---
_id: '6571'
article_number: '164356'
author:
- first_name: Martin
full_name: Wortmann, Martin
last_name: Wortmann
- first_name: Beatrice
full_name: Bednarz, Beatrice
last_name: Bednarz
- first_name: Negin Beryani
full_name: Nezafat, Negin Beryani
last_name: Nezafat
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
- first_name: Olga
full_name: Kuschel, Olga
last_name: Kuschel
- first_name: Jan
full_name: Schmalhorst, Jan
last_name: Schmalhorst
- first_name: Inga
full_name: Ennen, Inga
last_name: Ennen
- first_name: Maik
full_name: Gärner, Maik
last_name: Gärner
- first_name: Natalie
full_name: Frese, Natalie
id: '257163'
last_name: Frese
- first_name: Gerhard
full_name: Jakob, Gerhard
last_name: Jakob
- first_name: Joachim
full_name: Wollschläger, Joachim
last_name: Wollschläger
- first_name: Gabi
full_name: Schierning, Gabi
last_name: Schierning
- first_name: Andreas
full_name: Hütten, Andreas
last_name: Hütten
- first_name: Timo
full_name: Kuschel, Timo
last_name: Kuschel
citation:
alphadin: 'Wortmann,
Martin ; Bednarz, Beatrice
; Nezafat, Negin Beryani ; Viertel, Klaus ; Kuschel,
Olga ; Schmalhorst, Jan ;
Ennen, Inga ; Gärner,
Maik ; u. a.: Oxidation state depth profiling by self-consistent
fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In:
Applied Surface Science Bd. 713, Elsevier BV (2025)'
ama: Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by
self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum
of SnTe. Applied Surface Science. 2025;713. doi:10.1016/j.apsusc.2025.164356
apa: Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst,
J., … Kuschel, T. (2025). Oxidation state depth profiling by self-consistent fitting
of all emission peaks in the X-ray photoelectron spectrum of SnTe. Applied
Surface Science, 713. https://doi.org/10.1016/j.apsusc.2025.164356
bibtex: '@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et
al._2025, title={Oxidation state depth profiling by self-consistent fitting of
all emission peaks in the X-ray photoelectron spectrum of SnTe}, volume={713},
DOI={10.1016/j.apsusc.2025.164356},
number={164356}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Wortmann,
Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and
Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese,
Natalie and Jakob, Gerhard and et al.}, year={2025} }'
chicago: Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel,
Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling
by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum
of SnTe.” Applied Surface Science 713 (2025). https://doi.org/10.1016/j.apsusc.2025.164356.
ieee: M. Wortmann et al., “Oxidation state depth profiling by self-consistent
fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” Applied
Surface Science, vol. 713, 2025.
mla: Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent
Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” Applied
Surface Science, vol. 713, 164356, Elsevier BV, 2025, doi:10.1016/j.apsusc.2025.164356.
short: M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst,
I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten,
T. Kuschel, Applied Surface Science 713 (2025).
date_created: 2026-02-05T14:19:41Z
date_updated: 2026-03-17T15:29:32Z
doi: 10.1016/j.apsusc.2025.164356
intvolume: ' 713'
language:
- iso: eng
project:
- _id: f89a05bb-bcea-11ed-9442-ed382659bc06
name: Bielefelder Institut für Angewandte Materialforschung
publication: Applied Surface Science
publication_identifier:
issn:
- 0169-4332
publication_status: published
publisher: Elsevier BV
status: public
title: Oxidation state depth profiling by self-consistent fitting of all emission
peaks in the X-ray photoelectron spectrum of SnTe
type: journal_article
user_id: '220548'
volume: 713
year: '2025'
...
