Reliability Assessment in Approximate Accelerator Synthesis

conference paper Reliability Assessment in Approximate Accelerator Synthesis published Somayeh Sadeghi-Kohan author Muhammad Awais author Qazi Arbab Ahmed author 2573330000-0002-1837-2254 Marco Platzner author Sybille Hellebrand author Thorsten Jungeblut author 2422940000-0001-7425-8766 Hans-Joachim Wunderlich author 103 department 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) IEEE2026Bratislava, Slovakia eng 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)10.1109/DDECS69233.2026.11520985 1-5 S. Sadeghi-Kohan et al., “Reliability Assessment in Approximate Accelerator Synthesis,” in 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Bratislava, Slovakia, 2026, pp. 1–5. Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S., Jungeblut, T., & Wunderlich, H.-J. (2026). Reliability Assessment in Approximate Accelerator Synthesis. In 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (pp. 1–5). Bratislava, Slovakia: IEEE. <a href="https://doi.org/10.1109/DDECS69233.2026.11520985">https://doi.org/10.1109/DDECS69233.2026.11520985</a> @inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026, title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a>}, booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand, Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026}, pages={1–5} } Sadeghi-Kohan, Somayeh ; Awais, Muhammad ; Ahmed, Qazi Arbab ; Platzner, Marco ; Hellebrand, Sybille ; Jungeblut, Thorsten ; Wunderlich, Hans-Joachim: Reliability Assessment in Approximate Accelerator Synthesis. In: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : IEEE, 2026, S. 1–5 Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner, Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability Assessment in Approximate Accelerator Synthesis.” In 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 1–5. IEEE, 2026. <a href="https://doi.org/10.1109/DDECS69233.2026.11520985">https://doi.org/10.1109/DDECS69233.2026.11520985</a>. S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut, H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5. Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate Accelerator Synthesis. In: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS). IEEE; 2026:1-5. doi:<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a> Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator Synthesis.” 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5, doi:<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a>. 69892026-06-15T20:51:45Z2026-06-15T20:52:13Z