---
_id: '6907'
author:
- first_name: Jonas
  full_name: Ehrhardt, Jonas
  last_name: Ehrhardt
- first_name: Malte
  full_name: Ramonat, Malte
  last_name: Ramonat
- first_name: Rene
  full_name: Heesch, Rene
  last_name: Heesch
- first_name: Kaja
  full_name: Balzereit, Kaja
  id: '255787'
  last_name: Balzereit
  orcid: 0000-0001-9203-5902
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0001-9203-5902/work/215089925
- first_name: Alexander
  full_name: Diedrich, Alexander
  last_name: Diedrich
- first_name: Oliver
  full_name: Niggemann, Oliver
  last_name: Niggemann
citation:
  alphadin: '<span style="font-variant:small-caps;">Ehrhardt, Jonas</span> ; <span
    style="font-variant:small-caps;">Ramonat, Malte</span> ; <span style="font-variant:small-caps;">Heesch,
    Rene</span> ; <span style="font-variant:small-caps;">Balzereit, Kaja</span> ;
    <span style="font-variant:small-caps;">Diedrich, Alexander</span> ; <span style="font-variant:small-caps;">Niggemann,
    Oliver</span>: An AI benchmark for Diagnosis, Reconfiguration &#38; Planning.
    In: <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i> : IEEE, 2022, S. 1–8'
  ama: 'Ehrhardt J, Ramonat M, Heesch R, Balzereit K, Diedrich A, Niggemann O. An
    AI benchmark for Diagnosis, Reconfiguration &#38; Planning. In: <i>2022 IEEE 27th
    International Conference on Emerging Technologies and Factory Automation (ETFA)</i>.
    IEEE; 2022:1-8. doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921546">10.1109/ETFA52439.2022.9921546</a>'
  apa: 'Ehrhardt, J., Ramonat, M., Heesch, R., Balzereit, K., Diedrich, A., &#38;
    Niggemann, O. (2022). An AI benchmark for Diagnosis, Reconfiguration &#38; Planning.
    In <i>2022 IEEE 27th International Conference on Emerging Technologies and Factory
    Automation (ETFA)</i> (pp. 1–8). Stuttgart, Germany: IEEE. <a href="https://doi.org/10.1109/ETFA52439.2022.9921546">https://doi.org/10.1109/ETFA52439.2022.9921546</a>'
  bibtex: '@inproceedings{Ehrhardt_Ramonat_Heesch_Balzereit_Diedrich_Niggemann_2022,
    title={An AI benchmark for Diagnosis, Reconfiguration &#38; Planning}, DOI={<a
    href="https://doi.org/10.1109/ETFA52439.2022.9921546">10.1109/ETFA52439.2022.9921546</a>},
    booktitle={2022 IEEE 27th International Conference on Emerging Technologies and
    Factory Automation (ETFA)}, publisher={IEEE}, author={Ehrhardt, Jonas and Ramonat,
    Malte and Heesch, Rene and Balzereit, Kaja and Diedrich, Alexander and Niggemann,
    Oliver}, year={2022}, pages={1–8} }'
  chicago: Ehrhardt, Jonas, Malte Ramonat, Rene Heesch, Kaja Balzereit, Alexander
    Diedrich, and Oliver Niggemann. “An AI Benchmark for Diagnosis, Reconfiguration
    &#38; Planning.” In <i>2022 IEEE 27th International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, 1–8. IEEE, 2022. <a href="https://doi.org/10.1109/ETFA52439.2022.9921546">https://doi.org/10.1109/ETFA52439.2022.9921546</a>.
  ieee: J. Ehrhardt, M. Ramonat, R. Heesch, K. Balzereit, A. Diedrich, and O. Niggemann,
    “An AI benchmark for Diagnosis, Reconfiguration &#38; Planning,” in <i>2022 IEEE
    27th International Conference on Emerging Technologies and Factory Automation
    (ETFA)</i>, Stuttgart, Germany, 2022, pp. 1–8.
  mla: Ehrhardt, Jonas, et al. “An AI Benchmark for Diagnosis, Reconfiguration &#38;
    Planning.” <i>2022 IEEE 27th International Conference on Emerging Technologies
    and Factory Automation (ETFA)</i>, IEEE, 2022, pp. 1–8, doi:<a href="https://doi.org/10.1109/ETFA52439.2022.9921546">10.1109/ETFA52439.2022.9921546</a>.
  short: 'J. Ehrhardt, M. Ramonat, R. Heesch, K. Balzereit, A. Diedrich, O. Niggemann,
    in: 2022 IEEE 27th International Conference on Emerging Technologies and Factory
    Automation (ETFA), IEEE, 2022, pp. 1–8.'
conference:
  location: Stuttgart, Germany
  name: 2022 IEEE 27th International Conference on Emerging Technologies and Factory
    Automation (ETFA)
date_created: 2026-05-18T14:10:09Z
date_updated: 2026-05-19T10:52:22Z
department:
- _id: '103'
doi: 10.1109/ETFA52439.2022.9921546
language:
- iso: eng
page: 1-8
publication: 2022 IEEE 27th International Conference on Emerging Technologies and
  Factory Automation (ETFA)
publication_identifier:
  eisbn:
  - 978-1-6654-9996-5
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: An AI benchmark for Diagnosis, Reconfiguration & Planning
type: conference
user_id: '261203'
year: '2022'
...