---
_id: '6572'
author:
- first_name: Martin
full_name: Wortmann, Martin
last_name: Wortmann
- first_name: Beatrice
full_name: Bednarz, Beatrice
last_name: Bednarz
- first_name: Negin Beryani
full_name: Nezafat, Negin Beryani
last_name: Nezafat
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
- first_name: Olga
full_name: Kuschel, Olga
last_name: Kuschel
- first_name: Jan
full_name: Schmalhorst, Jan
last_name: Schmalhorst
- first_name: Inga
full_name: Ennen, Inga
last_name: Ennen
- first_name: Maik
full_name: Gärner, Maik
last_name: Gärner
- first_name: Natalie
full_name: Frese, Natalie
id: '257163'
last_name: Frese
- first_name: Gerhard
full_name: Jakob, Gerhard
last_name: Jakob
- first_name: Joachim
full_name: Wollschläger, Joachim
last_name: Wollschläger
- first_name: Gabi
full_name: Schierning, Gabi
last_name: Schierning
- first_name: Andreas
full_name: Hütten, Andreas
last_name: Hütten
- first_name: Timo
full_name: Kuschel, Timo
last_name: Kuschel
citation:
alphadin: 'Wortmann,
Martin ; Bednarz, Beatrice
; Nezafat, Negin Beryani ; Viertel, Klaus ; Kuschel,
Olga ; Schmalhorst, Jan ;
Ennen, Inga ; Gärner,
Maik ; u. a.: Surface Oxidation of SnTe Analyzed by Self-Consistent
Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum. In: arXiv,
arXiv (2025)'
ama: Wortmann M, Bednarz B, Nezafat NB, et al. Surface Oxidation of SnTe Analyzed
by Self-Consistent Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum.
arXiv. 2025. doi:10.48550/ARXIV.2504.06875
apa: Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst,
J., … Kuschel, T. (2025). Surface Oxidation of SnTe Analyzed by Self-Consistent
Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum. ArXiv.
https://doi.org/10.48550/ARXIV.2504.06875
bibtex: '@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et
al._2025, title={Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting
of all Emission Peaks in its X-ray Photoelectron Spectrum}, DOI={10.48550/ARXIV.2504.06875},
journal={arXiv}, publisher={arXiv}, author={Wortmann, Martin and Bednarz, Beatrice
and Nezafat, Negin Beryani and Viertel, Klaus and Kuschel, Olga and Schmalhorst,
Jan and Ennen, Inga and Gärner, Maik and Frese, Natalie and Jakob, Gerhard and
et al.}, year={2025} }'
chicago: Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel,
Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Surface Oxidation of SnTe Analyzed
by Self-Consistent Fitting of All Emission Peaks in Its X-Ray Photoelectron Spectrum.”
ArXiv, 2025. https://doi.org/10.48550/ARXIV.2504.06875.
ieee: M. Wortmann et al., “Surface Oxidation of SnTe Analyzed by Self-Consistent
Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum,” arXiv,
2025.
mla: Wortmann, Martin, et al. “Surface Oxidation of SnTe Analyzed by Self-Consistent
Fitting of All Emission Peaks in Its X-Ray Photoelectron Spectrum.” ArXiv,
arXiv, 2025, doi:10.48550/ARXIV.2504.06875.
short: M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst,
I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten,
T. Kuschel, ArXiv (2025).
date_created: 2026-02-05T14:21:55Z
date_updated: 2026-03-17T15:29:32Z
doi: 10.48550/ARXIV.2504.06875
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
project:
- _id: f89a05bb-bcea-11ed-9442-ed382659bc06
name: Bielefelder Institut für Angewandte Materialforschung
publication: arXiv
publication_status: published
publisher: arXiv
status: public
title: Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of all Emission
Peaks in its X-ray Photoelectron Spectrum
type: journal_article
user_id: '220548'
year: '2025'
...
---
_id: '4571'
author:
- first_name: Martin
full_name: Wortmann, Martin
last_name: Wortmann
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
- first_name: Michael
full_name: Westphal, Michael
last_name: Westphal
- first_name: Dominik
full_name: Graulich, Dominik
last_name: Graulich
- first_name: Yang
full_name: Yang, Yang
last_name: Yang
- first_name: Maik
full_name: Gärner, Maik
last_name: Gärner
- first_name: Jan
full_name: Schmalhorst, Jan
last_name: Schmalhorst
- first_name: Natalie
full_name: Frese, Natalie
last_name: Frese
- first_name: Timo
full_name: Kuschel, Timo
last_name: Kuschel
citation:
alphadin: 'Wortmann,
Martin ; Viertel, Klaus ;
Westphal, Michael ; Graulich,
Dominik ; Yang, Yang ; Gärner, Maik ; Schmalhorst,
Jan ; Frese, Natalie ; u. a.:
Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle
X‐Ray Photoelectron Spectra. In: Small Methods Bd. 8, Wiley (2024), Nr. 3'
ama: Wortmann M, Viertel K, Westphal M, et al. Sub‐Nanometer Depth Profiling of
Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.
