoltaic Module Based on Probability
Distribution Analysis of Model Parameters. In 2021 IEEE 16th Conference on
Industrial Electronics and Applications (ICIEA) (pp. 783–787). Chengdu, China:
IEEE. https://doi.org/10.1109/ICIEA51954.2021.9516437'
bibtex: '@inproceedings{Zhang_Feng_Kun_Hamelmann_Chen_Chen_Chen_2021, title={Degradation
Assessment of Photovoltaic Module Based on Probability Distribution Analysis of
Model Parameters}, DOI={10.1109/ICIEA51954.2021.9516437},
booktitle={2021 IEEE 16th Conference on Industrial Electronics and Applications
(ICIEA)}, publisher={IEEE}, author={Zhang, Jingwei and Feng, Li and Kun, Ding
and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling}, year={2021},
pages={783–787} }'
chicago: Zhang, Jingwei, Li Feng, Ding Kun, Frank Hamelmann, Xihui Chen, Xiang Chen,
and Ling Chen. “Degradation Assessment of Photovoltaic Module Based on Probability
Distribution Analysis of Model Parameters.” In 2021 IEEE 16th Conference on
Industrial Electronics and Applications (ICIEA), 783–87. IEEE, 2021. https://doi.org/10.1109/ICIEA51954.2021.9516437.
ieee: J. Zhang et al., “Degradation Assessment of Photovoltaic Module Based
on Probability Distribution Analysis of Model Parameters,” in 2021 IEEE 16th
Conference on Industrial Electronics and Applications (ICIEA), Chengdu, China,
2021, pp. 783–787.
mla: Zhang, Jingwei, et al. “Degradation Assessment of Photovoltaic Module Based
on Probability Distribution Analysis of Model Parameters.” 2021 IEEE 16th Conference
on Industrial Electronics and Applications (ICIEA), IEEE, 2021, pp. 783–87,
doi:10.1109/ICIEA51954.2021.9516437.
short: 'J. Zhang, L. Feng, D. Kun, F. Hamelmann, X. Chen, X. Chen, L. Chen, in:
2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA),
IEEE, 2021, pp. 783–787.'
conference:
location: Chengdu, China
name: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)
date_created: 2023-05-12T15:26:12Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.1109/ICIEA51954.2021.9516437
language:
- iso: eng
page: 783-787
publication: 2021 IEEE 16th Conference on Industrial Electronics and Applications
(ICIEA)
publication_identifier:
eisbn:
- 978-1-6654-2248-2
publication_status: published
publisher: IEEE
status: public
title: Degradation Assessment of Photovoltaic Module Based on Probability Distribution
Analysis of Model Parameters
type: conference
user_id: '245590'
year: '2021'
...
---
_id: '3506'
author:
- first_name: Mariya
full_name: Aleksandrova, Mariya
last_name: Aleksandrova
- first_name: Tatyana
full_name: Ivanova, Tatyana
last_name: Ivanova
- first_name: Sascha
full_name: Koch, Sascha
last_name: Koch
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Daniela
full_name: Karashanova, Daniela
last_name: Karashanova
- first_name: Kostadinka
full_name: Gesheva, Kostadinka
last_name: Gesheva
citation:
alphadin: 'Aleksandrova, Mariya ;
Ivanova, Tatyana ; Koch,
Sascha ; Hamelmann, Frank
; Karashanova, Daniela ; Gesheva,
Kostadinka: Study of Sputtered Barium Strontium Titanate Films for Energy
Harvesting Applications. In: Advanced Materials Letters Bd. 11, International
Association of Advanced Materials (2020), Nr. 10, S. 1–7'
ama: Aleksandrova M, Ivanova T, Koch S, Hamelmann F, Karashanova D, Gesheva K. Study
of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications.
Advanced Materials Letters. 2020;11(10):1-7. doi:10.5185/amlett.2020.101567
apa: Aleksandrova, M., Ivanova, T., Koch, S., Hamelmann, F., Karashanova, D., &
Gesheva, K. (2020). Study of Sputtered Barium Strontium Titanate Films for Energy
Harvesting Applications. Advanced Materials Letters, 11(10), 1–7.
https://doi.org/10.5185/amlett.2020.101567
bibtex: '@article{Aleksandrova_Ivanova_Koch_Hamelmann_Karashanova_Gesheva_2020,
title={Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting
Applications}, volume={11}, DOI={10.5185/amlett.2020.101567},
number={10}, journal={Advanced Materials Letters}, publisher={International Association
of Advanced Materials}, author={Aleksandrova, Mariya and Ivanova, Tatyana and
Koch, Sascha and Hamelmann, Frank and Karashanova, Daniela and Gesheva, Kostadinka},
year={2020}, pages={1–7} }'
chicago: 'Aleksandrova, Mariya, Tatyana Ivanova, Sascha Koch, Frank Hamelmann, Daniela
Karashanova, and Kostadinka Gesheva. “Study of Sputtered Barium Strontium Titanate
Films for Energy Harvesting Applications.” Advanced Materials Letters 11,
no. 10 (2020): 1–7. https://doi.org/10.5185/amlett.2020.101567.'
ieee: M. Aleksandrova, T. Ivanova, S. Koch, F. Hamelmann, D. Karashanova, and K.
Gesheva, “Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting
Applications,” Advanced Materials Letters, vol. 11, no. 10, pp. 1–7, 2020.
mla: Aleksandrova, Mariya, et al. “Study of Sputtered Barium Strontium Titanate
Films for Energy Harvesting Applications.” Advanced Materials Letters,
vol. 11, no. 10, International Association of Advanced Materials, 2020, pp. 1–7,
doi:10.5185/amlett.2020.101567.
short: M. Aleksandrova, T. Ivanova, S. Koch, F. Hamelmann, D. Karashanova, K. Gesheva,
Advanced Materials Letters 11 (2020) 1–7.
date_created: 2023-08-31T13:34:32Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.5185/amlett.2020.101567
intvolume: ' 11'
issue: '10'
language:
- iso: eng
page: 1-7
publication: Advanced Materials Letters
publication_identifier:
eissn:
- 0976-397X
publication_status: published
publisher: International Association of Advanced Materials
status: public
title: Study of Sputtered Barium Strontium Titanate Films for Energy Harvesting Applications
type: journal_article
user_id: '245590'
volume: 11
year: '2020'
...
