{"publication_identifier":{"isbn":["0-7803-9380-5"]},"title":"A new measurement method to characterize ground planes","citation":{"mla":"Battermann, Sven, and H. Garbe. “A New Measurement Method to Characterize Ground Planes.” 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005., vol. 1, IEEE, 2005, pp. 234–38, doi:10.1109/ISEMC.2005.1513506.","bibtex":"@inproceedings{Battermann_Garbe_2005, title={A new measurement method to characterize ground planes}, volume={1}, DOI={10.1109/ISEMC.2005.1513506}, booktitle={2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.}, publisher={IEEE}, author={Battermann, Sven and Garbe, H.}, year={2005}, pages={234–238} }","apa":"Battermann, S., & Garbe, H. (2005). A new measurement method to characterize ground planes. In 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. (Vol. 1, pp. 234–238). Chicago, Il, USA: IEEE. https://doi.org/10.1109/ISEMC.2005.1513506","short":"S. Battermann, H. Garbe, in: 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005., IEEE, 2005, pp. 234–238.","ama":"Battermann S, Garbe H. A new measurement method to characterize ground planes. In: 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Vol 1. IEEE; 2005:234-238. doi:10.1109/ISEMC.2005.1513506","ieee":"S. Battermann and H. Garbe, “A new measurement method to characterize ground planes,” in 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005., Chicago, Il, USA, 2005, vol. 1, pp. 234–238.","alphadin":"Battermann, Sven ; Garbe, H.: A new measurement method to characterize ground planes. In: 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.. Bd. 1 : IEEE, 2005, S. 234–238","chicago":"Battermann, Sven, and H. Garbe. “A New Measurement Method to Characterize Ground Planes.” In 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005., 1:234–38. IEEE, 2005. https://doi.org/10.1109/ISEMC.2005.1513506."},"quality_controlled":"1","user_id":"219522","language":[{"iso":"eng"}],"page":"234-238","doi":"10.1109/ISEMC.2005.1513506","intvolume":" 1","volume":1,"type":"conference","publication":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","extern":"1","publisher":"IEEE","_id":"2134","year":"2005","date_created":"2022-09-24T09:06:23Z","date_updated":"2023-05-30T21:08:36Z","status":"public","publication_status":"published","conference":{"location":"Chicago, Il, USA","name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005."},"author":[{"first_name":"Sven","id":"219522","last_name":"Battermann","full_name":"Battermann, Sven","orcid":"0000-0001-7203-7396"},{"first_name":"H.","last_name":"Garbe","full_name":"Garbe, H."}]}