[{"volume":13,"title":"Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves","date_created":"2023-08-28T09:35:35Z","user_id":"245590","alternative_id":["3490","3493"],"publication_identifier":{"eissn":["2156-3403"],"issn":["2156-3381"]},"type":"journal_article","publication":"IEEE Journal of Photovoltaics","publication_status":"published","issue":"4","status":"public","author":[{"full_name":"Feng, Li","last_name":"Feng","id":"237630","first_name":"Li"},{"first_name":"Jingwei","full_name":"Zhang, Jingwei","last_name":"Zhang"},{"first_name":"Tiong Sieh","last_name":"Kiong","full_name":"Kiong, Tiong Sieh"},{"first_name":"Kun","last_name":"Ding","full_name":"Ding, Kun"},{"first_name":"Nowshad","last_name":"Amin","full_name":"Amin, Nowshad"},{"id":"208487","first_name":"Frank U.","last_name":"Hamelmann","full_name":"Hamelmann, Frank U.","orcid":"0000-0001-6141-9874"}],"citation":{"ieee":"L. Feng, J. Zhang, T. S. Kiong, K. Ding, N. Amin, and F. U. Hamelmann, “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves,” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, pp. 558–570, 2023.","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Kiong, Tiong Sieh</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Amin, Nowshad</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank U.</span>: Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. In: <i>IEEE Journal of Photovoltaics</i> Bd. 13, Institute of Electrical and Electronics Engineers (IEEE) (2023), Nr. 4, S. 558–570","bibtex":"@article{Feng_Zhang_Kiong_Ding_Amin_Hamelmann_2023, title={Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves}, volume={13}, DOI={<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>}, number={4}, journal={IEEE Journal of Photovoltaics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Feng, Li and Zhang, Jingwei and Kiong, Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.}, year={2023}, pages={558–570} }","apa":"Feng, L., Zhang, J., Kiong, T. S., Ding, K., Amin, N., &#38; Hamelmann, F. U. (2023). Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>, <i>13</i>(4), 558–570. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>","chicago":"Feng, Li, Jingwei Zhang, Tiong Sieh Kiong, Kun Ding, Nowshad Amin, and Frank U. Hamelmann. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i> 13, no. 4 (2023): 558–70. <a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">https://doi.org/10.1109/JPHOTOV.2023.3275251</a>.","short":"L. Feng, J. Zhang, T.S. Kiong, K. Ding, N. Amin, F.U. Hamelmann, IEEE Journal of Photovoltaics 13 (2023) 558–570.","mla":"Feng, Li, et al. “Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.” <i>IEEE Journal of Photovoltaics</i>, vol. 13, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 558–70, doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>.","ama":"Feng L, Zhang J, Kiong TS, Ding K, Amin N, Hamelmann FU. Estimating Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves. <i>IEEE Journal of Photovoltaics</i>. 2023;13(4):558-570. doi:<a href=\"https://doi.org/10.1109/JPHOTOV.2023.3275251\">10.1109/JPHOTOV.2023.3275251</a>"},"page":"558-570","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","date_updated":"2026-03-17T15:28:45Z","intvolume":"        13","doi":"10.1109/JPHOTOV.2023.3275251","language":[{"iso":"eng"}],"year":"2023","_id":"3492"},{"publication":"Applied Sciences","issue":"3","publication_status":"published","publication_identifier":{"eissn":["2076-3417"]},"type":"journal_article","oa":"1","tmp":{"short":"CC BY (4.0)","legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)","image":"/images/cc_by.png"},"user_id":"245590","alternative_id":["3491"],"main_file_link":[{"url":"https://doi.org/10.3390/app13031448","open_access":"1"}],"title":"Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions","date_created":"2023-05-12T15:17:05Z","volume":13,"quality_controlled":"1","article_number":"1448","year":"2023","_id":"2916","language":[{"iso":"eng"}],"intvolume":"        13","doi":"10.3390/app13031448","publisher":"MDPI AG","date_updated":"2026-03-17T15:28:38Z","citation":{"chicago":"Feng, Li, Nowshad Amin, Jingwei Zhang, Kun Ding, and Frank Hamelmann. “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions.” <i>Applied Sciences</i> 13, no. 3 (2023). <a href=\"https://doi.org/10.3390/app13031448\">https://doi.org/10.3390/app13031448</a>.","short":"L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, Applied Sciences 13 (2023).","mla":"Feng, Li, et al. “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions.” <i>Applied Sciences</i>, vol. 13, no. 3, 1448, MDPI AG, 2023, doi:<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>.","ama":"Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. <i>Applied Sciences</i>. 