{"user_id":"202389","date_created":"2023-03-24T13:13:02Z","publication":"Acta Materialia","volume":47,"type":"journal_article","quality_controlled":"1","date_updated":"2026-03-17T15:28:35Z","author":[{"last_name":"Hütten","full_name":"Hütten, A.","first_name":"A."},{"first_name":"S.","full_name":"Mrozek, S.","last_name":"Mrozek"},{"first_name":"Sonja","id":"202389","full_name":"Heitmann, Sonja","orcid":"0000-0002-5503-2128","last_name":"Heitmann"},{"first_name":"T.","full_name":"Hempel, T.","last_name":"Hempel"},{"first_name":"H.","full_name":"Brückl, H.","last_name":"Brückl"},{"full_name":"Reiss, G.","last_name":"Reiss","first_name":"G."}],"department":[{"_id":"103"}],"page":"4245-4252","citation":{"bibtex":"@article{Hütten_Mrozek_Heitmann_Hempel_Brückl_Reiss_1999, title={Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films}, volume={47}, DOI={<a href=\"https://doi.org/10.1016/S1359-6454(99)00283-9\">10.1016/S1359-6454(99)00283-9</a>}, number={15–16}, journal={Acta Materialia}, publisher={Elsevier BV}, author={Hütten, A. and Mrozek, S. and Heitmann, Sonja and Hempel, T. and Brückl, H. and Reiss, G.}, year={1999}, pages={4245–4252} }","mla":"Hütten, A., et al. “Evolution of the GMR-Effect Amplitude in Copper/Permalloy-Multilayered Thin Films.” <i>Acta Materialia</i>, vol. 47, no. 15–16, Elsevier BV, 1999, pp. 4245–52, doi:<a href=\"https://doi.org/10.1016/S1359-6454(99)00283-9\">10.1016/S1359-6454(99)00283-9</a>.","alphadin":"<span style=\"font-variant:small-caps;\">Hütten, A.</span> ; <span style=\"font-variant:small-caps;\">Mrozek, S.</span> ; <span style=\"font-variant:small-caps;\">Heitmann, Sonja</span> ; <span style=\"font-variant:small-caps;\">Hempel, T.</span> ; <span style=\"font-variant:small-caps;\">Brückl, H.</span> ; <span style=\"font-variant:small-caps;\">Reiss, G.</span>: Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films. In: <i>Acta Materialia</i> Bd. 47, Elsevier BV (1999), Nr. 15–16, S. 4245–4252","short":"A. Hütten, S. Mrozek, S. Heitmann, T. Hempel, H. Brückl, G. Reiss, Acta Materialia 47 (1999) 4245–4252.","ama":"Hütten A, Mrozek S, Heitmann S, Hempel T, Brückl H, Reiss G. Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films. <i>Acta Materialia</i>. 1999;47(15-16):4245-4252. doi:<a href=\"https://doi.org/10.1016/S1359-6454(99)00283-9\">10.1016/S1359-6454(99)00283-9</a>","chicago":"Hütten, A., S. Mrozek, Sonja Heitmann, T. Hempel, H. Brückl, and G. Reiss. “Evolution of the GMR-Effect Amplitude in Copper/Permalloy-Multilayered Thin Films.” <i>Acta Materialia</i> 47, no. 15–16 (1999): 4245–52. <a href=\"https://doi.org/10.1016/S1359-6454(99)00283-9\">https://doi.org/10.1016/S1359-6454(99)00283-9</a>.","ieee":"A. Hütten, S. Mrozek, S. Heitmann, T. Hempel, H. Brückl, and G. Reiss, “Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films,” <i>Acta Materialia</i>, vol. 47, no. 15–16, pp. 4245–4252, 1999.","apa":"Hütten, A., Mrozek, S., Heitmann, S., Hempel, T., Brückl, H., &#38; Reiss, G. (1999). Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films. <i>Acta Materialia</i>, <i>47</i>(15–16), 4245–4252. <a href=\"https://doi.org/10.1016/S1359-6454(99)00283-9\">https://doi.org/10.1016/S1359-6454(99)00283-9</a>"},"issue":"15-16","doi":"10.1016/S1359-6454(99)00283-9","research_group":[{"name":"Bielefelder Institut für Angewandte Materialforschung (BIfAM)","_id":"af778127-b366-11ed-bde2-daed2b8eafee"}],"publication_identifier":{"issn":["13596454"]},"_id":"2686","year":"1999","title":"Evolution of the GMR-effect amplitude in copper/permalloy-multilayered thin films","publisher":"Elsevier BV","intvolume":"        47","publication_status":"published","extern":"1","status":"public","language":[{"iso":"eng"}]}