{"publication_identifier":{"eisbn":["979-8-3503-6123-0"]},"status":"public","conference":{"location":"Padova, Italy","start_date":"2024-09-10","end_date":"2024-09-13","name":"2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)"},"date_updated":"2024-11-04T07:52:08Z","type":"conference","author":[{"first_name":"Franziska","last_name":"Zelba","full_name":"Zelba, Franziska"},{"last_name":"Balzereit","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-9203-5902/work/170624544","first_name":"Kaja","full_name":"Balzereit, Kaja","id":"255787","orcid":"0000-0001-9203-5902"},{"full_name":"Windmann, Stefan","last_name":"Windmann","first_name":"Stefan"}],"quality_controlled":"1","year":"2024","page":"1-4","publisher":"IEEE","publication":"2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)","citation":{"chicago":"Zelba, Franziska, Kaja Balzereit, and Stefan Windmann. “Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing.” In 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), edited by IEEE, 1–4. IEEE, 2024. https://doi.org/10.1109/ETFA61755.2024.10710991.","short":"F. Zelba, K. Balzereit, S. Windmann, in: IEEE (Ed.), 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, 2024, pp. 1–4.","bibtex":"@inproceedings{Zelba_Balzereit_Windmann_2024, title={Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing}, DOI={10.1109/ETFA61755.2024.10710991}, booktitle={2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)}, publisher={IEEE}, author={Zelba, Franziska and Balzereit, Kaja and Windmann, Stefan}, editor={IEEEEditor}, year={2024}, pages={1–4} }","ama":"Zelba F, Balzereit K, Windmann S. Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing. In: IEEE, ed. 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE; 2024:1-4. doi:10.1109/ETFA61755.2024.10710991","alphadin":"Zelba, Franziska ; Balzereit, Kaja ; Windmann, Stefan: Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing. In: IEEE (Hrsg.): 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) : IEEE, 2024, S. 1–4","apa":"Zelba, F., Balzereit, K., & Windmann, S. (2024). Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing. In IEEE (Ed.), 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA) (pp. 1–4). Padova, Italy: IEEE. https://doi.org/10.1109/ETFA61755.2024.10710991","mla":"Zelba, Franziska, et al. “Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing.” 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), edited by IEEE, IEEE, 2024, pp. 1–4, doi:10.1109/ETFA61755.2024.10710991.","ieee":"F. Zelba, K. Balzereit, and S. Windmann, “Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing,” in 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA), Padova, Italy, 2024, pp. 1–4."},"title":"Concepts and Measures Towards Trustworthy AI in Industrial Manufacturing","abstract":[{"text":"Artificial intelligence (AI) is becoming increasingly popular in the context of industrial manufacturing. However, in industrial manufacturing in particular, it is important to ensure the trustworthiness of AI. In this article, we give an overview of different aspects of trustworthy AI in this context. At first, we divide the topic into three different components, namely data, algorithm, and IT infrastructure. We identify several aspects of these components that are required for the trustworthy use of AI. Measures to achieve trustworthy AI are then derived and illustrated on the basis of a specific use case. It is further intended in the ongoing work to evaluate the impact of the individual measures.","lang":"eng"}],"_id":"5077","language":[{"iso":"eng"}],"date_created":"2024-10-30T13:52:46Z","corporate_editor":["IEEE"],"user_id":"220548","doi":"10.1109/ETFA61755.2024.10710991","publication_status":"published"}