---
_id: '3492'
alternative_id:
- '3490'
- '3493'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Tiong Sieh
full_name: Kiong, Tiong Sieh
last_name: Kiong
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
- first_name: Frank U.
full_name: Hamelmann, Frank U.
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Zhang,
Jingwei ; Kiong, Tiong Sieh
; Ding, Kun ; Amin,
Nowshad ; Hamelmann, Frank U.:
Estimating Crack Effects on Electrical Characteristics of PV Modules Based on
Monitoring Data and – Curves. In: IEEE Journal of Photovoltaics Bd. 13,
Institute of Electrical and Electronics Engineers (IEEE) (2023), Nr. 4, S. 558–570'
ama: Feng L, Zhang J, Kiong TS, Ding K, Amin N, Hamelmann FU. Estimating Crack Effects
on Electrical Characteristics of PV Modules Based on Monitoring Data and – Curves.
IEEE Journal of Photovoltaics. 2023;13(4):558-570. doi:10.1109/JPHOTOV.2023.3275251
apa: Feng, L., Zhang, J., Kiong, T. S., Ding, K., Amin, N., & Hamelmann, F.
U. (2023). Estimating Crack Effects on Electrical Characteristics of PV Modules
Based on Monitoring Data and – Curves. IEEE Journal of Photovoltaics, 13(4),
558–570. https://doi.org/10.1109/JPHOTOV.2023.3275251
bibtex: '@article{Feng_Zhang_Kiong_Ding_Amin_Hamelmann_2023, title={Estimating Crack
Effects on Electrical Characteristics of PV Modules Based on Monitoring Data and
– Curves}, volume={13}, DOI={10.1109/JPHOTOV.2023.3275251},
number={4}, journal={IEEE Journal of Photovoltaics}, publisher={Institute of Electrical
and Electronics Engineers (IEEE)}, author={Feng, Li and Zhang, Jingwei and Kiong,
Tiong Sieh and Ding, Kun and Amin, Nowshad and Hamelmann, Frank U.}, year={2023},
pages={558–570} }'
chicago: 'Feng, Li, Jingwei Zhang, Tiong Sieh Kiong, Kun Ding, Nowshad Amin, and
Frank U. Hamelmann. “Estimating Crack Effects on Electrical Characteristics of
PV Modules Based on Monitoring Data and – Curves.” IEEE Journal of Photovoltaics
13, no. 4 (2023): 558–70. https://doi.org/10.1109/JPHOTOV.2023.3275251.'
ieee: L. Feng, J. Zhang, T. S. Kiong, K. Ding, N. Amin, and F. U. Hamelmann, “Estimating
Crack Effects on Electrical Characteristics of PV Modules Based on Monitoring
Data and – Curves,” IEEE Journal of Photovoltaics, vol. 13, no. 4, pp.
558–570, 2023.
mla: Feng, Li, et al. “Estimating Crack Effects on Electrical Characteristics of
PV Modules Based on Monitoring Data and – Curves.” IEEE Journal of Photovoltaics,
vol. 13, no. 4, Institute of Electrical and Electronics Engineers (IEEE), 2023,
pp. 558–70, doi:10.1109/JPHOTOV.2023.3275251.
short: L. Feng, J. Zhang, T.S. Kiong, K. Ding, N. Amin, F.U. Hamelmann, IEEE Journal
of Photovoltaics 13 (2023) 558–570.
date_created: 2023-08-28T09:35:35Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/JPHOTOV.2023.3275251
intvolume: ' 13'
issue: '4'
language:
- iso: eng
page: 558-570
publication: IEEE Journal of Photovoltaics
publication_identifier:
eissn:
- 2156-3403
issn:
- 2156-3381
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: Estimating Crack Effects on Electrical Characteristics of PV Modules Based
on Monitoring Data and – Curves
type: journal_article
user_id: '245590'
volume: 13
year: '2023'
...