Small Methods. 2024;8(3). doi:10.1002/smtd.202300944
apa: Wortmann, M., Viertel, K., Westphal, M., Graulich, D., Yang, Y., Gärner, M.,
… Kuschel, T. (2024). Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers
Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. Small Methods, 8(3).
https://doi.org/10.1002/smtd.202300944
bibtex: '@article{Wortmann_Viertel_Westphal_Graulich_Yang_Gärner_Schmalhorst_Frese_Kuschel_2024,
title={Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single
Fixed‐Angle X‐Ray Photoelectron Spectra}, volume={8}, DOI={10.1002/smtd.202300944},
number={3}, journal={Small Methods}, publisher={Wiley}, author={Wortmann, Martin
and Viertel, Klaus and Westphal, Michael and Graulich, Dominik and Yang, Yang
and Gärner, Maik and Schmalhorst, Jan and Frese, Natalie and Kuschel, Timo}, year={2024}
}'
chicago: Wortmann, Martin, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang
Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese, and Timo Kuschel. “Sub‐Nanometer
Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron
Spectra.” Small Methods 8, no. 3 (2024). https://doi.org/10.1002/smtd.202300944.
ieee: M. Wortmann et al., “Sub‐Nanometer Depth Profiling of Native Metal
Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra,” Small
Methods, vol. 8, no. 3, 2024.
mla: Wortmann, Martin, et al. “Sub‐Nanometer Depth Profiling of Native Metal Oxide
Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” Small Methods,
vol. 8, no. 3, Wiley, 2024, doi:10.1002/smtd.202300944.
short: M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J.
Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).
date_created: 2024-05-08T13:37:49Z
date_updated: 2026-03-17T15:29:02Z
doi: 10.1002/smtd.202300944
intvolume: ' 8'
issue: '3'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
publication: Small Methods
publication_identifier:
eissn:
- 2366-9608
issn:
- 2366-9608
publication_status: published
publisher: Wiley
status: public
title: Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle
X‐Ray Photoelectron Spectra
type: journal_article
user_id: '220548'
volume: 8
year: '2024'
...
---
_id: '4569'
article_type: original
author:
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
citation:
alphadin: 'Viertel, Klaus: The development
of the concept of uniform convergence in Karl Weierstrass’s lectures and publications
between 1861 and 1886. In: Archive for History of Exact Sciences Bd. 75,
Springer Science and Business Media LLC (2021), Nr. 4, S. 455–490'
ama: Viertel K. The development of the concept of uniform convergence in Karl Weierstrass’s
lectures and publications between 1861 and 1886. Archive for History of Exact
Sciences. 2021;75(4):455-490. doi:10.1007/s00407-020-00266-9
apa: Viertel, K. (2021). The development of the concept of uniform convergence in
Karl Weierstrass’s lectures and publications between 1861 and 1886. Archive
for History of Exact Sciences, 75(4), 455–490. https://doi.org/10.1007/s00407-020-00266-9
bibtex: '@article{Viertel_2021, title={The development of the concept of uniform
convergence in Karl Weierstrass’s lectures and publications between 1861 and 1886},
volume={75}, DOI={10.1007/s00407-020-00266-9},
number={4}, journal={Archive for History of Exact Sciences}, publisher={Springer
Science and Business Media LLC}, author={Viertel, Klaus}, year={2021}, pages={455–490}
}'
chicago: 'Viertel, Klaus. “The Development of the Concept of Uniform Convergence
in Karl Weierstrass’s Lectures and Publications between 1861 and 1886.” Archive
for History of Exact Sciences 75, no. 4 (2021): 455–90. https://doi.org/10.1007/s00407-020-00266-9.'
ieee: K. Viertel, “The development of the concept of uniform convergence in Karl
Weierstrass’s lectures and publications between 1861 and 1886,” Archive for
History of Exact Sciences, vol. 75, no. 4, pp. 455–490, 2021.
