[{"language":[{"iso":"eng"}],"year":"2026","_id":"6989","page":"1-5","publisher":"IEEE","date_updated":"2026-06-15T20:52:13Z","doi":"10.1109/DDECS69233.2026.11520985","conference":{"location":"Bratislava, Slovakia","name":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"},"status":"public","citation":{"ama":"Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE; 2026:1-5. doi:<a href=\"https://doi.org/10.1109/DDECS69233.2026.11520985\">10.1109/DDECS69233.2026.11520985</a>","mla":"Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>, IEEE, 2026, pp. 1–5, doi:<a href=\"https://doi.org/10.1109/DDECS69233.2026.11520985\">10.1109/DDECS69233.2026.11520985</a>.","chicago":"Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>, 1–5. IEEE, 2026. <a href=\"https://doi.org/10.1109/DDECS69233.2026.11520985\">https://doi.org/10.1109/DDECS69233.2026.11520985</a>.","short":"S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5.","bibtex":"@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={<a href=\"https://doi.org/10.1109/DDECS69233.2026.11520985\">10.1109/DDECS69233.2026.11520985</a>}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026}, pages={1–5} }","apa":"Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., &#38; Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. In <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i> (pp. 1–5). Bratislava, Slovakia: IEEE. <a href=\"https://doi.org/10.1109/DDECS69233.2026.11520985\">https://doi.org/10.1109/DDECS69233.2026.11520985</a>","alphadin":"<span style=\"font-variant:small-caps;\">Sadeghi-Kohan, Somayeh</span> ; <span style=\"font-variant:small-caps;\">Awais, Muhammad</span> ; <span style=\"font-variant:small-caps;\">Ahmed, Qazi Arbab</span> ; <span style=\"font-variant:small-caps;\">Platzner, Marco</span> ; <span style=\"font-variant:small-caps;\">Hellebrand, Sybille</span> ; <span style=\"font-variant:small-caps;\">Jungeblut, Thorsten</span> ; <span style=\"font-variant:small-caps;\">Wunderlich, Hans-Joachim</span>: Reliability Assessment in Approximate Accelerator Synthesis. In: <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i> : IEEE, 2026, S. 1–5","ieee":"S. Sadeghi-Kohan <i>et al.</i>, “Reliability Assessment in Approximate Accelerator Synthesis,” in <i>2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>, Bratislava, Slovakia, 2026, pp. 1–5."},"author":[{"last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","first_name":"Somayeh"},{"first_name":"Muhammad","last_name":"Awais","full_name":"Awais, Muhammad"},{"last_name":"Ahmed","full_name":"Ahmed, Qazi Arbab","orcid":"0000-0002-1837-2254","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0002-1837-2254/work/217757502","id":"257333","first_name":"Qazi Arbab"},{"last_name":"Platzner","full_name":"Platzner, Marco","first_name":"Marco"},{"last_name":"Hellebrand","full_name":"Hellebrand, Sybille","first_name":"Sybille"},{"full_name":"Jungeblut, Thorsten","orcid":"0000-0001-7425-8766","last_name":"Jungeblut","orcid_put_code_url":"https://api.orcid.org/v2.0/0000-0001-7425-8766/work/217757504","id":"242294","first_name":"Thorsten"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"publication":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","publication_status":"published","user_id":"257333","publication_identifier":{"eisbn":["979-8-3315-8229-6"]},"type":"conference","title":"Reliability Assessment in Approximate Accelerator Synthesis","date_created":"2026-06-15T20:51:45Z","department":[{"_id":"103"}]}]