---
_id: '2916'
alternative_id:
- '3491'
article_number: '1448'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Amin,
Nowshad ; Zhang, Jingwei
; Ding, Kun ; Hamelmann,
Frank: Module-Level Performance Evaluation for a Smart PV System Based
on Field Conditions. In: Applied Sciences Bd. 13, MDPI AG (2023), Nr. 3'
ama: Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Module-Level Performance Evaluation
for a Smart PV System Based on Field Conditions. Applied Sciences. 2023;13(3).
doi:10.3390/app13031448
apa: Feng, L., Amin, N., Zhang, J., Ding, K., & Hamelmann, F. (2023). Module-Level
Performance Evaluation for a Smart PV System Based on Field Conditions. Applied
Sciences, 13(3). https://doi.org/10.3390/app13031448
bibtex: '@article{Feng_Amin_Zhang_Ding_Hamelmann_2023, title={Module-Level Performance
Evaluation for a Smart PV System Based on Field Conditions}, volume={13}, DOI={10.3390/app13031448}, number={31448},
journal={Applied Sciences}, publisher={MDPI AG}, author={Feng, Li and Amin, Nowshad
and Zhang, Jingwei and Ding, Kun and Hamelmann, Frank}, year={2023} }'
chicago: Feng, Li, Nowshad Amin, Jingwei Zhang, Kun Ding, and Frank Hamelmann. “Module-Level
Performance Evaluation for a Smart PV System Based on Field Conditions.” Applied
Sciences 13, no. 3 (2023). https://doi.org/10.3390/app13031448.
ieee: L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Module-Level Performance
Evaluation for a Smart PV System Based on Field Conditions,” Applied Sciences,
vol. 13, no. 3, 2023.
mla: Feng, Li, et al. “Module-Level Performance Evaluation for a Smart PV System
Based on Field Conditions.” Applied Sciences, vol. 13, no. 3, 1448, MDPI
AG, 2023, doi:10.3390/app13031448.
short: L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, Applied Sciences 13 (2023).
date_created: 2023-05-12T15:17:05Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.3390/app13031448
intvolume: ' 13'
issue: '3'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://doi.org/10.3390/app13031448
oa: '1'
publication: Applied Sciences
publication_identifier:
eissn:
- 2076-3417
publication_status: published
publisher: MDPI AG
quality_controlled: '1'
status: public
title: Module-Level Performance Evaluation for a Smart PV System Based on Field Conditions
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '245590'
volume: 13
year: '2023'
...
---
_id: '2861'
article_number: '6567'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Zenan
full_name: Yang, Zenan
last_name: Yang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xihui
full_name: Chen, Xihui
last_name: Chen
- first_name: Yongjie
full_name: Liu, Yongjie
last_name: Liu
- first_name: Ling
full_name: Chen, Ling
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Yang, Zenan ; Ding,
Kun ; Feng, Li ; Hamelmann,
Frank ; Chen, Xihui ; Liu, Yongjie ; Chen,
Ling: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement
Learning Using Residuals of I–V Characteristics. In: Energies Bd. 15, MDPI
AG (2022), Nr. 18'
ama: Zhang J, Yang Z, Ding K, et al. Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics. Energies.
2022;15(18). doi:10.3390/en15186567
apa: Zhang, J., Yang, Z., Ding, K., Feng, L., Hamelmann, F., Chen, X., … Chen, L.
(2022). Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement
Learning Using Residuals of I–V Characteristics. Energies, 15(18).
https://doi.org/10.3390/en15186567
bibtex: '@article{Zhang_Yang_Ding_Feng_Hamelmann_Chen_Liu_Chen_2022, title={Modeling
of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning Using Residuals
of I–V Characteristics}, volume={15}, DOI={10.3390/en15186567},
number={186567}, journal={Energies}, publisher={MDPI AG}, author={Zhang, Jingwei
and Yang, Zenan and Ding, Kun and Feng, Li and Hamelmann, Frank and Chen, Xihui
and Liu, Yongjie and Chen, Ling}, year={2022} }'
chicago: Zhang, Jingwei, Zenan Yang, Kun Ding, Li Feng, Frank Hamelmann, Xihui Chen,
Yongjie Liu, and Ling Chen. “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics.” Energies
15, no. 18 (2022). https://doi.org/10.3390/en15186567.
ieee: J. Zhang et al., “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics,” Energies,
vol. 15, no. 18, 2022.
mla: Zhang, Jingwei, et al. “Modeling of Photovoltaic Array Based on Multi-Agent
Deep Reinforcement Learning Using Residuals of I–V Characteristics.” Energies,
vol. 15, no. 18, 6567, MDPI AG, 2022, doi:10.3390/en15186567.