mla: Viertel, Klaus. “The Development of the Concept of Uniform Convergence in Karl
Weierstrass’s Lectures and Publications between 1861 and 1886.” Archive for
History of Exact Sciences, vol. 75, no. 4, Springer Science and Business Media
LLC, 2021, pp. 455–90, doi:10.1007/s00407-020-00266-9.
short: K. Viertel, Archive for History of Exact Sciences 75 (2021) 455–490.
date_created: 2024-05-08T13:34:29Z
date_updated: 2026-03-17T15:29:02Z
doi: 10.1007/s00407-020-00266-9
intvolume: ' 75'
issue: '4'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
page: 455-490
publication: Archive for History of Exact Sciences
publication_identifier:
eissn:
- 1432-0657
issn:
- 0003-9519
publication_status: published
publisher: Springer Science and Business Media LLC
quality_controlled: '1'
status: public
title: The development of the concept of uniform convergence in Karl Weierstrass’s
lectures and publications between 1861 and 1886
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '231260'
volume: 75
year: '2021'
...
---
_id: '4572'
article_number: '121536'
author:
- first_name: Martin
full_name: Wortmann, Martin
last_name: Wortmann
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
- first_name: Alexander
full_name: Welle, Alexander
last_name: Welle
- first_name: Waldemar
full_name: Keil, Waldemar
last_name: Keil
- first_name: Natalie
full_name: Frese, Natalie
last_name: Frese
- first_name: Wiebke
full_name: Hachmann, Wiebke
last_name: Hachmann
- first_name: Philipp
full_name: Krieger, Philipp
last_name: Krieger
- first_name: Johannes
full_name: Brikmann, Johannes
last_name: Brikmann
- first_name: Claudia
full_name: Schmidt, Claudia
last_name: Schmidt
- first_name: Elmar
full_name: Moritzer, Elmar
last_name: Moritzer
- first_name: Bruno
full_name: Hüsgen, Bruno
last_name: Hüsgen
citation:
alphadin: 'Wortmann,
Martin ; Viertel, Klaus ;
Welle, Alexander ; Keil,
Waldemar ; Frese, Natalie
; Hachmann, Wiebke ; Krieger,
Philipp ; Brikmann, Johannes
; u. a.: Anomalous bulk diffusion of methylene diphenyl diisocyanate in
silicone elastomer. In: International Journal of Heat and Mass Transfer
Bd. 177, Elsevier BV (2021)'
ama: Wortmann M, Viertel K, Welle A, et al. Anomalous bulk diffusion of methylene
diphenyl diisocyanate in silicone elastomer. International Journal of Heat
and Mass Transfer. 2021;177. doi:10.1016/j.ijheatmasstransfer.2021.121536
apa: Wortmann, M., Viertel, K., Welle, A., Keil, W., Frese, N., Hachmann, W., …
Hüsgen, B. (2021). Anomalous bulk diffusion of methylene diphenyl diisocyanate
in silicone elastomer. International Journal of Heat and Mass Transfer,
177. https://doi.org/10.1016/j.ijheatmasstransfer.2021.121536
bibtex: '@article{Wortmann_Viertel_Welle_Keil_Frese_Hachmann_Krieger_Brikmann_Schmidt_Moritzer_et
al._2021, title={Anomalous bulk diffusion of methylene diphenyl diisocyanate in
silicone elastomer}, volume={177}, DOI={10.1016/j.ijheatmasstransfer.2021.121536},
number={121536}, journal={International Journal of Heat and Mass Transfer}, publisher={Elsevier
BV}, author={Wortmann, Martin and Viertel, Klaus and Welle, Alexander and Keil,
Waldemar and Frese, Natalie and Hachmann, Wiebke and Krieger, Philipp and Brikmann,
Johannes and Schmidt, Claudia and Moritzer, Elmar and et al.}, year={2021} }'
chicago: Wortmann, Martin, Klaus Viertel, Alexander Welle, Waldemar Keil, Natalie
Frese, Wiebke Hachmann, Philipp Krieger, et al. “Anomalous Bulk Diffusion of Methylene
Diphenyl Diisocyanate in Silicone Elastomer.” International Journal of Heat
and Mass Transfer 177 (2021). https://doi.org/10.1016/j.ijheatmasstransfer.2021.121536.