---
_id: '3507'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: J.
full_name: Zhang, J.
last_name: Zhang
- first_name: K.
full_name: Ding, K.
last_name: Ding
- first_name: S.
full_name: Hempelmann, S.
last_name: Hempelmann
- first_name: M.
full_name: Diehl, M.
last_name: Diehl
- first_name: T.
full_name: Pfeil, T.
last_name: Pfeil
- first_name: S.
full_name: Brandt, S.
last_name: Brandt
- first_name: W.
full_name: Friedrich, W.
last_name: Friedrich
- first_name: N.
full_name: Amin, N.
last_name: Amin
citation:
alphadin: 'Feng,
Li ; Hamelmann, Frank ; Zhang, J. ; Ding,
K. ; Hempelmann, S. ; Diehl, M. ; Pfeil,
T. ; Brandt, S. ; u. a.:
Performance Analysis of Polycrystalline Module Based on Faults Causes. In: :
WIP, 2020'
ama: 'Feng L, Hamelmann F, Zhang J, et al. Performance Analysis of Polycrystalline
Module Based on Faults Causes. In: WIP; 2020. doi:10.4229/EUPVSEC20202020-4AV.2.50'
apa: 'Feng, L., Hamelmann, F., Zhang, J., Ding, K., Hempelmann, S., Diehl, M., …
Amin, N. (2020). Performance Analysis of Polycrystalline Module Based on Faults
Causes. Presented at the 37th European Photovoltaic Solar Energy Conference and
Exhibition, Lisbon, Portugal: WIP. https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50'
bibtex: '@inproceedings{Feng_Hamelmann_Zhang_Ding_Hempelmann_Diehl_Pfeil_Brandt_Friedrich_Amin_2020,
title={Performance Analysis of Polycrystalline Module Based on Faults Causes},
DOI={10.4229/EUPVSEC20202020-4AV.2.50},
publisher={WIP}, author={Feng, Li and Hamelmann, Frank and Zhang, J. and Ding,
K. and Hempelmann, S. and Diehl, M. and Pfeil, T. and Brandt, S. and Friedrich,
W. and Amin, N.}, year={2020} }'
chicago: Feng, Li, Frank Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl,
T. Pfeil, S. Brandt, W. Friedrich, and N. Amin. “Performance Analysis of Polycrystalline
Module Based on Faults Causes.” WIP, 2020. https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50.
ieee: L. Feng et al., “Performance Analysis of Polycrystalline Module Based
on Faults Causes,” presented at the 37th European Photovoltaic Solar Energy Conference
and Exhibition, Lisbon, Portugal, 2020.
mla: Feng, Li, et al. Performance Analysis of Polycrystalline Module Based on
Faults Causes. WIP, 2020, doi:10.4229/EUPVSEC20202020-4AV.2.50.
short: 'L. Feng, F. Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil,
S. Brandt, W. Friedrich, N. Amin, in: WIP, 2020.'
conference:
end_date: 2020-09-11
location: Lisbon, Portugal
name: 37th European Photovoltaic Solar Energy Conference and Exhibition
start_date: 2020-09-07
date_created: 2023-09-01T08:32:56Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.4229/EUPVSEC20202020-4AV.2.50
jel:
- C6
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://www.researchgate.net/publication/344960005_PERFORMANCE_ANALYSIS_OF_POLYCRYSTALLINE_MODULE_BASED_ON_FAULTS_CAUSES
oa: '1'
publication_status: published
publisher: WIP
status: public
title: Performance Analysis of Polycrystalline Module Based on Faults Causes
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3508'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Yongjie
full_name: Liu, Yongjie
last_name: Liu
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Liu, Yongjie ; Ding,
Kun ; Feng, Li ; Hamelmann,
Frank ; Chen, Xiang: Model
Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In:
47th IEEE Photovoltaic Specialists Conference (PVSC) : IEEE, 2020, S. 2509–2512'
ama: 'Zhang J, Liu Y, Ding K, Feng L, Hamelmann F, Chen X. Model Parameter Analysis
of Cracked Photovoltaic Module under Outdoor Conditions. In: 47th IEEE Photovoltaic
Specialists Conference (PVSC). IEEE; 2020:2509-2512. doi:10.1109/PVSC45281.2020.9300720'
apa: 'Zhang, J., Liu, Y., Ding, K., Feng, L., Hamelmann, F., & Chen, X. (2020).
Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.
In 47th IEEE Photovoltaic Specialists Conference (PVSC) (pp. 2509–2512).
Calgary, AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300720'
bibtex: '@inproceedings{Zhang_Liu_Ding_Feng_Hamelmann_Chen_2020, title={Model Parameter
Analysis of Cracked Photovoltaic Module under Outdoor Conditions}, DOI={10.1109/PVSC45281.2020.9300720},
booktitle={47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Zhang, Jingwei and Liu, Yongjie and Ding, Kun and Feng, Li and Hamelmann,
Frank and Chen, Xiang}, year={2020}, pages={2509–2512} }'
chicago: Zhang, Jingwei, Yongjie Liu, Kun Ding, Li Feng, Frank Hamelmann, and Xiang
Chen. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.”
In 47th IEEE Photovoltaic Specialists Conference (PVSC), 2509–12. IEEE,
2020. https://doi.org/10.1109/PVSC45281.2020.9300720.
ieee: J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, and X. Chen, “Model Parameter
Analysis of Cracked Photovoltaic Module under Outdoor Conditions,” in 47th
IEEE Photovoltaic Specialists Conference (PVSC), Calgary, AB, Canada, 2020,
pp. 2509–2512.
mla: Zhang, Jingwei, et al. “Model Parameter Analysis of Cracked Photovoltaic Module
under Outdoor Conditions.” 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2509–12, doi:10.1109/PVSC45281.2020.9300720.
short: 'J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, X. Chen, in: 47th IEEE
Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2509–2512.'
conference:
end_date: 2020-08-21
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
start_date: 2020-06-15
date_created: 2023-09-01T08:36:48Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300720
language:
- iso: eng
page: 2509-2512
publication: 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3509'
author:
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Shuai
full_name: Weng, Shuai
last_name: Weng
citation:
alphadin: 'Ding, Kun ; Chen,
Xiang ; Zhang, Jingwei ;
Feng, Li ; Hamelmann,
Frank ; Weng, Shuai: Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM. In: 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC) : IEEE, 2020, S. 2532–2537'
ama: 'Ding K, Chen X, Zhang J, Feng L, Hamelmann F, Weng S. Photovoltaic Array Power
Prediction Model Based on EEMD and PSO-KELM. In: 2020 47th IEEE Photovoltaic
Specialists Conference (PVSC). IEEE; 2020:2532-2537. doi:10.1109/PVSC45281.2020.9300587'
apa: 'Ding, K., Chen, X., Zhang, J., Feng, L., Hamelmann, F., & Weng, S. (2020).
Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In 2020
47th IEEE Photovoltaic Specialists Conference (PVSC) (pp. 2532–2537). Calgary,
AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300587'
bibtex: '@inproceedings{Ding_Chen_Zhang_Feng_Hamelmann_Weng_2020, title={Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM}, DOI={10.1109/PVSC45281.2020.9300587},
booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Ding, Kun and Chen, Xiang and Zhang, Jingwei and Feng, Li and Hamelmann,
Frank and Weng, Shuai}, year={2020}, pages={2532–2537} }'
chicago: Ding, Kun, Xiang Chen, Jingwei Zhang, Li Feng, Frank Hamelmann, and Shuai
Weng. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.”
In 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 2532–37.
IEEE, 2020. https://doi.org/10.1109/PVSC45281.2020.9300587.
ieee: K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, and S. Weng, “Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM,” in 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC), Calgary, AB, Canada, 2020, pp.
2532–2537.
mla: Ding, Kun, et al. “Photovoltaic Array Power Prediction Model Based on EEMD
and PSO-KELM.” 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2532–37, doi:10.1109/PVSC45281.2020.9300587.
short: 'K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, S. Weng, in: 2020 47th
IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2532–2537.'
conference:
end_date: 2020-08-21
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
start_date: 2020-06-15
date_created: 2023-09-01T08:38:39Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300587
language:
- iso: eng
page: 2532-2537
publication: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3510'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Matthias
full_name: Diehl, Matthias
last_name: Diehl
- first_name: Thomas
full_name: Pfeil, Thomas
last_name: Pfeil
- first_name: Steffen
full_name: Brandt, Steffen
last_name: Brandt
- first_name: Werner
full_name: Friedrich, Werner
last_name: Friedrich
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
citation:
alphadin: 'Feng,
Li ; Hamelmann, Frank ; Zhang, Jingwei ; Ding,
Kun ; Diehl, Matthias ; Pfeil, Thomas ; Brandt,
Steffen ; Friedrich, Werner
; u. a.: A Novel Method to Evaluate Irradiance in PV Field without Irradiance
Sensors. In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) :
IEEE, 2020, S. 2496–2501'
ama: 'Feng L, Hamelmann F, Zhang J, et al. A Novel Method to Evaluate Irradiance
in PV Field without Irradiance Sensors. In: 2020 47th IEEE Photovoltaic Specialists
Conference (PVSC). IEEE; 2020:2496-2501. doi:10.1109/PVSC45281.2020.9300796'
apa: 'Feng, L., Hamelmann, F., Zhang, J., Ding, K., Diehl, M., Pfeil, T., … Amin,
N. (2020). A Novel Method to Evaluate Irradiance in PV Field without Irradiance
Sensors. In 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) (pp.
2496–2501). Calgary, AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300796'
bibtex: '@inproceedings{Feng_Hamelmann_Zhang_Ding_Diehl_Pfeil_Brandt_Friedrich_Amin_2020,
title={A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors},
DOI={10.1109/PVSC45281.2020.9300796},
booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Feng, Li and Hamelmann, Frank and Zhang, Jingwei and Ding, Kun and Diehl,
Matthias and Pfeil, Thomas and Brandt, Steffen and Friedrich, Werner and Amin,
Nowshad}, year={2020}, pages={2496–2501} }'
chicago: Feng, Li, Frank Hamelmann, Jingwei Zhang, Kun Ding, Matthias Diehl, Thomas
Pfeil, Steffen Brandt, Werner Friedrich, and Nowshad Amin. “A Novel Method to
Evaluate Irradiance in PV Field without Irradiance Sensors.” In 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC), 2496–2501. IEEE, 2020. https://doi.org/10.1109/PVSC45281.2020.9300796.
ieee: L. Feng et al., “A Novel Method to Evaluate Irradiance in PV Field
without Irradiance Sensors,” in 2020 47th IEEE Photovoltaic Specialists Conference
(PVSC), Calgary, AB, Canada, 2020, pp. 2496–2501.
mla: Feng, Li, et al. “A Novel Method to Evaluate Irradiance in PV Field without
Irradiance Sensors.” 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2496–501, doi:10.1109/PVSC45281.2020.9300796.
short: 'L. Feng, F. Hamelmann, J. Zhang, K. Ding, M. Diehl, T. Pfeil, S. Brandt,
W. Friedrich, N. Amin, in: 2020 47th IEEE Photovoltaic Specialists Conference
(PVSC), IEEE, 2020, pp. 2496–2501.'
conference:
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
date_created: 2023-09-01T08:39:42Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300796
language:
- iso: eng
page: 2496-2501
publication: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors
type: conference
user_id: '245590'
year: '2020'
...
---
_id: '3511'
article_number: '650'
author:
- first_name: Mariya
full_name: Aleksandrova, Mariya
last_name: Aleksandrova
- first_name: Tatyana
full_name: Ivanova, Tatyana
last_name: Ivanova
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Velichka
full_name: Strijkova, Velichka
last_name: Strijkova
- first_name: Kostadinka
full_name: Gesheva, Kostadinka
last_name: Gesheva
citation:
alphadin: 'Aleksandrova, Mariya ;
Ivanova, Tatyana ; Hamelmann,
Frank ; Strijkova, Velichka
; Gesheva, Kostadinka: Study of
Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications. In: Coatings
Bd. 10, MDPI AG (2020), Nr. 7'
ama: Aleksandrova M, Ivanova T, Hamelmann F, Strijkova V, Gesheva K. Study of Sputtered
ZnO:Ga2O3 Films for Energy Harvesting Applications. Coatings. 2020;10(7).