short: J. Zhang, Z. Yang, K. Ding, L. Feng, F. Hamelmann, X. Chen, Y. Liu, L. Chen,
Energies 15 (2022).
date_created: 2023-05-09T09:23:40Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.3390/en15186567
intvolume: ' 15'
issue: '18'
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://www.mdpi.com/1996-1073/15/18/6567
oa: '1'
publication: Energies
publication_identifier:
eissn:
- 1996-1073
publication_status: published
publisher: MDPI AG
quality_controlled: '1'
status: public
title: Modeling of Photovoltaic Array Based on Multi-Agent Deep Reinforcement Learning
Using Residuals of I–V Characteristics
tmp:
image: /images/cc_by.png
legal_code_url: https://creativecommons.org/licenses/by/4.0/legalcode
name: Creative Commons Attribution 4.0 International Public License (CC-BY 4.0)
short: CC BY (4.0)
type: journal_article
user_id: '245590'
volume: 15
year: '2022'
...
---
_id: '2917'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: N.
full_name: Amin, N.
last_name: Amin
- first_name: J.
full_name: Zhang, J.
last_name: Zhang
- first_name: K.
full_name: Ding, K.
last_name: Ding
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
citation:
alphadin: 'Feng, Li ; Amin,
N. ; Zhang, J. ; Ding,
K. ; Hamelmann, Frank: Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.
In: EU PVSEC Proceedings, WIP (2021)'
ama: Feng L, Amin N, Zhang J, Ding K, Hamelmann F. Classification of Uncertain I-V
Curves in PV Modules Based on Current and Voltage Evaluation. EU PVSEC Proceedings.
2021. doi:10.4229/EUPVSEC20212021-4AV.2.18
apa: Feng, L., Amin, N., Zhang, J., Ding, K., & Hamelmann, F. (2021). Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.
EU PVSEC Proceedings. https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18
bibtex: '@article{Feng_Amin_Zhang_Ding_Hamelmann_2021, title={Classification of
Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation}, DOI={10.4229/EUPVSEC20212021-4AV.2.18},
journal={EU PVSEC Proceedings}, publisher={WIP}, author={Feng, Li and Amin, N.
and Zhang, J. and Ding, K. and Hamelmann, Frank}, year={2021} }'
chicago: Feng, Li, N. Amin, J. Zhang, K. Ding, and Frank Hamelmann. “Classification
of Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation.”
EU PVSEC Proceedings, 2021. https://doi.org/10.4229/EUPVSEC20212021-4AV.2.18.
ieee: L. Feng, N. Amin, J. Zhang, K. Ding, and F. Hamelmann, “Classification of
Uncertain I-V Curves in PV Modules Based on Current and Voltage Evaluation,” EU
PVSEC Proceedings, 2021.
mla: Feng, Li, et al. “Classification of Uncertain I-V Curves in PV Modules Based
on Current and Voltage Evaluation.” EU PVSEC Proceedings, WIP, 2021, doi:10.4229/EUPVSEC20212021-4AV.2.18.
short: L. Feng, N. Amin, J. Zhang, K. Ding, F. Hamelmann, EU PVSEC Proceedings (2021).
date_created: 2023-05-12T15:23:46Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.4229/EUPVSEC20212021-4AV.2.18
language:
- iso: eng
main_file_link:
- url: https://www.eupvsec-proceedings.com/proceedings?paper=50327
publication: EU PVSEC Proceedings
publication_status: published
publisher: WIP
status: public
title: Classification of Uncertain I-V Curves in PV Modules Based on Current and Voltage
Evaluation
type: journal_article
user_id: '245590'
year: '2021'
...