2023;13(3). doi:<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>","ieee":"L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions,” <i>Applied Sciences</i>, vol. 13, no. 3, 2023.","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Amin, Nowshad</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. In: <i>Applied Sciences</i> Bd. 13, MDPI AG (2023), Nr. 3","bibtex":"@article{Feng_Amin_Zhang_Ding_Hamelmann_2023, title={Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions}, volume={13}, DOI={<a href=\"https://doi.org/10.3390/app13031448\">10.3390/app13031448</a>}, number={31448}, journal={Applied Sciences}, publisher={MDPI AG}, author={Feng, Li and Amin, Nowshad and Zhang, Jingwei and Ding, Kun and Hamelmann, Frank}, year={2023} }","apa":"Feng, L., Amin, N., Zhang, J., Ding, K., &#38; Hamelmann, F. (2023). Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions. <i>Applied Sciences</i>, <i>13</i>(3). <a href=\"https://doi.org/10.3390/app13031448\">https://doi.org/10.3390/app13031448</a>"},"author":[{"last_name":"Feng","full_name":"Feng, Li","id":"237630","first_name":"Li"},{"last_name":"Amin","full_name":"Amin, Nowshad","first_name":"Nowshad"},{"first_name":"Jingwei","full_name":"Zhang, Jingwei","last_name":"Zhang"},{"last_name":"Ding","full_name":"Ding, Kun","first_name":"Kun"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"}],"status":"public"},{"quality_controlled":"1","title":"Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics","date_created":"2023-05-09T09:23:40Z","volume":15,"type":"journal_article","publication_identifier":{"eissn":["1996-1073"]},"oa":"1","tmp":{"short":"CC BY (4.0)","legal_code_url":"https://creativecommons.org/licenses/by/4.0/legalcode","name":"Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)","image":"/images/cc_by.png"},"user_id":"245590","main_file_link":[{"url":"https://www.mdpi.com/1996-1073/15/18/6567","open_access":"1"}],"publication_status":"published","issue":"18","publication":"Energies","author":[{"last_name":"Zhang","full_name":"Zhang, Jingwei","first_name":"Jingwei"},{"full_name":"Yang, Zenan","last_name":"Yang","first_name":"Zenan"},{"first_name":"Kun","full_name":"Ding, Kun","last_name":"Ding"},{"id":"237630","first_name":"Li","full_name":"Feng, Li","last_name":"Feng"},{"id":"208487","first_name":"Frank","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann"},{"last_name":"Chen","full_name":"Chen, Xihui","first_name":"Xihui"},{"first_name":"Yongjie","full_name":"Liu, Yongjie","last_name":"Liu"},{"last_name":"Chen","full_name":"Chen, Ling","first_name":"Ling"}],"citation":{"chicago":"Zhang, Jingwei, Zenan Yang, Kun Ding, Li Feng, Frank Hamelmann, Xihui Chen, Yongjie Liu, and Ling Chen. “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics.” <i>Energies</i> 15, no. 18 (2022). <a href=\"https://doi.org/10.3390/en15186567\">https://doi.org/10.3390/en15186567</a>.","short":"J. Zhang, Z. Yang, K. Ding, L. Feng, F. Hamelmann, X. Chen, Y. Liu, L. Chen, Energies 15 (2022).","mla":"Zhang, Jingwei, et al. “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics.” <i>Energies</i>, vol. 15, no. 18, 6567, MDPI AG, 2022, doi:<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>.","ama":"Zhang J, Yang Z, Ding K, et al. Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. <i>Energies</i>. 2022;15(18). doi:<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>","ieee":"J. Zhang <i>et al.