doi:10.3390/coatings10070650
apa: Aleksandrova, M., Ivanova, T., Hamelmann, F., Strijkova, V., & Gesheva,
K. (2020). Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications.
Coatings, 10(7). https://doi.org/10.3390/coatings10070650
bibtex: '@article{Aleksandrova_Ivanova_Hamelmann_Strijkova_Gesheva_2020, title={Study
of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications}, volume={10},
DOI={10.3390/coatings10070650},
number={7650}, journal={Coatings}, publisher={MDPI AG}, author={Aleksandrova,
Mariya and Ivanova, Tatyana and Hamelmann, Frank and Strijkova, Velichka and Gesheva,
Kostadinka}, year={2020} }'
chicago: Aleksandrova, Mariya, Tatyana Ivanova, Frank Hamelmann, Velichka Strijkova,
and Kostadinka Gesheva. “Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting
Applications.” Coatings 10, no. 7 (2020). https://doi.org/10.3390/coatings10070650.
ieee: M. Aleksandrova, T. Ivanova, F. Hamelmann, V. Strijkova, and K. Gesheva, “Study
of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications,” Coatings,
vol. 10, no. 7, 2020.
mla: Aleksandrova, Mariya, et al. “Study of Sputtered ZnO:Ga2O3 Films for Energy
Harvesting Applications.” Coatings, vol. 10, no. 7, 650, MDPI AG, 2020,
doi:10.3390/coatings10070650.
short: M. Aleksandrova, T. Ivanova, F. Hamelmann, V. Strijkova, K. Gesheva, Coatings
10 (2020).
date_created: 2023-09-01T08:41:28Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.3390/coatings10070650
intvolume: ' 10'
issue: '7'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://doi.org/10.3390/coatings10070650
oa: '1'
publication: Coatings
publication_identifier:
eissn:
- 2079-6412
publication_status: published
publisher: MDPI AG
status: public
title: Study of Sputtered ZnO:Ga2O3 Films for Energy Harvesting Applications
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '245590'
volume: 10
year: '2020'
...
---
_id: '3562'
alternative_id:
- '3670'
author:
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
- first_name: Johannes
full_name: Weicht, Johannes
last_name: Weicht
- first_name: Klaus
full_name: Schlender, Klaus
last_name: Schlender
- first_name: Florian
full_name: Fehring, Florian
last_name: Fehring
- first_name: Rouven
full_name: Dreimann, Rouven
last_name: Dreimann
- first_name: Michael
full_name: Meese, Michael
last_name: Meese
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Christoph
full_name: Thiel, Christoph
last_name: Thiel
- first_name: Thorsten
full_name: Försterling, Thorsten
last_name: Försterling
- first_name: Marc
full_name: Wübbenhorst, Marc
last_name: Wübbenhorst
citation:
alphadin: 'Behrens,
Grit ; Weicht, Johannes ;
Schlender, Klaus ; Fehring,
Florian ; Dreimann, Rouven
; Meese, Michael ; Hamelmann,
Frank ; Thiel, Christoph
; u. a.: Smart Monitoring System of Air Quality and Wall Humidity Accompanying
an Energy Efficient Renovation Process of Apartment Buildings. In: Otjacques,
B. ; Hitzelberger, P. ; Naumann, S. ; Wohlgemuth,
V. (Hrsg.): From Science to Society, Progress in IS. Cham :
Springer International Publishing, 2018, S. 181–189'
ama: 'Behrens G, Weicht J, Schlender K, et al. Smart Monitoring System of Air Quality
and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment
Buildings. In: Otjacques B, Hitzelberger P, Naumann S, Wohlgemuth V, eds. From
Science to Society. Progress in IS. Cham: Springer International Publishing;
2018:181-189. doi:10.1007/978-3-319-65687-8_16'
apa: 'Behrens, G., Weicht, J., Schlender, K., Fehring, F., Dreimann, R., Meese,
M., … Wübbenhorst, M. (2018). Smart Monitoring System of Air Quality and Wall
Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings.
In B. Otjacques, P. Hitzelberger, S. Naumann, & V. Wohlgemuth (Eds.), From
Science to Society (pp. 181–189). Cham: Springer International Publishing.
https://doi.org/10.1007/978-3-319-65687-8_16'
bibtex: '@inbook{Behrens_Weicht_Schlender_Fehring_Dreimann_Meese_Hamelmann_Thiel_Försterling_Wübbenhorst_2018,
place={Cham}, series={Progress in IS}, title={Smart Monitoring System of Air Quality
and Wall Humidity Accompanying an Energy Efficient Renovation Process of Apartment
Buildings}, DOI={10.1007/978-3-319-65687-8_16},
booktitle={From Science to Society}, publisher={Springer International Publishing},
author={Behrens, Grit and Weicht, Johannes and Schlender, Klaus and Fehring, Florian
and Dreimann, Rouven and Meese, Michael and Hamelmann, Frank and Thiel, Christoph
and Försterling, Thorsten and Wübbenhorst, Marc}, editor={Otjacques, Benoît and
Hitzelberger, Patrik and Naumann, Stefan and Wohlgemuth, VolkerEditors}, year={2018},
pages={181–189}, collection={Progress in IS} }'
chicago: 'Behrens, Grit, Johannes Weicht, Klaus Schlender, Florian Fehring, Rouven
Dreimann, Michael Meese, Frank Hamelmann, Christoph Thiel, Thorsten Försterling,
and Marc Wübbenhorst. “Smart Monitoring System of Air Quality and Wall Humidity
Accompanying an Energy Efficient Renovation Process of Apartment Buildings.” In
From Science to Society, edited by Benoît Otjacques, Patrik Hitzelberger,
Stefan Naumann, and Volker Wohlgemuth, 181–89. Progress in IS. Cham: Springer
International Publishing, 2018. https://doi.org/10.1007/978-3-319-65687-8_16.'
ieee: 'G. Behrens et al., “Smart Monitoring System of Air Quality and Wall
Humidity Accompanying an Energy Efficient Renovation Process of Apartment Buildings,”
in From Science to Society, B. Otjacques, P. Hitzelberger, S. Naumann,
and V. Wohlgemuth, Eds. Cham: Springer International Publishing, 2018, pp. 181–189.'
mla: Behrens, Grit, et al. “Smart Monitoring System of Air Quality and Wall Humidity
Accompanying an Energy Efficient Renovation Process of Apartment Buildings.” From
Science to Society, edited by Benoît Otjacques et al., Springer International
Publishing, 2018, pp. 181–89, doi:10.1007/978-3-319-65687-8_16.
