{"main_file_link":[{"url":"https://www.researchgate.net/publication/265207565_Measurement_and_calculation_of_effects_on_the_electric_field_due_to_the_limited_size_of_an_open_area_test_site"}],"department":[{"_id":"102"}],"year":"2004","quality_controlled":"1","volume":1,"publication":"International Symposium on Electromagnetic Compatibility, EMC Europe 2004","publisher":"Technische Universiteit Eindhoven","page":"116-120","status":"public","publication_identifier":{"unknown":["90-6144-990-1"]},"date_updated":"2024-11-29T16:38:44Z","conference":{"name":"EMC Europe 2004","end_date":"2004-09-10","start_date":"2004-09-06","location":"Einhoven"},"type":"conference","author":[{"last_name":"Battermann","first_name":"Sven","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7203-7396/work/172778206","orcid":"0000-0001-7203-7396","id":"219522","full_name":"Battermann, Sven"},{"first_name":"Heyno","last_name":"Garbe","full_name":"Garbe, Heyno"}],"extern":"1","date_created":"2023-05-31T13:43:50Z","user_id":"220548","intvolume":" 1","place":"Eindhoven","publication_status":"published","citation":{"ama":"Battermann S, Garbe H. Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In: van Deursen APJ, Wouters PAA., Kapora S, eds. International Symposium on Electromagnetic Compatibility, EMC Europe 2004. Vol 1. Eindhoven: Technische Universiteit Eindhoven; 2004:116-120.","mla":"Battermann, Sven, and Heyno Garbe. “Measurements and Calculation of Effects on the Electrical Field Due to the Limited Size of an Open Area Test Site.” International Symposium on Electromagnetic Compatibility, EMC Europe 2004, edited by A.P.J. van Deursen et al., vol. 1, Technische Universiteit Eindhoven, 2004, pp. 116–20.","ieee":"S. Battermann and H. Garbe, “Measurements and calculation of effects on the electrical field due to the limited size of an open area test site,” in International Symposium on Electromagnetic Compatibility, EMC Europe 2004, Einhoven, 2004, vol. 1, pp. 116–120.","alphadin":"Battermann, Sven ; Garbe, Heyno: Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In: van Deursen, A. P. J. ; Wouters, P. A. A. . ; Kapora, S. (Hrsg.): International Symposium on Electromagnetic Compatibility, EMC Europe 2004. Bd. 1. Eindhoven : Technische Universiteit Eindhoven, 2004, S. 116–120","apa":"Battermann, S., & Garbe, H. (2004). Measurements and calculation of effects on the electrical field due to the limited size of an open area test site. In A. P. J. van Deursen, P. A. A. . Wouters, & S. Kapora (Eds.), International Symposium on Electromagnetic Compatibility, EMC Europe 2004 (Vol. 1, pp. 116–120). Eindhoven: Technische Universiteit Eindhoven.","chicago":"Battermann, Sven, and Heyno Garbe. “Measurements and Calculation of Effects on the Electrical Field Due to the Limited Size of an Open Area Test Site.” In International Symposium on Electromagnetic Compatibility, EMC Europe 2004, edited by A.P.J. van Deursen, P.A.A.F Wouters, and S. Kapora, 1:116–20. Eindhoven: Technische Universiteit Eindhoven, 2004.","bibtex":"@inproceedings{Battermann_Garbe_2004, place={Eindhoven}, title={Measurements and calculation of effects on the electrical field due to the limited size of an open area test site}, volume={1}, booktitle={International Symposium on Electromagnetic Compatibility, EMC Europe 2004}, publisher={Technische Universiteit Eindhoven}, author={Battermann, Sven and Garbe, Heyno}, editor={van Deursen, A.P.J. and Wouters, P.A.A.F and Kapora, S.Editors}, year={2004}, pages={116–120} }","short":"S. Battermann, H. Garbe, in: A.P.J. van Deursen, P.A.A.. Wouters, S. Kapora (Eds.), International Symposium on Electromagnetic Compatibility, EMC Europe 2004, Technische Universiteit Eindhoven, Eindhoven, 2004, pp. 116–120."},"_id":"3118","title":"Measurements and calculation of effects on the electrical field due to the limited size of an open area test site","language":[{"iso":"eng"}],"editor":[{"full_name":"van Deursen, A.P.J.","last_name":"van Deursen","first_name":"A.P.J."},{"full_name":"Wouters, P.A.A.F","first_name":"P.A.A.F","last_name":"Wouters"},{"full_name":"Kapora, S.","first_name":"S.","last_name":"Kapora"}]}