{"publisher":"Elsevier BV","date_updated":"2026-02-06T09:15:33Z","intvolume":"       713","doi":"10.1016/j.apsusc.2025.164356","status":"public","author":[{"first_name":"Martin","last_name":"Wortmann","full_name":"Wortmann, Martin"},{"full_name":"Bednarz, Beatrice","last_name":"Bednarz","first_name":"Beatrice"},{"first_name":"Negin Beryani","last_name":"Nezafat","full_name":"Nezafat, Negin Beryani"},{"full_name":"Viertel, Klaus","orcid":"0000-0001-8851-8434","last_name":"Viertel","id":"215306","first_name":"Klaus"},{"last_name":"Kuschel","full_name":"Kuschel, Olga","first_name":"Olga"},{"first_name":"Jan","last_name":"Schmalhorst","full_name":"Schmalhorst, Jan"},{"full_name":"Ennen, Inga","last_name":"Ennen","first_name":"Inga"},{"first_name":"Maik","full_name":"Gärner, Maik","last_name":"Gärner"},{"id":"257163","first_name":"Natalie","full_name":"Frese, Natalie","last_name":"Frese"},{"last_name":"Jakob","full_name":"Jakob, Gerhard","first_name":"Gerhard"},{"full_name":"Wollschläger, Joachim","last_name":"Wollschläger","first_name":"Joachim"},{"first_name":"Gabi","full_name":"Schierning, Gabi","last_name":"Schierning"},{"last_name":"Hütten","full_name":"Hütten, Andreas","first_name":"Andreas"},{"first_name":"Timo","last_name":"Kuschel","full_name":"Kuschel, Timo"}],"citation":{"alphadin":"<span style=\"font-variant:small-caps;\"><span style=\"font-variant:small-caps;\">Wortmann, Martin</span> ; <span style=\"font-variant:small-caps;\">Bednarz, Beatrice</span> ; <span style=\"font-variant:small-caps;\">Nezafat, Negin Beryani</span> ; <span style=\"font-variant:small-caps;\">Viertel, Klaus</span> ; <span style=\"font-variant:small-caps;\">Kuschel, Olga</span> ; <span style=\"font-variant:small-caps;\">Schmalhorst, Jan</span> ; <span style=\"font-variant:small-caps;\">Ennen, Inga</span> ; <span style=\"font-variant:small-caps;\">Gärner, Maik</span> ; u. a.</span>: Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. In: <i>Applied Surface Science</i> Bd. 713, Elsevier BV (2025)","bibtex":"@article{Wortmann_Bednarz_Nezafat_Viertel_Kuschel_Schmalhorst_Ennen_Gärner_Frese_Jakob_et al._2025, title={Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe}, volume={713}, DOI={<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>}, number={164356}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Wortmann, Martin and Bednarz, Beatrice and Nezafat, Negin Beryani and Viertel, Klaus and Kuschel, Olga and Schmalhorst, Jan and Ennen, Inga and Gärner, Maik and Frese, Natalie and Jakob, Gerhard and et al.}, year={2025} }","apa":"Wortmann, M., Bednarz, B., Nezafat, N. B., Viertel, K., Kuschel, O., Schmalhorst, J., … Kuschel, T. (2025). Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied Surface Science</i>, <i>713</i>. <a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">https://doi.org/10.1016/j.apsusc.2025.164356</a>","ieee":"M. Wortmann <i>et al.</i>, “Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe,” <i>Applied Surface Science</i>, vol. 713, 2025.","mla":"Wortmann, Martin, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i>, vol. 713, 164356, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>.","ama":"Wortmann M, Bednarz B, Nezafat NB, et al. Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe. <i>Applied Surface Science</i>. 2025;713. doi:<a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">10.1016/j.apsusc.2025.164356</a>","chicago":"Wortmann, Martin, Beatrice Bednarz, Negin Beryani Nezafat, Klaus Viertel, Olga Kuschel, Jan Schmalhorst, Inga Ennen, et al. “Oxidation State Depth Profiling by Self-Consistent Fitting of All Emission Peaks in the X-Ray Photoelectron Spectrum of SnTe.” <i>Applied Surface Science</i> 713 (2025). <a href=\"https://doi.org/10.1016/j.apsusc.2025.164356\">https://doi.org/10.1016/j.apsusc.2025.164356</a>.","short":"M. Wortmann, B. Bednarz, N.B. Nezafat, K. Viertel, O. Kuschel, J. Schmalhorst, I. Ennen, M. Gärner, N. Frese, G. Jakob, J. Wollschläger, G. Schierning, A. Hütten, T. Kuschel, Applied Surface Science 713 (2025)."},"article_number":"164356","language":[{"iso":"eng"}],"year":"2025","_id":"6571","volume":713,"title":"Oxidation state depth profiling by self-consistent fitting of all emission peaks in the X-ray photoelectron spectrum of SnTe","date_created":"2026-02-05T14:19:41Z","publication_status":"published","publication":"Applied Surface Science","user_id":"220548","publication_identifier":{"issn":["0169-4332"]},"type":"journal_article","project":[{"name":"Bielefelder Institut für Angewandte Materialforschung","_id":"f89a05bb-bcea-11ed-9442-ed382659bc06"}]}