short: 'G. Behrens, J. Weicht, K. Schlender, F. Fehring, R. Dreimann, M. Meese,
F. Hamelmann, C. Thiel, T. Försterling, M. Wübbenhorst, in: B. Otjacques, P. Hitzelberger,
S. Naumann, V. Wohlgemuth (Eds.), From Science to Society, Springer International
Publishing, Cham, 2018, pp. 181–189.'
date_created: 2023-09-01T12:09:55Z
date_updated: 2026-03-17T15:28:46Z
doi: 10.1007/978-3-319-65687-8_16
editor:
- first_name: Benoît
full_name: Otjacques, Benoît
last_name: Otjacques
- first_name: Patrik
full_name: Hitzelberger, Patrik
last_name: Hitzelberger
- first_name: Stefan
full_name: Naumann, Stefan
last_name: Naumann
- first_name: Volker
full_name: Wohlgemuth, Volker
last_name: Wohlgemuth
language:
- iso: eng
page: 181-189
place: Cham
publication: From Science to Society
publication_identifier:
eisbn:
- 978-3-319-65687-8
eissn:
- 2196-8713
isbn:
- 978-3-319-65686-1
issn:
- 2196-8705
publication_status: published
publisher: Springer International Publishing
series_title: Progress in IS
status: public
title: Smart Monitoring System of Air Quality and Wall Humidity Accompanying an Energy
Efficient Renovation Process of Apartment Buildings
type: book_chapter
user_id: '231260'
year: '2018'
...
---
_id: '3512'
article_number: '012001'
author:
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Hamelmann, Frank: Thin
film zinc oxide deposited by CVD and PVD. In: Journal of Physics: Conference
Series Bd. 764, IOP Publishing (2016)'
ama: 'Hamelmann F. Thin film zinc oxide deposited by CVD and PVD. Journal of
Physics: Conference Series. 2016;764. doi:10.1088/1742-6596/764/1/012001'
apa: 'Hamelmann, F. (2016). Thin film zinc oxide deposited by CVD and PVD. Journal
of Physics: Conference Series, 764. https://doi.org/10.1088/1742-6596/764/1/012001'
bibtex: '@article{Hamelmann_2016, title={Thin film zinc oxide deposited by CVD and
PVD}, volume={764}, DOI={10.1088/1742-6596/764/1/012001},
number={012001}, journal={Journal of Physics: Conference Series}, publisher={IOP
Publishing}, author={Hamelmann, Frank}, year={2016} }'
chicago: 'Hamelmann, Frank. “Thin Film Zinc Oxide Deposited by CVD and PVD.” Journal
of Physics: Conference Series 764 (2016). https://doi.org/10.1088/1742-6596/764/1/012001.'
ieee: 'F. Hamelmann, “Thin film zinc oxide deposited by CVD and PVD,” Journal
of Physics: Conference Series, vol. 764, 2016.'
mla: 'Hamelmann, Frank. “Thin Film Zinc Oxide Deposited by CVD and PVD.” Journal
of Physics: Conference Series, vol. 764, 012001, IOP Publishing, 2016, doi:10.1088/1742-6596/764/1/012001.'
short: 'F. Hamelmann, Journal of Physics: Conference Series 764 (2016).'
date_created: 2023-09-01T08:44:14Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1088/1742-6596/764/1/012001
intvolume: ' 764'
language:
- iso: eng
main_file_link:
- url: https://doi.org/10.1088/1742-6596/764/1/012001
publication: 'Journal of Physics: Conference Series'
publication_identifier:
eissn:
- 1742-6596
issn:
- 1742-6588
publication_status: published
publisher: IOP Publishing
status: public
title: Thin film zinc oxide deposited by CVD and PVD
type: journal_article
user_id: '245590'
volume: 764
year: '2016'
...
---
_id: '3515'
article_number: '012017'
author:
- first_name: J A
full_name: Weicht, J A
last_name: Weicht
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
citation:
alphadin: 'Weicht, J A ; Hamelmann,
Frank ; Behrens, Grit: Simulation
of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the
diode equivalent circuit. In: Journal of Physics: Conference Series Bd.
682, IOP Publishing (2016)'
ama: 'Weicht JA, Hamelmann F, Behrens G. Simulation of light-induced degradation
of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. Journal
of Physics: Conference Series. 2016;682. doi:10.1088/1742-6596/682/1/012017'
apa: 'Weicht, J. A., Hamelmann, F., & Behrens, G. (2016). Simulation of light-induced
degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent
circuit. Journal of Physics: Conference Series, 682. https://doi.org/10.1088/1742-6596/682/1/012017'
bibtex: '@article{Weicht_Hamelmann_Behrens_2016, title={Simulation of light-induced
degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent
circuit}, volume={682}, DOI={10.1088/1742-6596/682/1/012017},
number={012017}, journal={Journal of Physics: Conference Series}, publisher={IOP
Publishing}, author={Weicht, J A and Hamelmann, Frank and Behrens, Grit}, year={2016}
}'
chicago: 'Weicht, J A, Frank Hamelmann, and Grit Behrens. “Simulation of Light-Induced
Degradation of Μc-Si in a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent
Circuit.” Journal of Physics: Conference Series 682 (2016). https://doi.org/10.1088/1742-6596/682/1/012017.'
ieee: 'J. A. Weicht, F. Hamelmann, and G. Behrens, “Simulation of light-induced
degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent
circuit,” Journal of Physics: Conference Series, vol. 682, 2016.'
mla: 'Weicht, J. A., et al. “Simulation of Light-Induced Degradation of Μc-Si in
a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent Circuit.” Journal of
Physics: Conference Series, vol. 682, 012017, IOP Publishing, 2016, doi:10.1088/1742-6596/682/1/012017.'
short: 'J.A. Weicht, F. Hamelmann, G. Behrens, Journal of Physics: Conference Series
682 (2016).'
date_created: 2023-09-01T08:48:31Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1088/1742-6596/682/1/012017
intvolume: ' 682'
language:
- iso: eng
main_file_link:
- url: https://doi.org/10.1088/1742-6596/682/1/012017
publication: 'Journal of Physics: Conference Series'
publication_identifier:
eissn:
- 1742-6596
issn:
- 1742-6588
publication_status: published
publisher: IOP Publishing
status: public
title: Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar
cells by the diode equivalent circuit
type: journal_article
user_id: '237837'
volume: 682
year: '2016'
...
