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Al₂O₃‐Functionalized Carbon Nanomembranes with Enhanced Water Permeance and Selectivity for Efficient Air Dehumidification. <i>Advanced Functional Materials</i>. 2025;35(25). doi:<a href=\"https://doi.org/10.1002/adfm.202418806\">10.1002/adfm.202418806</a>","short":"J. Biedinger, Z. Yao, M. Wortmann, M. Westphal, N. Frese, R. Gehra, N. Brandt, B.P. Kaltschmidt, A. Hütten, A. Gölzhäuser, G. 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Biedinger <i>et al.</i>, “Al₂O₃‐Functionalized Carbon Nanomembranes with Enhanced Water Permeance and Selectivity for Efficient Air Dehumidification,” <i>Advanced Functional Materials</i>, vol. 35, no. 25, 2025."},"status":"public","doi":"10.1002/adfm.202418806","intvolume":"        35","date_updated":"2026-04-28T14:42:47Z","publisher":"Wiley","oa":"1","project":[{"name":"Bielefelder Institut für Angewandte Materialforschung","_id":"f89a05bb-bcea-11ed-9442-ed382659bc06"}],"type":"journal_article","publication_identifier":{"eissn":["1616-3028"],"issn":["1616-301X"]},"main_file_link":[{"open_access":"1"}],"user_id":"257163","issue":"25","publication_status":"published","publication":"Advanced Functional Materials","quality_controlled":"1","date_created":"2026-02-05T14:22:46Z","title":"Al₂O₃‐Functionalized Carbon Nanomembranes with Enhanced Water Permeance and Selectivity for Efficient Air Dehumidification","volume":35},{"status":"public","citation":{"bibtex":"@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et al._2025, title={Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum}, DOI={<a href=\"https://doi.org/10.48550/ARXIV.2504.06875\">10.48550/ARXIV.2504.06875</a>}, journal={arXiv}, publisher={arXiv}, author={Wortmann, Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese, Natalie and Jakob, Gerhard and et al.}, year={2025} }","apa":"Wortmann, M., Bednarz, B., Nezafat, N. 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Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum. <i>ArXiv</i>. <a href=\"https://doi.org/10.48550/ARXIV.2504.06875\">https://doi.org/10.48550/ARXIV.2504.06875</a>","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Wortmann, Martin</span> ; <span style=\"font-variant:small-caps;\">Bednarz, Beatrice</span> ; <span style=\"font-variant:small-caps;\">Nezafat, Negin Beryani</span> ; <span style=\"font-variant:small-caps;\">Viertel, Klaus</span> ; <span style=\"font-variant:small-caps;\">Kuschel, Olga</span> ; <span style=\"font-variant:small-caps;\">Schmalhorst, Jan</span> ; <span style=\"font-variant:small-caps;\">Ennen, Inga</span> ; <span style=\"font-variant:small-caps;\">Gärner, Maik</span> ; u. a.</span>: Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum. In: <i>arXiv</i>, arXiv (2025)","ieee":"M. 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Kuschel, ArXiv (2025).","chicago":"Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel, Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of All Emission Peaks in Its X-Ray Photoelectron Spectrum.” <i>ArXiv</i>, 2025. <a href=\"https://doi.org/10.48550/ARXIV.2504.06875\">https://doi.org/10.48550/ARXIV.2504.06875</a>."},"author":[{"first_name":"Martin","full_name":"Wortmann, Martin","last_name":"Wortmann"},{"full_name":"Bednarz, Beatrice","last_name":"Bednarz","first_name":"Beatrice"},{"last_name":"Nezafat","full_name":"Nezafat, Negin Beryani","first_name":"Negin Beryani"},{"orcid":"0000-0001-8851-8434","full_name":"Viertel, Klaus","last_name":"Viertel","first_name":"Klaus","id":"215306"},{"last_name":"Kuschel","full_name":"Kuschel, Olga","first_name":"Olga"},{"last_name":"Schmalhorst","full_name":"Schmalhorst, Jan","first_name":"Jan"},{"full_name":"Ennen, Inga","last_name":"Ennen","first_name":"Inga"},{"first_name":"Maik","full_name":"Gärner, Maik","last_name":"Gärner"},{"last_name":"Frese","full_name":"Frese, Natalie","id":"257163","first_name":"Natalie"},{"full_name":"Jakob, Gerhard","last_name":"Jakob","first_name":"Gerhard"},{"first_name":"Joachim","last_name":"Wollschläger","full_name":"Wollschläger, Joachim"},{"last_name":"Schierning","full_name":"Schierning, Gabi","first_name":"Gabi"},{"first_name":"Andreas","full_name":"Hütten, Andreas","last_name":"Hütten"},{"first_name":"Timo","full_name":"Kuschel, Timo","last_name":"Kuschel"}],"date_updated":"2026-04-28T14:42:32Z","publisher":"arXiv","doi":"10.48550/ARXIV.2504.06875","language":[{"iso":"eng"}],"_id":"6572","year":"2025","quality_controlled":"1","date_created":"2026-02-05T14:21:55Z","title":"Surface