---
_id: '2918'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Ding
full_name: Kun, Ding
last_name: Kun
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xihui
full_name: Chen, Xihui
last_name: Chen
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
- first_name: Ling
full_name: Chen, Ling
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Feng, Li ; Kun,
Ding ; Hamelmann, Frank ;
Chen, Xihui ; Chen,
Xiang ; Chen, Ling: Degradation
Assessment of Photovoltaic Module Based on Probability Distribution Analysis of
Model Parameters. In: 2021 IEEE 16th Conference on Industrial Electronics and
Applications (ICIEA) : IEEE, 2021, S. 783–787'
ama: 'Zhang J, Feng L, Kun D, et al. Degradation Assessment of Photovoltaic Module
Based on Probability Distribution Analysis of Model Parameters. In: 2021 IEEE
16th Conference on Industrial Electronics and Applications (ICIEA). IEEE;
2021:783-787. doi:10.1109/ICIEA51954.2021.9516437'
apa: 'Zhang, J., Feng, L., Kun, D., Hamelmann, F., Chen, X., Chen, X., & Chen,
L. (2021). Degradation Assessment of Photovoltaic Module Based on Probability
Distribution Analysis of Model Parameters. In 2021 IEEE 16th Conference on
Industrial Electronics and Applications (ICIEA) (pp. 783–787). Chengdu, China:
IEEE. https://doi.org/10.1109/ICIEA51954.2021.9516437'
bibtex: '@inproceedings{Zhang_Feng_Kun_Hamelmann_Chen_Chen_Chen_2021, title={Degradation
Assessment of Photovoltaic Module Based on Probability Distribution Analysis of
Model Parameters}, DOI={10.1109/ICIEA51954.2021.9516437},
booktitle={2021 IEEE 16th Conference on Industrial Electronics and Applications
(ICIEA)}, publisher={IEEE}, author={Zhang, Jingwei and Feng, Li and Kun, Ding
and Hamelmann, Frank and Chen, Xihui and Chen, Xiang and Chen, Ling}, year={2021},
pages={783–787} }'
chicago: Zhang, Jingwei, Li Feng, Ding Kun, Frank Hamelmann, Xihui Chen, Xiang Chen,
and Ling Chen. “Degradation Assessment of Photovoltaic Module Based on Probability
Distribution Analysis of Model Parameters.” In 2021 IEEE 16th Conference on
Industrial Electronics and Applications (ICIEA), 783–87. IEEE, 2021. https://doi.org/10.1109/ICIEA51954.2021.9516437.
ieee: J. Zhang et al., “Degradation Assessment of Photovoltaic Module Based
on Probability Distribution Analysis of Model Parameters,” in 2021 IEEE 16th
Conference on Industrial Electronics and Applications (ICIEA), Chengdu, China,
2021, pp. 783–787.
mla: Zhang, Jingwei, et al. “Degradation Assessment of Photovoltaic Module Based
on Probability Distribution Analysis of Model Parameters.” 2021 IEEE 16th Conference
on Industrial Electronics and Applications (ICIEA), IEEE, 2021, pp. 783–87,
doi:10.1109/ICIEA51954.2021.9516437.
short: 'J. Zhang, L. Feng, D. Kun, F. Hamelmann, X. Chen, X. Chen, L. Chen, in:
2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA),
IEEE, 2021, pp. 783–787.'
conference:
location: Chengdu, China
name: 2021 IEEE 16th Conference on Industrial Electronics and Applications (ICIEA)
date_created: 2023-05-12T15:26:12Z
date_updated: 2026-03-17T15:28:38Z
doi: 10.1109/ICIEA51954.2021.9516437
language:
- iso: eng
page: 783-787
publication: 2021 IEEE 16th Conference on Industrial Electronics and Applications
(ICIEA)
publication_identifier:
eisbn:
- 978-1-6654-2248-2
publication_status: published
publisher: IEEE
status: public
title: Degradation Assessment of Photovoltaic Module Based on Probability Distribution
Analysis of Model Parameters
type: conference
user_id: '245590'
year: '2021'
...
---
_id: '3507'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: J.
full_name: Zhang, J.
last_name: Zhang
- first_name: K.
full_name: Ding, K.
last_name: Ding
- first_name: S.
full_name: Hempelmann, S.
last_name: Hempelmann
- first_name: M.
full_name: Diehl, M.
last_name: Diehl
- first_name: T.
full_name: Pfeil, T.
last_name: Pfeil
- first_name: S.
full_name: Brandt, S.
last_name: Brandt
- first_name: W.
full_name: Friedrich, W.
last_name: Friedrich
- first_name: N.
full_name: Amin, N.