</i>, “Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics,” <i>Energies</i>, vol. 15, no. 18, 2022.","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Yang, Zenan</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xihui</span> ; <span style=\"font-variant:small-caps;\">Liu, Yongjie</span> ; <span style=\"font-variant:small-caps;\">Chen, Ling</span>: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. In: <i>Energies</i> Bd. 15, MDPI AG (2022), Nr. 18","bibtex":"@article{Zhang_Yang_Ding_Feng_Hamelmann_Chen_Liu_Chen_2022, title={Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics}, volume={15}, DOI={<a href=\"https://doi.org/10.3390/en15186567\">10.3390/en15186567</a>}, number={186567}, journal={Energies}, publisher={MDPI AG}, author={Zhang, Jingwei and Yang, Zenan and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xihui and Liu, Yongjie and Chen, Ling}, year={2022} }","apa":"Zhang, J., Yang, Z., Ding, K., Feng, L., Hamelmann, F., Chen, X., … Chen, L. (2022). Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals of I–V Characteristics. <i>Energies</i>, <i>15</i>(18). <a href=\"https://doi.org/10.3390/en15186567\">https://doi.org/10.3390/en15186567</a>"},"status":"public","intvolume":"        15","doi":"10.3390/en15186567","publisher":"MDPI AG","date_updated":"2026-03-17T15:28:38Z","year":"2022","_id":"2861","language":[{"iso":"eng"}],"article_number":"6567"},{"main_file_link":[{"url":"https://www.eupvsec-proceedings.com/proceedings?paper=50327"}],"user_id":"245590","type":"journal_article","publication_status":"published","publication":"EU PVSEC Proceedings","date_created":"2023-05-12T15:23:46Z","title":"Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation","language":[{"iso":"eng"}],"_id":"2917","year":"2021","status":"public","citation":{"chicago":"Feng, Li, N. Amin, J. Zhang, K. Ding, and Frank Hamelmann. “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.” <i>EU PVSEC Proceedings</i>, 2021. <a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18</a>.","short":"L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, EU PVSEC Proceedings (2021).","mla":"Feng, Li, et al. “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.” <i>EU PVSEC Proceedings</i>, WIP, 2021, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>.","ama":"Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. <i>EU PVSEC Proceedings</i>. 2021. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>","ieee":"L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation,” <i>EU PVSEC Proceedings</i>, 2021.","alphadin":"<span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Amin, N.</span> ; <span style=\"font-variant:small-caps;\">Zhang, J.</span> ; <span style=\"font-variant:small-caps;\">Ding, K.</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span>: Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. In: <i>EU PVSEC Proceedings</i>, WIP (2021)","bibtex":"@article{Feng_Amin_Zhang_Ding_Hamelmann_2021, title={Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">10.4229/EUPVSEC20212021-4AV.2.18</a>}, journal={EU PVSEC Proceedings}, publisher={WIP}, author={Feng, Li and Amin, N. and Zhang, J. and Ding, K. and Hamelmann, Frank}, year={2021} }","apa":"Feng, L., Amin, N., Zhang, J., Ding, K., &#38; Hamelmann, F. (2021). Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation. <i>EU PVSEC Proceedings</i>. <a href=\"https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18\">https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18</a>"},"author":[{"first_name":"Li","id":"237630","last_name":"Feng","full_name":"Feng, Li"},{"full_name":"Amin, N.","last_name":"Amin","first_name":"N."},{"first_name":"J.","last_name":"Zhang","full_name":"Zhang, J."},{"first_name":"K.","full_name":"Ding, K.","last_name":"Ding"},{"id":"208487","first_name":"Frank","last_name":"Hamelmann","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874"}],"date_updated":"2026-03-17T15:28:38Z","publisher":"WIP","doi":"10.4229/EUPVSEC20212021-4AV.2.18"},{"publication_status":"published","publication":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)","user_id":"245590","type":"conference","publication_identifier":{"eisbn":["978-1-6654-2248-2"]},"date_created":"2023-05-12T15:26:12Z","title":"Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters","language":[{"iso":"eng"}],"_id":"2918","year":"2021","date_updated":"2026-03-17T15:28:38Z","publisher":"IEEE","page":"783-787","doi