Oxidation of SnTe Analyzed by Self-Consistent Fitting of all Emission Peaks in its X-ray Photoelectron Spectrum","main_file_link":[{"open_access":"1"}],"user_id":"257163","project":[{"name":"Bielefelder Institut für Angewandte Materialforschung","_id":"f89a05bb-bcea-11ed-9442-ed382659bc06"}],"oa":"1","type":"journal_article","publication":"arXiv","publication_status":"published"},{"article_type":"original","title":"Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe","date_created":"2026-02-05T14:19:41Z","volume":713,"quality_controlled":"1","publication_status":"published","publication":"Applied Surface Science","publication_identifier":{"issn":["0169-4332"]},"type":"journal_article","project":[{"_id":"f89a05bb-bcea-11ed-9442-ed382659bc06","name":"Bielefelder Institut für Angewandte Materialforschung"}],"user_id":"257163","intvolume":"       713","doi":"10.1016/j.apsusc.2025.164356","publisher":"Elsevier BV","date_updated":"2026-04-28T14:39:46Z","author":[{"first_name":"Martin","full_name":"Wortmann, Martin","last_name":"Wortmann"},{"first_name":"Beatrice","last_name":"Bednarz","full_name":"Bednarz, Beatrice"},{"first_name":"Negin Beryani","full_name":"Nezafat, Negin Beryani","last_name":"Nezafat"},{"full_name":"Viertel, Klaus","orcid":"0000-0001-8851-8434","last_name":"Viertel","id":"215306","first_name":"Klaus"},{"first_name":"Olga","last_name":"Kuschel","full_name":"Kuschel, Olga"},{"first_name":"Jan","last_name":"Schmalhorst","full_name":"Schmalhorst, Jan"},{"first_name":"Inga","full_name":"Ennen, Inga","last_name":"Ennen"},{"first_name":"Maik","last_name":"Gärner","full_name":"Gärner, Maik"},{"full_name":"Frese, Natalie","last_name":"Frese","first_name":"Natalie","id":"257163"},{"first_name":"Gerhard","full_name":"Jakob, Gerhard","last_name":"Jakob"},{"full_name":"Wollschläger, Joachim","last_name":"Wollschläger","first_name":"Joachim"},{"full_name":"Schierning, Gabi","last_name":"Schierning","first_name":"Gabi"},{"first_name":"Andreas","full_name":"Hütten, Andreas","last_name":"Hütten"},{"full_name":"Kuschel, Timo","last_name":"Kuschel","first_name":"Timo"}],"citation":{"mla":"Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i>, vol. 713, 164356, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>.","ama":"Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied Surface Science</i>. 2025;713. doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>","chicago":"Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel, Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i> 713 (2025). <a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">https://doi.org/10.1016/j.apsusc.2025.164356</a>.","short":"M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel, Applied Surface Science 713 (2025).","alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Wortmann, Martin</span> ; <span style=\"font-variant:small-caps;\">Bednarz, Beatrice</span> ; <span style=\"font-variant:small-caps;\">Nezafat, Negin Beryani</span> ; <span style=\"font-variant:small-caps;\">Viertel, Klaus</span> ; <span style=\"font-variant:small-caps;\">Kuschel, Olga</span> ; <span style=\"font-variant:small-caps;\">Schmalhorst, Jan</span> ; <span style=\"font-variant:small-caps;\">Ennen, Inga</span> ; <span style=\"font-variant:small-caps;\">Gärner, Maik</span> ; u. a.</span>: Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In: <i>Applied Surface Science</i> Bd. 713, Elsevier BV (2025)","apa":"Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst, J., … Kuschel, T. (2025). 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Wortmann <i>et al.</i>, “Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” <i>Applied Surface Science</i>, vol. 713, 2025."},"status":"public","article_number":"164356","year":"2025","_id":"6571","language":[{"iso":"eng"}]},{"project":[{"name":"Bielefelder Institut für Angewandte Materialforschung","_id":"f89a05bb-bcea-11ed-9442-ed382659bc06"}],"publication_identifier":{"issn":["2942-6545"]},"type":"journal_article","user_id":"220548","publication":"Zeitschrift für angewandte Kunststofftechnik","issue":"2","publication_status":"published","date_created":"2025-08-06T12:28:14Z","title":"Sequenzielle Beschichtung von Silikon-Gießformen zur Standzeiterhöhung beim Polyurethan-Vakuumgießen","_id":"6121","year":"2024","language":[{"iso":"ger"}],"citation":{"ieee":"M. Wortmann, J. Brikmann, R. Petkau, N. Frese, and B. 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