last_name: Amin
citation:
alphadin: 'Feng,
Li ; Hamelmann, Frank ; Zhang, J. ; Ding,
K. ; Hempelmann, S. ; Diehl, M. ; Pfeil,
T. ; Brandt, S. ; u. a.:
Performance Analysis of Polycrystalline Module Based on Faults Causes. In: :
WIP, 2020'
ama: 'Feng L, Hamelmann F, Zhang J, et al. Performance Analysis of Polycrystalline
Module Based on Faults Causes. In: WIP; 2020. doi:10.4229/EUPVSEC20202020-4AV.2.50'
apa: 'Feng, L., Hamelmann, F., Zhang, J., Ding, K., Hempelmann, S., Diehl, M., …
Amin, N. (2020). Performance Analysis of Polycrystalline Module Based on Faults
Causes. Presented at the 37th European Photovoltaic Solar Energy Conference and
Exhibition, Lisbon, Portugal: WIP. https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50'
bibtex: '@inproceedings{Feng_Hamelmann_Zhang_Ding_Hempelmann_Diehl_Pfeil_Brandt_Friedrich_Amin_2020,
title={Performance Analysis of Polycrystalline Module Based on Faults Causes},
DOI={10.4229/EUPVSEC20202020-4AV.2.50},
publisher={WIP}, author={Feng, Li and Hamelmann, Frank and Zhang, J. and Ding,
K. and Hempelmann, S. and Diehl, M. and Pfeil, T. and Brandt, S. and Friedrich,
W. and Amin, N.}, year={2020} }'
chicago: Feng, Li, Frank Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl,
T. Pfeil, S. Brandt, W. Friedrich, and N. Amin. “Performance Analysis of Polycrystalline
Module Based on Faults Causes.” WIP, 2020. https://doi.org/10.4229/EUPVSEC20202020-4AV.2.50.
ieee: L. Feng et al., “Performance Analysis of Polycrystalline Module Based
on Faults Causes,” presented at the 37th European Photovoltaic Solar Energy Conference
and Exhibition, Lisbon, Portugal, 2020.
mla: Feng, Li, et al. Performance Analysis of Polycrystalline Module Based on
Faults Causes. WIP, 2020, doi:10.4229/EUPVSEC20202020-4AV.2.50.
short: 'L. Feng, F. Hamelmann, J. Zhang, K. Ding, S. Hempelmann, M. Diehl, T. Pfeil,
S. Brandt, W. Friedrich, N. Amin, in: WIP, 2020.'
conference:
end_date: 2020-09-11
location: Lisbon, Portugal
name: 37th European Photovoltaic Solar Energy Conference and Exhibition
start_date: 2020-09-07
date_created: 2023-09-01T08:32:56Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.4229/EUPVSEC20202020-4AV.2.50
jel:
- C6
language:
- iso: eng
main_file_link:
- open_access: '1'
url: https://www.researchgate.net/publication/344960005_PERFORMANCE_ANALYSIS_OF_POLYCRYSTALLINE_MODULE_BASED_ON_FAULTS_CAUSES
oa: '1'
publication_status: published
publisher: WIP
status: public
title: Performance Analysis of Polycrystalline Module Based on Faults Causes
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3508'
author:
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Yongjie
full_name: Liu, Yongjie
last_name: Liu
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
citation:
alphadin: 'Zhang, Jingwei ; Liu, Yongjie ; Ding,
Kun ; Feng, Li ; Hamelmann,
Frank ; Chen, Xiang: Model
Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions. In:
47th IEEE Photovoltaic Specialists Conference (PVSC) : IEEE, 2020, S. 2509–2512'
ama: 'Zhang J, Liu Y, Ding K, Feng L, Hamelmann F, Chen X. Model Parameter Analysis
of Cracked Photovoltaic Module under Outdoor Conditions. In: 47th IEEE Photovoltaic
Specialists Conference (PVSC). IEEE; 2020:2509-2512. doi:10.1109/PVSC45281.2020.9300720'
apa: 'Zhang, J., Liu, Y., Ding, K., Feng, L., Hamelmann, F., & Chen, X. (2020).
Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.
In 47th IEEE Photovoltaic Specialists Conference (PVSC) (pp. 2509–2512).
Calgary, AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300720'
bibtex: '@inproceedings{Zhang_Liu_Ding_Feng_Hamelmann_Chen_2020, title={Model Parameter
Analysis of Cracked Photovoltaic Module under Outdoor Conditions}, DOI={10.1109/PVSC45281.2020.9300720},
booktitle={47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Zhang, Jingwei and Liu, Yongjie and Ding, Kun and Feng, Li and Hamelmann,
Frank and Chen, Xiang}, year={2020}, pages={2509–2512} }'
chicago: Zhang, Jingwei, Yongjie Liu, Kun Ding, Li Feng, Frank Hamelmann, and Xiang
Chen. “Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions.”