":"10.1109/ICIEA51954.2021.9516437","status":"public","conference":{"location":"Chengdu, China","name":"2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)"},"author":[{"first_name":"Jingwei","last_name":"Zhang","full_name":"Zhang, Jingwei"},{"last_name":"Feng","full_name":"Feng, Li","id":"237630","first_name":"Li"},{"first_name":"Ding","full_name":"Kun, Ding","last_name":"Kun"},{"orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","last_name":"Hamelmann","first_name":"Frank","id":"208487"},{"full_name":"Chen, Xihui","last_name":"Chen","first_name":"Xihui"},{"first_name":"Xiang","full_name":"Chen, Xiang","last_name":"Chen"},{"last_name":"Chen","full_name":"Chen, Ling","first_name":"Ling"}],"citation":{"ama":"Zhang J, Feng L, Kun D, et al. Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>. IEEE; 2021:783-787. doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>","mla":"Zhang, Jingwei, et al. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, IEEE, 2021, pp. 783–87, doi:<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>.","chicago":"Zhang, Jingwei, Li Feng, Ding Kun, Frank Hamelmann, Xihui Chen, Xiang Chen, and Ling Chen. “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters.” In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, 783–87. IEEE, 2021. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>.","short":"J. Zhang, L. Feng, D. Kun, F. Hamelmann, X. Chen, X. Chen, L. Chen, in: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA), IEEE, 2021, pp. 783–787.","apa":"Zhang, J., Feng, L., Kun, D., Hamelmann, F., Chen, X., Chen, X., &#38; Chen, L. (2021). Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> (pp. 783–787). Chengdu, China: IEEE. <a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">https://doi.org/10.1109/ICIEA51954.2021.9516437</a>","bibtex":"@inproceedings{Zhang_Feng_Kun_Hamelmann_Chen_Chen_Chen_2021, title={Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters}, DOI={<a href=\"https://doi.org/10.1109/ICIEA51954.2021.9516437\">10.1109/ICIEA51954.2021.9516437</a>}, booktitle={2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)}, publisher={IEEE}, author={Zhang, Jingwei and Feng, Li and Kun, Ding and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling}, year={2021}, pages={783–787} }","alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Kun, Ding</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xihui</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span> ; <span style=\"font-variant:small-caps;\">Chen, Ling</span>: Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters. In: <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i> : IEEE, 2021, S. 783–787","ieee":"J. Zhang <i>et al.</i>, “Degradation Assessment of Photovoltaic Module Based on Probability Distribution Analysis of Model Parameters,” in <i>2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)</i>, Chengdu, China, 2021, pp. 783–787."}},{"publication_status":"published","user_id":"216459","main_file_link":[{"open_access":"1","url":"https://www.researchgate.net/publication/344960005_PERFORMANCE_ANALYSIS_OF_POLYCRYSTALLINE_MODULE_BASED_ON_FAULTS_CAUSES"}],"type":"conference","oa":"1","title":"Performance Analysis of Polycrystalline Module Based on Faults Causes","jel":["C6"],"date_created":"2023-09-01T08:32:56Z","language":[{"iso":"eng"}],"year":"2020","_id":"3507","publisher":"WIP","date_updated":"2026-03-17T15:28:45Z","doi":"10.4229/EUPVSEC20202020-4AV.2.50","conference":{"end_date":"2020-09-11","start_date":"2020-09-07","location":"Lisbon, Portugal","name":"37th European Photovoltaic Solar Energy Conference and Exhibition"},"status":"public","citation":{"ama":"Feng L, Hamelmann F, Zhang J, et al. Performance Analysis of Polycrystalline Module Based on Faults Causes. In: WIP; 2020. doi:<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>","mla":"Feng, Li, et al. <i>Performance Analysis of Polycrystalline Module Based on Faults Causes</i>. WIP, 2020, doi:<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>.","short":"L. Feng, F. Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, N. Amin, in: WIP, 2020.","chicago":"Feng, Li, Frank Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, and N. Amin. “Performance Analysis of Polycrystalline Module Based on Faults Causes.” WIP, 2020. <a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50</a>.","bibtex":"@inproceedings{Feng_Hamelmann_Zhang_Ding_Hempelmann_Diehl_Pfeil_Brandt_Friedrich_Amin_2020, title={Performance Analysis of Polycrystalline Module Based on Faults Causes}, DOI={<a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">10.4229/EUPVSEC20202020-4AV.2.50</a>}, publisher={WIP}, author={Feng, Li and Hamelmann, Frank and Zhang, J. and Ding, K. and Hempelmann, S. and Diehl, M. and Pfeil, T. and Brandt, S. and Friedrich, W. and Amin, N.}, year={2020} }","apa":"Feng, L., Hamelmann, F., Zhang, J., Ding, K., Hempelmann, S., Diehl, M., … Amin, N. (2020). Performance Analysis of Polycrystalline Module Based on Faults Causes. Presented at the 37th European Photovoltaic Solar Energy Conference and Exhibition, Lisbon, Portugal: WIP. <a href=\"https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50\">https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50</a>","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Zhang, J.</span> ; <span style=\"font-variant:small-caps;\">Ding, K.</span> ; <span style=\"font-variant:small-caps;\">Hempelmann, S.</span> ; <span style=\"font-variant:small-caps;\">Diehl, M.</span> ; <span style=\"font-variant:small-caps;\">Pfeil, T.</span> ; <span style=\"font-variant:small-caps;\">Brandt, S.</span> ; u. a.</span>: Performance Analysis of Polycrystalline Module Based on Faults Causes. In:  : WIP, 2020","ieee":"L. Feng <i>et al.</i>, “Performance Analysis of Polycrystalline Module Based on Faults Causes,” presented at the 37th European Photovoltaic Solar Energy Conference and Exhibition, Lisbon, Portugal, 2020."},"author":[{"first_name":"Li","id":"237630","full_name":"Feng, Li","last_name":"Feng"},{"last_name":"Hamelmann","orcid":"0000-0001-6141-9874","full_name":"Hamelmann, Frank","first_name":"Frank","id":"208487"},{"full_name":"Zhang, J.","last_name":"Zhang","first_name":"J."},{"first_name":"K.","full_name":"Ding, K.","last_name":"Ding"},{"full_name":"Hempelmann, S.","last_name":"Hempelmann","first_name":"S."},{"first_name":"M.","last_name":"Diehl","full_name":"Diehl, M."},{"last_name":"Pfeil","full_name":"Pfeil, T.","first_name":"T."},{"first_name":"S.","last_name":"Brandt","full_name":"Brandt, S."},{"first_name":"W.","full_name":"Friedrich, W.","last_name":"Friedrich"},{"first_name":"N.","full_name":"Amin, N.","last_name":"Amin"}]},{"user_id":"216459","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"type":"conference","publication_status":"published","publication":"47th IEEE Photovoltaic Specialists Conference (PVSC)","title":"Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions","date_created":"2023-09-01T08:36:48Z","language":[{"iso":"eng"}],"year":"2020","_id":"3508","conference":{"name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)","location":"Calgary, AB, Canada","end_date":"2020-08-21","start_date":"2020-06-15"},"status":"public","citation":{"alphadin":"<span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Liu, Yongjie</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span>: Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In: <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2509–2512","bibtex":"@inproceedings{Zhang_Liu_Ding_Feng_Hamelmann_Chen_2020, title={Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>}, booktitle={47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Zhang, Jingwei and Liu, Yongjie and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xiang}, year={2020}, pages={2509–2512} }","apa":"Zhang, J., Liu, Y., Ding, K., Feng, L., Hamelmann, F., &#38; Chen, X. (2020). Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2509–2512). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">https://doi.org/10.1109/PVSC45281.2020.9300720</a>","ieee":"J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, and X. Chen, “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions,” in <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2509–2512.","mla":"Zhang, Jingwei, et al. