[{"publisher":"IEEE","page":"1-8","date_updated":"2026-05-19T10:52:22Z","doi":"10.1109/ETFA52439.2022.9921546","conference":{"location":"Stuttgart, Germany","name":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)"},"status":"public","author":[{"last_name":"Ehrhardt","full_name":"Ehrhardt, Jonas","first_name":"Jonas"},{"first_name":"Malte","last_name":"Ramonat","full_name":"Ramonat, Malte"},{"first_name":"Rene","last_name":"Heesch","full_name":"Heesch, Rene"},{"orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-9203-5902/work/215089925","id":"255787","first_name":"Kaja","full_name":"Balzereit, Kaja","orcid":"0000-0001-9203-5902","last_name":"Balzereit"},{"last_name":"Diedrich","full_name":"Diedrich, Alexander","first_name":"Alexander"},{"first_name":"Oliver","full_name":"Niggemann, Oliver","last_name":"Niggemann"}],"citation":{"ieee":"J. Ehrhardt, M. Ramonat, R. Heesch, K. Balzereit, A. Diedrich, and O. Niggemann, “An AI benchmark for Diagnosis, Reconfiguration &#38; Planning,” in <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, Stuttgart, Germany, 2022, pp. 1–8.","apa":"Ehrhardt, J., Ramonat, M., Heesch, R., Balzereit, K., Diedrich, A., &#38; Niggemann, O. (2022). An AI benchmark for Diagnosis, Reconfiguration &#38; Planning. In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i> (pp. 1–8). Stuttgart, Germany: IEEE. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921546\">https://doi.org/10.1109/ETFA52439.2022.9921546</a>","bibtex":"@inproceedings{Ehrhardt_Ramonat_Heesch_Balzereit_Diedrich_Niggemann_2022, title={An AI benchmark for Diagnosis, Reconfiguration &#38; Planning}, DOI={<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921546\">10.1109/ETFA52439.2022.9921546</a>}, booktitle={2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)}, publisher={IEEE}, author={Ehrhardt, Jonas and Ramonat, Malte and Heesch, Rene and Balzereit, Kaja and Diedrich, Alexander and Niggemann, Oliver}, year={2022}, pages={1–8} }","alphadin":"<span style=\"font-variant:small-caps;\">Ehrhardt, Jonas</span> ; <span style=\"font-variant:small-caps;\">Ramonat, Malte</span> ; <span style=\"font-variant:small-caps;\">Heesch, Rene</span> ; <span style=\"font-variant:small-caps;\">Balzereit, Kaja</span> ; <span style=\"font-variant:small-caps;\">Diedrich, Alexander</span> ; <span style=\"font-variant:small-caps;\">Niggemann, Oliver</span>: An AI benchmark for Diagnosis, Reconfiguration &#38; Planning. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i> : IEEE, 2022, S. 1–8","chicago":"Ehrhardt, Jonas, Malte Ramonat, Rene Heesch, Kaja Balzereit, Alexander Diedrich, and Oliver Niggemann. “An AI Benchmark for Diagnosis, Reconfiguration &#38; Planning.” In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, 1–8. IEEE, 2022. <a href=\"https://doi.org/10.1109/ETFA52439.2022.9921546\">https://doi.org/10.1109/ETFA52439.2022.9921546</a>.","short":"J. Ehrhardt, M. Ramonat, R. Heesch, K. Balzereit, A. Diedrich, O. Niggemann, in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), IEEE, 2022, pp. 1–8.","ama":"Ehrhardt J, Ramonat M, Heesch R, Balzereit K, Diedrich A, Niggemann O. An AI benchmark for Diagnosis, Reconfiguration &#38; Planning. In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>. IEEE; 2022:1-8. doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921546\">10.1109/ETFA52439.2022.9921546</a>","mla":"Ehrhardt, Jonas, et al. “An AI Benchmark for Diagnosis, Reconfiguration &#38; Planning.” <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)</i>, IEEE, 2022, pp. 1–8, doi:<a href=\"https://doi.org/10.1109/ETFA52439.2022.9921546\">10.1109/ETFA52439.2022.9921546</a>."},"language":[{"iso":"eng"}],"year":"2022","_id":"6907","title":"An AI benchmark for Diagnosis, Reconfiguration & Planning","date_created":"2026-05-18T14:10:09Z","department":[{"_id":"103"}],"quality_controlled":"1","publication":"2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)","publication_status":"published","user_id":"261203","type":"conference","publication_identifier":{"eisbn":["978-1-6654-9996-5"]}}]