---
_id: '3516'
article_number: '012002'
author:
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: J A
full_name: Weicht, J A
last_name: Weicht
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
citation:
alphadin: 'Hamelmann, Frank ; Weicht, J A ; Behrens,
Grit: Light-Induced Degradation of Thin Film Silicon Solar Cells. In: Journal
of Physics: Conference Series Bd. 682, IOP Publishing (2016)'
ama: 'Hamelmann F, Weicht JA, Behrens G. Light-Induced Degradation of Thin Film
Silicon Solar Cells. Journal of Physics: Conference Series. 2016;682. doi:10.1088/1742-6596/682/1/012002'
apa: 'Hamelmann, F., Weicht, J. A., & Behrens, G. (2016). Light-Induced Degradation
of Thin Film Silicon Solar Cells. Journal of Physics: Conference Series,
682. https://doi.org/10.1088/1742-6596/682/1/012002'
bibtex: '@article{Hamelmann_Weicht_Behrens_2016, title={Light-Induced Degradation
of Thin Film Silicon Solar Cells}, volume={682}, DOI={10.1088/1742-6596/682/1/012002},
number={012002}, journal={Journal of Physics: Conference Series}, publisher={IOP
Publishing}, author={Hamelmann, Frank and Weicht, J A and Behrens, Grit}, year={2016}
}'
chicago: 'Hamelmann, Frank, J A Weicht, and Grit Behrens. “Light-Induced Degradation
of Thin Film Silicon Solar Cells.” Journal of Physics: Conference Series
682 (2016). https://doi.org/10.1088/1742-6596/682/1/012002.'
ieee: 'F. Hamelmann, J. A. Weicht, and G. Behrens, “Light-Induced Degradation of
Thin Film Silicon Solar Cells,” Journal of Physics: Conference Series,
vol. 682, 2016.'
mla: 'Hamelmann, Frank, et al. “Light-Induced Degradation of Thin Film Silicon Solar
Cells.” Journal of Physics: Conference Series, vol. 682, 012002, IOP Publishing,
2016, doi:10.1088/1742-6596/682/1/012002.'
short: 'F. Hamelmann, J.A. Weicht, G. Behrens, Journal of Physics: Conference Series
682 (2016).'
date_created: 2023-09-01T08:49:18Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1088/1742-6596/682/1/012002
intvolume: ' 682'
language:
- iso: eng
main_file_link:
- url: https://doi.org/10.1088/1742-6596/682/1/012002
publication: 'Journal of Physics: Conference Series'
publication_identifier:
eissn:
- 1742-6596
issn:
- 1742-6588
publication_status: published
publisher: IOP Publishing
status: public
title: Light-Induced Degradation of Thin Film Silicon Solar Cells
type: journal_article
user_id: '237837'
volume: 682
year: '2016'
...
---
_id: '171'
alternative_id:
- '3513'
author:
- first_name: Johannes
full_name: Weicht, Johannes
last_name: Weicht
- first_name: Robin
full_name: Rasch, Robin
id: '221232'
last_name: Rasch
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Weicht, Johannes ; Rasch, Robin ; Behrens,
Grit ; Hamelmann, Frank:
Performance characterization of thin-film-silicon based solar modules under clouded
and clear sky conditions in comparison to crystalline silicon modules. In: Electronic
Materials Letters Bd. 12 (2016), Nr. 4, S. 468–471'
ama: Weicht J, Rasch R, Behrens G, Hamelmann F. Performance characterization of
thin-film-silicon based solar modules under clouded and clear sky conditions in
comparison to crystalline silicon modules. Electronic Materials Letters.
2016;12(4):468-471. doi:10.1007/s13391-016-4008-x
apa: Weicht, J., Rasch, R., Behrens, G., & Hamelmann, F. (2016). Performance
characterization of thin-film-silicon based solar modules under clouded and clear
sky conditions in comparison to crystalline silicon modules. Electronic Materials
Letters, 12(4), 468–471. https://doi.org/10.1007/s13391-016-4008-x
bibtex: '@article{Weicht_Rasch_Behrens_Hamelmann_2016, title={Performance characterization
of thin-film-silicon based solar modules under clouded and clear sky conditions
in comparison to crystalline silicon modules}, volume={12}, DOI={10.1007/s13391-016-4008-x},
number={4}, journal={Electronic Materials Letters}, author={Weicht, Johannes and
Rasch, Robin and Behrens, Grit and Hamelmann, Frank}, year={2016}, pages={468–471}
}'
chicago: 'Weicht, Johannes, Robin Rasch, Grit Behrens, and Frank Hamelmann. “Performance
Characterization of Thin-Film-Silicon Based Solar Modules under Clouded and Clear
Sky Conditions in Comparison to Crystalline Silicon Modules.” Electronic Materials
Letters 12, no. 4 (2016): 468–71. https://doi.org/10.1007/s13391-016-4008-x.'
ieee: J. Weicht, R. Rasch, G. Behrens, and F. Hamelmann, “Performance characterization
of thin-film-silicon based solar modules under clouded and clear sky conditions
in comparison to crystalline silicon modules,” Electronic Materials Letters,
vol. 12, no. 4, pp. 468–471, 2016.
mla: Weicht, Johannes, et al. “Performance Characterization of Thin-Film-Silicon
Based Solar Modules under Clouded and Clear Sky Conditions in Comparison to Crystalline
Silicon Modules.” Electronic Materials Letters, vol. 12, no. 4, 2016, pp.
468–71, doi:10.1007/s13391-016-4008-x.
short: J. Weicht, R. Rasch, G. Behrens, F. Hamelmann, Electronic Materials Letters
12 (2016) 468–471.
date_created: 2019-04-17T12:25:45Z
date_updated: 2026-03-17T15:28:24Z
doi: 10.1007/s13391-016-4008-x
intvolume: ' 12'
issue: '4'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://rdcu.be/dluHK
oa: '1'
page: 468-471
publication: Electronic Materials Letters
status: public
title: Performance characterization of thin-film-silicon based solar modules under
clouded and clear sky conditions in comparison to crystalline silicon modules
type: journal_article
user_id: '237837'
volume: 12
year: '2016'
...