In 47th IEEE Photovoltaic Specialists Conference (PVSC), 2509–12. IEEE,
2020. https://doi.org/10.1109/PVSC45281.2020.9300720.
ieee: J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, and X. Chen, “Model Parameter
Analysis of Cracked Photovoltaic Module under Outdoor Conditions,” in 47th
IEEE Photovoltaic Specialists Conference (PVSC), Calgary, AB, Canada, 2020,
pp. 2509–2512.
mla: Zhang, Jingwei, et al. “Model Parameter Analysis of Cracked Photovoltaic Module
under Outdoor Conditions.” 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2509–12, doi:10.1109/PVSC45281.2020.9300720.
short: 'J. Zhang, Y. Liu, K. Ding, L. Feng, F. Hamelmann, X. Chen, in: 47th IEEE
Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2509–2512.'
conference:
end_date: 2020-08-21
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
start_date: 2020-06-15
date_created: 2023-09-01T08:36:48Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300720
language:
- iso: eng
page: 2509-2512
publication: 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: Model Parameter Analysis of Cracked Photovoltaic Module under Outdoor Conditions
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3509'
author:
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Xiang
full_name: Chen, Xiang
last_name: Chen
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Shuai
full_name: Weng, Shuai
last_name: Weng
citation:
alphadin: 'Ding, Kun ; Chen,
Xiang ; Zhang, Jingwei ;
Feng, Li ; Hamelmann,
Frank ; Weng, Shuai: Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM. In: 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC) : IEEE, 2020, S. 2532–2537'
ama: 'Ding K, Chen X, Zhang J, Feng L, Hamelmann F, Weng S. Photovoltaic Array Power
Prediction Model Based on EEMD and PSO-KELM. In: 2020 47th IEEE Photovoltaic
Specialists Conference (PVSC). IEEE; 2020:2532-2537. doi:10.1109/PVSC45281.2020.9300587'
apa: 'Ding, K., Chen, X., Zhang, J., Feng, L., Hamelmann, F., & Weng, S. (2020).
Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM. In 2020
47th IEEE Photovoltaic Specialists Conference (PVSC) (pp. 2532–2537). Calgary,
AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300587'
bibtex: '@inproceedings{Ding_Chen_Zhang_Feng_Hamelmann_Weng_2020, title={Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM}, DOI={10.1109/PVSC45281.2020.9300587},
booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Ding, Kun and Chen, Xiang and Zhang, Jingwei and Feng, Li and Hamelmann,
Frank and Weng, Shuai}, year={2020}, pages={2532–2537} }'
chicago: Ding, Kun, Xiang Chen, Jingwei Zhang, Li Feng, Frank Hamelmann, and Shuai
Weng. “Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM.”
In 2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 2532–37.
IEEE, 2020. https://doi.org/10.1109/PVSC45281.2020.9300587.
ieee: K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, and S. Weng, “Photovoltaic
Array Power Prediction Model Based on EEMD and PSO-KELM,” in 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC), Calgary, AB, Canada, 2020, pp.
2532–2537.
mla: Ding, Kun, et al. “Photovoltaic Array Power Prediction Model Based on EEMD
and PSO-KELM.” 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2532–37, doi:10.1109/PVSC45281.2020.9300587.
short: 'K. Ding, X. Chen, J. Zhang, L. Feng, F. Hamelmann, S. Weng, in: 2020 47th
IEEE Photovoltaic Specialists Conference (PVSC), IEEE, 2020, pp. 2532–2537.'
conference:
end_date: 2020-08-21
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
start_date: 2020-06-15
date_created: 2023-09-01T08:38:39Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300587
language:
- iso: eng
page: 2532-2537
publication: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: Photovoltaic Array Power Prediction Model Based on EEMD and PSO-KELM
type: conference
user_id: '216459'
year: '2020'
...