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.” <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2509–12, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>.","ama":"Zhang J, Liu Y, Ding K, Feng L, Hamelmann F, Chen X. Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In: <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2509-2512. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">10.1109/PVSC45281.2020.9300720</a>","chicago":"Zhang, Jingwei, Yongjie Liu, Kun Ding, Li Feng, Frank Hamelmann, and Xiang Chen. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.” In <i>47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2509–12. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300720\">https://doi.org/10.1109/PVSC45281.2020.9300720</a>.","short":"J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, X. Chen, in: 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2509–2512."},"author":[{"first_name":"Jingwei","last_name":"Zhang","full_name":"Zhang, Jingwei"},{"first_name":"Yongjie","full_name":"Liu, Yongjie","last_name":"Liu"},{"first_name":"Kun","last_name":"Ding","full_name":"Ding, Kun"},{"full_name":"Feng, Li","last_name":"Feng","id":"237630","first_name":"Li"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"},{"first_name":"Xiang","full_name":"Chen, Xiang","last_name":"Chen"}],"page":"2509-2512","publisher":"IEEE","date_updated":"2026-03-17T15:28:45Z","doi":"10.1109/PVSC45281.2020.9300720"},{"title":"Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM","date_created":"2023-09-01T08:38:39Z","type":"conference","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"user_id":"216459","publication_status":"published","publication":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","author":[{"first_name":"Kun","last_name":"Ding","full_name":"Ding, Kun"},{"first_name":"Xiang","full_name":"Chen, Xiang","last_name":"Chen"},{"full_name":"Zhang, Jingwei","last_name":"Zhang","first_name":"Jingwei"},{"id":"237630","first_name":"Li","full_name":"Feng, Li","last_name":"Feng"},{"full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","last_name":"Hamelmann","id":"208487","first_name":"Frank"},{"full_name":"Weng, Shuai","last_name":"Weng","first_name":"Shuai"}],"citation":{"ieee":"K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, and S. Weng, “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM,” in <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2532–2537.","bibtex":"@inproceedings{Ding_Chen_Zhang_Feng_Hamelmann_Weng_2020, title={Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>}, booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Ding, Kun and Chen, Xiang and Zhang, Jingwei and Feng, Li and Hamelmann, Frank and Weng, Shuai}, year={2020}, pages={2532–2537} }","apa":"Ding, K., Chen, X., Zhang, J., Feng, L., Hamelmann, F., &#38; Weng, S. (2020). Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2532–2537). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">https://doi.org/10.1109/PVSC45281.2020.9300587</a>","alphadin":"<span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Chen, Xiang</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Weng, Shuai</span>: Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2532–2537","chicago":"Ding, Kun, Xiang Chen, Jingwei Zhang, Li Feng, Frank Hamelmann, and Shuai Weng. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.” In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2532–37. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">https://doi.org/10.1109/PVSC45281.2020.9300587</a>.","short":"K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, S. Weng, in: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2532–2537.","ama":"Ding K, Chen X, Zhang J, Feng L, Hamelmann F, Weng S. Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2532-2537. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>","mla":"Ding, Kun, et al. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.” <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2532–37, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300587\">10.1109/PVSC45281.2020.9300587</a>."