---
_id: '175'
alternative_id:
- '3514'
author:
- first_name: Johannes
full_name: Weicht, Johannes
last_name: Weicht
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
orcid_put_code_url: https://api.orcid.org/v2.0/0009-0009-0247-8204/work/184175890
citation:
alphadin: 'Weicht, Johannes ; Hamelmann, Frank ; Behrens,
Grit: Changes in temperature-coefficient of the diode model caused by light-induced
degradation of a-Si/μc-Si solar cells. In: , 2016'
ama: 'Weicht J, Hamelmann F, Behrens G. Changes in temperature-coefficient of the
diode model caused by light-induced degradation of a-Si/μc-Si solar cells. In:
; 2016. doi:10.4229/EUPVSEC20162016-3DV.1.4'
apa: Weicht, J., Hamelmann, F., & Behrens, G. (2016). Changes in temperature-coefficient
of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells.
Presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition,
München. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4
bibtex: '@inproceedings{Weicht_Hamelmann_Behrens_2016, title={Changes in temperature-coefficient
of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells},
DOI={10.4229/EUPVSEC20162016-3DV.1.4},
author={Weicht, Johannes and Hamelmann, Frank and Behrens, Grit}, year={2016}
}'
chicago: Weicht, Johannes, Frank Hamelmann, and Grit Behrens. “Changes in Temperature-Coefficient
of the Diode Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells,”
2016. https://doi.org/10.4229/EUPVSEC20162016-3DV.1.4.
ieee: J. Weicht, F. Hamelmann, and G. Behrens, “Changes in temperature-coefficient
of the diode model caused by light-induced degradation of a-Si/μc-Si solar cells,”
presented at the 32nd European Photovoltaic Solar Energy Conference and Exhibition,
München, 2016.
mla: Weicht, Johannes, et al. Changes in Temperature-Coefficient of the Diode
Model Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells. 2016,
doi:10.4229/EUPVSEC20162016-3DV.1.4.
short: 'J. Weicht, F. Hamelmann, G. Behrens, in: 2016.'
conference:
end_date: 2016-06-24
location: München
name: 32nd European Photovoltaic Solar Energy Conference and Exhibition
start_date: 2016-06-20
date_created: 2019-04-17T13:04:49Z
date_updated: 2026-03-17T15:28:24Z
doi: 10.4229/EUPVSEC20162016-3DV.1.4
language:
- iso: eng
publication_identifier:
issn:
- 2196-100X
status: public
title: Changes in temperature-coefficient of the diode model caused by light-induced
degradation of a-Si/μc-Si solar cells
type: conference
user_id: '231260'
year: '2016'
...
---
_id: '3561'
article_number: '063115'
author:
- first_name: Asiel N.
full_name: Corpus-Mendoza, Asiel N.
last_name: Corpus-Mendoza
- first_name: M. M.
full_name: De Souza, M. M.
last_name: De Souza
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Corpus-Mendoza, Asiel N.
; De Souza, M. M. ; Hamelmann,
Frank: Separation of bulk and contact interface degradation in thin film
silicon solar cells. In: Journal of Renewable and Sustainable Energy Bd.
7, AIP Publishing (2015), Nr. 6'
ama: Corpus-Mendoza AN, De Souza MM, Hamelmann F. Separation of bulk and contact
interface degradation in thin film silicon solar cells. Journal of Renewable
and Sustainable Energy. 2015;7(6). doi:10.1063/1.4936592
apa: Corpus-Mendoza, A. N., De Souza, M. M., & Hamelmann, F. (2015). Separation
of bulk and contact interface degradation in thin film silicon solar cells. Journal
of Renewable and Sustainable Energy, 7(6). https://doi.org/10.1063/1.4936592
bibtex: '@article{Corpus-Mendoza_De Souza_Hamelmann_2015, title={Separation of bulk
and contact interface degradation in thin film silicon solar cells}, volume={7},
DOI={10.1063/1.4936592}, number={6063115},
journal={Journal of Renewable and Sustainable Energy}, publisher={AIP Publishing},
author={Corpus-Mendoza, Asiel N. and De Souza, M. M. and Hamelmann, Frank}, year={2015}
}'
chicago: Corpus-Mendoza, Asiel N., M. M. De Souza, and Frank Hamelmann. “Separation
of Bulk and Contact Interface Degradation in Thin Film Silicon Solar Cells.” Journal
of Renewable and Sustainable Energy 7, no. 6 (2015). https://doi.org/10.1063/1.4936592.
ieee: A. N. Corpus-Mendoza, M. M. De Souza, and F. Hamelmann, “Separation of bulk
and contact interface degradation in thin film silicon solar cells,” Journal
of Renewable and Sustainable Energy, vol. 7, no. 6, 2015.
mla: Corpus-Mendoza, Asiel N., et al. “Separation of Bulk and Contact Interface
Degradation in Thin Film Silicon Solar Cells.” Journal of Renewable and Sustainable
Energy, vol. 7, no. 6, 063115, AIP Publishing, 2015, doi:10.1063/1.4936592.
short: A.N. Corpus-Mendoza, M.M. De Souza, F. Hamelmann, Journal of Renewable and
Sustainable Energy 7 (2015).
date_created: 2023-09-01T12:08:07Z
date_updated: 2026-03-17T15:28:46Z
doi: 10.1063/1.4936592
intvolume: ' 7'
issue: '6'
language:
- iso: eng
publication: Journal of Renewable and Sustainable Energy
publication_identifier:
eissn:
- 1941-7012
publication_status: published
publisher: AIP Publishing
status: public
title: Separation of bulk and contact interface degradation in thin film silicon solar
cells
type: journal_article
user_id: '245590'
volume: 7
year: '2015'
...