ieee: M. Wortmann et al., “Anomalous bulk diffusion of methylene diphenyl
diisocyanate in silicone elastomer,” International Journal of Heat and Mass
Transfer, vol. 177, 2021.
mla: Wortmann, Martin, et al. “Anomalous Bulk Diffusion of Methylene Diphenyl Diisocyanate
in Silicone Elastomer.” International Journal of Heat and Mass Transfer,
vol. 177, 121536, Elsevier BV, 2021, doi:10.1016/j.ijheatmasstransfer.2021.121536.
short: M. Wortmann, K. Viertel, A. Welle, W. Keil, N. Frese, W. Hachmann, P. Krieger,
J. Brikmann, C. Schmidt, E. Moritzer, B. Hüsgen, International Journal of Heat
and Mass Transfer 177 (2021).
date_created: 2024-05-08T13:39:05Z
date_updated: 2026-03-17T15:29:02Z
doi: 10.1016/j.ijheatmasstransfer.2021.121536
intvolume: ' 177'
language:
- iso: eng
publication: International Journal of Heat and Mass Transfer
publication_identifier:
issn:
- 0017-9310
publication_status: published
publisher: Elsevier BV
status: public
title: Anomalous bulk diffusion of methylene diphenyl diisocyanate in silicone elastomer
type: journal_article
user_id: '220548'
volume: 177
year: '2021'
...
---
_id: '4570'
author:
- first_name: Klaus
full_name: Viertel, Klaus
id: '215306'
last_name: Viertel
orcid: 0000-0001-8851-8434
citation:
alphadin: 'Viertel, Klaus: Geschichte
der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen des Begriffs in der
Analysis des 19. Jahrhunderts. Wiesbaden : Springer Fachmedien Wiesbaden,
2014'
ama: 'Viertel K. Geschichte der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen
des Begriffs in der Analysis des 19. Jahrhunderts. Wiesbaden: Springer Fachmedien
Wiesbaden; 2014. doi:10.1007/978-3-658-05939-2'
apa: 'Viertel, K. (2014). Geschichte der gleichmäßigen Konvergenz. Ursprünge
und Entwicklungen des Begriffs in der Analysis des 19. Jahrhunderts. Wiesbaden:
Springer Fachmedien Wiesbaden. https://doi.org/10.1007/978-3-658-05939-2'
bibtex: '@book{Viertel_2014, place={Wiesbaden}, title={Geschichte der gleichmäßigen
Konvergenz. Ursprünge und Entwicklungen des Begriffs in der Analysis des 19. Jahrhunderts},
DOI={10.1007/978-3-658-05939-2},
publisher={Springer Fachmedien Wiesbaden}, author={Viertel, Klaus}, year={2014}
}'
chicago: 'Viertel, Klaus. Geschichte der gleichmäßigen Konvergenz. Ursprünge
und Entwicklungen des Begriffs in der Analysis des 19. Jahrhunderts. Wiesbaden:
Springer Fachmedien Wiesbaden, 2014. https://doi.org/10.1007/978-3-658-05939-2.'
ieee: 'K. Viertel, Geschichte der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen
des Begriffs in der Analysis des 19. Jahrhunderts. Wiesbaden: Springer Fachmedien
Wiesbaden, 2014.'
mla: Viertel, Klaus. Geschichte der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen
des Begriffs in der Analysis des 19. Jahrhunderts. Springer Fachmedien Wiesbaden,
2014, doi:10.1007/978-3-658-05939-2.
short: K. Viertel, Geschichte der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen
des Begriffs in der Analysis des 19. Jahrhunderts, Springer Fachmedien Wiesbaden,
Wiesbaden, 2014.
date_created: 2024-05-08T13:36:35Z
date_updated: 2026-03-17T15:29:02Z
doi: 10.1007/978-3-658-05939-2
language:
- iso: ger
page: '252'
place: Wiesbaden
publication_identifier:
eisbn:
- 978-3-658-05939-2
isbn:
- 978-3-658-05938-5
publication_status: published
publisher: Springer Fachmedien Wiesbaden
status: public
title: Geschichte der gleichmäßigen Konvergenz. Ursprünge und Entwicklungen des Begriffs
in der Analysis des 19. Jahrhunderts
type: book
user_id: '220548'
year: '2014'
...