},"conference":{"end_date":"2020-08-21","start_date":"2020-06-15","location":"Calgary, AB, Canada","name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)"},"status":"public","doi":"10.1109/PVSC45281.2020.9300587","publisher":"IEEE","page":"2532-2537","date_updated":"2026-03-17T15:28:45Z","year":"2020","_id":"3509","language":[{"iso":"eng"}]},{"date_created":"2023-09-01T08:39:42Z","title":"A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors","user_id":"245590","publication_identifier":{"eisbn":["978-1-7281-6115-0"]},"type":"conference","publication_status":"published","publication":"2020 47th IEEE Photovoltaic Specialists Conference (PVSC)","status":"public","conference":{"location":"Calgary, AB, Canada","name":"2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)"},"citation":{"alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Feng, Li</span> ; <span style=\"font-variant:small-caps;\">Hamelmann, Frank</span> ; <span style=\"font-variant:small-caps;\">Zhang, Jingwei</span> ; <span style=\"font-variant:small-caps;\">Ding, Kun</span> ; <span style=\"font-variant:small-caps;\">Diehl, Matthias</span> ; <span style=\"font-variant:small-caps;\">Pfeil, Thomas</span> ; <span style=\"font-variant:small-caps;\">Brandt, Steffen</span> ; <span style=\"font-variant:small-caps;\">Friedrich, Werner</span> ; u. a.</span>: A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> : IEEE, 2020, S. 2496–2501","apa":"Feng, L., Hamelmann, F., Zhang, J., Ding, K., Diehl, M., Pfeil, T., … Amin, N. (2020). A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i> (pp. 2496–2501). Calgary, AB, Canada: IEEE. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">https://doi.org/10.1109/PVSC45281.2020.9300796</a>","bibtex":"@inproceedings{Feng_Hamelmann_Zhang_Ding_Diehl_Pfeil_Brandt_Friedrich_Amin_2020, title={A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors}, DOI={<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>}, booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE}, author={Feng, Li and Hamelmann, Frank and Zhang, Jingwei and Ding, Kun and Diehl, Matthias and Pfeil, Thomas and Brandt, Steffen and Friedrich, Werner and Amin, Nowshad}, year={2020}, pages={2496–2501} }","ieee":"L. Feng <i>et al.</i>, “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors,” in <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, Calgary, AB, Canada, 2020, pp. 2496–2501.","mla":"Feng, Li, et al. “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors.” <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, IEEE, 2020, pp. 2496–501, doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>.","ama":"Feng L, Hamelmann F, Zhang J, et al. A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors. In: <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>. IEEE; 2020:2496-2501. doi:<a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">10.1109/PVSC45281.2020.9300796</a>","chicago":"Feng, Li, Frank Hamelmann, Jingwei Zhang, Kun Ding, Matthias Diehl, Thomas Pfeil, Steffen Brandt, Werner Friedrich, and Nowshad Amin. “A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors.” In <i>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</i>, 2496–2501. IEEE, 2020. <a href=\"https://doi.org/10.1109/PVSC45281.2020.9300796\">https://doi.org/10.1109/PVSC45281.2020.9300796</a>.","short":"L. Feng, F. Hamelmann, J. Zhang, K. Ding, M. Diehl, T. Pfeil, S. Brandt, W. Friedrich, N. Amin, in: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2496–2501."},"author":[{"first_name":"Li","id":"237630","last_name":"Feng","full_name":"Feng, Li"},{"last_name":"Hamelmann","full_name":"Hamelmann, Frank","orcid":"0000-0001-6141-9874","id":"208487","first_name":"Frank"},{"first_name":"Jingwei","full_name":"Zhang, Jingwei","last_name":"Zhang"},{"first_name":"Kun","full_name":"Ding, Kun","last_name":"Ding"},{"last_name":"Diehl","full_name":"Diehl, Matthias","first_name":"Matthias"},{"last_name":"Pfeil","full_name":"Pfeil, Thomas","first_name":"Thomas"},{"last_name":"Brandt","full_name":"Brandt, Steffen","first_name":"Steffen"},{"first_name":"Werner","full_name":"Friedrich, Werner","last_name":"Friedrich"},{"last_name":"Amin","full_name":"Amin, Nowshad","first_name":"Nowshad"}],"date_updated":"2026-03-17T15:28:45Z","publisher":"IEEE","page":"2496-2501","doi":"10.1109/PVSC45281.2020.9300796","language":[{"iso":"eng"}],"_id":"3510","year":"2020"}]