---
_id: '3517'
author:
- first_name: Johannes A.
full_name: Weicht, Johannes A.
last_name: Weicht
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
citation:
alphadin: 'Weicht, Johannes A. ; Hamelmann, Frank ; Behrens,
Grit: Changing in irradiation behavior and temperature-coefficient variation
caused by light-induced degradation of a-Si/μc-Si solar cells. In: 2015 IEEE
42nd Photovoltaic Specialist Conference (PVSC) : IEEE, 2015, S. 1–4'
ama: 'Weicht JA, Hamelmann F, Behrens G. Changing in irradiation behavior and temperature-coefficient
variation caused by light-induced degradation of a-Si/μc-Si solar cells. In: 2015
IEEE 42nd Photovoltaic Specialist Conference (PVSC). IEEE; 2015:1-4. doi:10.1109/PVSC.2015.7356298'
apa: 'Weicht, J. A., Hamelmann, F., & Behrens, G. (2015). Changing in irradiation
behavior and temperature-coefficient variation caused by light-induced degradation
of a-Si/μc-Si solar cells. In 2015 IEEE 42nd Photovoltaic Specialist Conference
(PVSC) (pp. 1–4). New Orleans, LA: IEEE. https://doi.org/10.1109/PVSC.2015.7356298'
bibtex: '@inproceedings{Weicht_Hamelmann_Behrens_2015, title={Changing in irradiation
behavior and temperature-coefficient variation caused by light-induced degradation
of a-Si/μc-Si solar cells}, DOI={10.1109/PVSC.2015.7356298},
booktitle={2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)}, publisher={IEEE},
author={Weicht, Johannes A. and Hamelmann, Frank and Behrens, Grit}, year={2015},
pages={1–4} }'
chicago: Weicht, Johannes A., Frank Hamelmann, and Grit Behrens. “Changing in Irradiation
Behavior and Temperature-Coefficient Variation Caused by Light-Induced Degradation
of a-Si/Μc-Si Solar Cells.” In 2015 IEEE 42nd Photovoltaic Specialist Conference
(PVSC), 1–4. IEEE, 2015. https://doi.org/10.1109/PVSC.2015.7356298.
ieee: J. A. Weicht, F. Hamelmann, and G. Behrens, “Changing in irradiation behavior
and temperature-coefficient variation caused by light-induced degradation of a-Si/μc-Si
solar cells,” in 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC),
New Orleans, LA, 2015, pp. 1–4.
mla: Weicht, Johannes A., et al. “Changing in Irradiation Behavior and Temperature-Coefficient
Variation Caused by Light-Induced Degradation of a-Si/Μc-Si Solar Cells.” 2015
IEEE 42nd Photovoltaic Specialist Conference (PVSC), IEEE, 2015, pp. 1–4,
doi:10.1109/PVSC.2015.7356298.
short: 'J.A. Weicht, F. Hamelmann, G. Behrens, in: 2015 IEEE 42nd Photovoltaic Specialist
Conference (PVSC), IEEE, 2015, pp. 1–4.'
conference:
location: New Orleans, LA
name: 2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)
date_created: 2023-09-01T08:50:21Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC.2015.7356298
language:
- iso: eng
page: 1-4
publication: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-4799-7944-8
publication_status: published
publisher: IEEE
status: public
title: Changing in irradiation behavior and temperature-coefficient variation caused
by light-induced degradation of a-Si/μc-Si solar cells
type: conference
user_id: '237837'
year: '2015'
...
---
_id: '3518'
author:
- first_name: J.A.
full_name: Weicht, J.A.
last_name: Weicht
- first_name: Robin
full_name: Rasch, Robin
id: '221232'
last_name: Rasch
- first_name: Grit
full_name: Behrens, Grit
id: '207629'
last_name: Behrens
orcid: 0009-0009-0247-8204
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Weicht, J.A. ; Rasch,
Robin ; Behrens, Grit ; Hamelmann, Frank: Changing of the Parameters
of the “three-Diode Model” by Light-Induced Degradation at Different Degradation
Temperatures of a-Si/µc-Si Solar Cells. In: : WIP, 2015'
ama: 'Weicht JA, Rasch R, Behrens G, Hamelmann F. Changing of the Parameters of
the “three-Diode Model” by Light-Induced Degradation at Different Degradation
Temperatures of a-Si/µc-Si Solar Cells. In: WIP; 2015. doi:10.4229/EUPVSEC20152015-3CV.1.12'
apa: Weicht, J. A., Rasch, R., Behrens, G., & Hamelmann, F. (2015). Changing
of the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different
Degradation Temperatures of a-Si/µc-Si Solar Cells. Presented at the European
Photovoltaic Solar Energy Conference and Exhibition, WIP. https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12
bibtex: '@inproceedings{Weicht_Rasch_Behrens_Hamelmann_2015, title={Changing of
the Parameters of the “three-Diode Model” by Light-Induced Degradation at Different
Degradation Temperatures of a-Si/µc-Si Solar Cells}, DOI={10.4229/EUPVSEC20152015-3CV.1.12},
publisher={WIP}, author={Weicht, J.A. and Rasch, Robin and Behrens, Grit and Hamelmann,
Frank}, year={2015} }'
chicago: Weicht, J.A., Robin Rasch, Grit Behrens, and Frank Hamelmann. “Changing
of the Parameters of the ‘Three-Diode Model’ by Light-Induced Degradation at Different
Degradation Temperatures of a-Si/Μc-Si Solar Cells.” WIP, 2015. https://doi.org/10.4229/EUPVSEC20152015-3CV.1.12.
ieee: J. A. Weicht, R. Rasch, G. Behrens, and F. Hamelmann, “Changing of the Parameters
of the ‘three-Diode Model’ by Light-Induced Degradation at Different Degradation
Temperatures of a-Si/µc-Si Solar Cells,” presented at the European Photovoltaic
Solar Energy Conference and Exhibition, 2015.
mla: Weicht, J. A., et al. Changing of the Parameters of the “Three-Diode Model”
by Light-Induced Degradation at Different Degradation Temperatures of a-Si/Μc-Si
Solar Cells. WIP, 2015, doi:10.4229/EUPVSEC20152015-3CV.1.12.
short: 'J.A. Weicht, R. Rasch, G. Behrens, F. Hamelmann, in: WIP, 2015.'
conference:
name: European Photovoltaic Solar Energy Conference and Exhibition
date_created: 2023-09-01T08:51:36Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.4229/EUPVSEC20152015-3CV.1.12
language:
- iso: eng
publication_status: published
publisher: WIP
status: public
title: Changing of the Parameters of the “three-Diode Model” by Light-Induced Degradation
at Different Degradation Temperatures of a-Si/µc-Si Solar Cells
type: conference
user_id: '237837'
year: '2015'
...