---
res:
  bibo_authorlist:
  - foaf_Person:
      foaf_givenName: J.
      foaf_name: Schleiwies, J.
      foaf_surname: Schleiwies
  - foaf_Person:
      foaf_givenName: G.
      foaf_name: Schmitz, G.
      foaf_surname: Schmitz
  - foaf_Person:
      foaf_givenName: Sonja
      foaf_name: Heitmann, Sonja
      foaf_surname: Heitmann
      foaf_workInfoHomepage: http://www.librecat.org/personId=202389
    orcid: 0000-0002-5503-2128
  - foaf_Person:
      foaf_givenName: A.
      foaf_name: Hütten, A.
      foaf_surname: Hütten
  bibo_doi: 10.1063/1.1374999
  bibo_issue: '22'
  bibo_volume: 78
  dct_date: 2001^xs_gYear
  dct_isPartOf:
  - http://id.crossref.org/issn/0003-6951
  - http://id.crossref.org/issn/1077-3118
  dct_language: eng
  dct_publisher: AIP Publishing@
  dct_title: Nanoanalysis of Co/Cu/NiFe thin films by tomographic atom probe@
...