---
_id: '3510'
author:
- first_name: Li
full_name: Feng, Li
id: '237630'
last_name: Feng
- first_name: Frank
full_name: Hamelmann, Frank
id: '208487'
last_name: Hamelmann
orcid: 0000-0001-6141-9874
- first_name: Jingwei
full_name: Zhang, Jingwei
last_name: Zhang
- first_name: Kun
full_name: Ding, Kun
last_name: Ding
- first_name: Matthias
full_name: Diehl, Matthias
last_name: Diehl
- first_name: Thomas
full_name: Pfeil, Thomas
last_name: Pfeil
- first_name: Steffen
full_name: Brandt, Steffen
last_name: Brandt
- first_name: Werner
full_name: Friedrich, Werner
last_name: Friedrich
- first_name: Nowshad
full_name: Amin, Nowshad
last_name: Amin
citation:
alphadin: 'Feng,
Li ; Hamelmann, Frank ; Zhang, Jingwei ; Ding,
Kun ; Diehl, Matthias ; Pfeil, Thomas ; Brandt,
Steffen ; Friedrich, Werner
; u. a.: A Novel Method to Evaluate Irradiance in PV Field without Irradiance
Sensors. In: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) :
IEEE, 2020, S. 2496–2501'
ama: 'Feng L, Hamelmann F, Zhang J, et al. A Novel Method to Evaluate Irradiance
in PV Field without Irradiance Sensors. In: 2020 47th IEEE Photovoltaic Specialists
Conference (PVSC). IEEE; 2020:2496-2501. doi:10.1109/PVSC45281.2020.9300796'
apa: 'Feng, L., Hamelmann, F., Zhang, J., Ding, K., Diehl, M., Pfeil, T., … Amin,
N. (2020). A Novel Method to Evaluate Irradiance in PV Field without Irradiance
Sensors. In 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) (pp.
2496–2501). Calgary, AB, Canada: IEEE. https://doi.org/10.1109/PVSC45281.2020.9300796'
bibtex: '@inproceedings{Feng_Hamelmann_Zhang_Ding_Diehl_Pfeil_Brandt_Friedrich_Amin_2020,
title={A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors},
DOI={10.1109/PVSC45281.2020.9300796},
booktitle={2020 47th IEEE Photovoltaic Specialists Conference (PVSC)}, publisher={IEEE},
author={Feng, Li and Hamelmann, Frank and Zhang, Jingwei and Ding, Kun and Diehl,
Matthias and Pfeil, Thomas and Brandt, Steffen and Friedrich, Werner and Amin,
Nowshad}, year={2020}, pages={2496–2501} }'
chicago: Feng, Li, Frank Hamelmann, Jingwei Zhang, Kun Ding, Matthias Diehl, Thomas
Pfeil, Steffen Brandt, Werner Friedrich, and Nowshad Amin. “A Novel Method to
Evaluate Irradiance in PV Field without Irradiance Sensors.” In 2020 47th IEEE
Photovoltaic Specialists Conference (PVSC), 2496–2501. IEEE, 2020. https://doi.org/10.1109/PVSC45281.2020.9300796.
ieee: L. Feng et al., “A Novel Method to Evaluate Irradiance in PV Field
without Irradiance Sensors,” in 2020 47th IEEE Photovoltaic Specialists Conference
(PVSC), Calgary, AB, Canada, 2020, pp. 2496–2501.
mla: Feng, Li, et al. “A Novel Method to Evaluate Irradiance in PV Field without
Irradiance Sensors.” 2020 47th IEEE Photovoltaic Specialists Conference (PVSC),
IEEE, 2020, pp. 2496–501, doi:10.1109/PVSC45281.2020.9300796.
short: 'L. Feng, F. Hamelmann, J. Zhang, K. Ding, M. Diehl, T. Pfeil, S. Brandt,
W. Friedrich, N. Amin, in: 2020 47th IEEE Photovoltaic Specialists Conference
(PVSC), IEEE, 2020, pp. 2496–2501.'
conference:
location: Calgary, AB, Canada
name: 2020 IEEE 47th Photovoltaic Specialists Conference (PVSC)
date_created: 2023-09-01T08:39:42Z
date_updated: 2026-03-17T15:28:45Z
doi: 10.1109/PVSC45281.2020.9300796
language:
- iso: eng
page: 2496-2501
publication: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
publication_identifier:
eisbn:
- 978-1-7281-6115-0
publication_status: published
publisher: IEEE
status: public
title: A Novel Method to Evaluate Irradiance in PV Field without Irradiance Sensors
type: conference
user_id: '245590'
year: '2020'
...