---
_id: '6989'
author:
- first_name: Somayeh
  full_name: Sadeghi-Kohan, Somayeh
  last_name: Sadeghi-Kohan
- first_name: Muhammad
  full_name: Awais, Muhammad
  last_name: Awais
- first_name: Qazi Arbab
  full_name: Ahmed, Qazi Arbab
  id: '257333'
  last_name: Ahmed
  orcid: 0000-0002-1837-2254
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0002-1837-2254/work/217757502
- first_name: Marco
  full_name: Platzner, Marco
  last_name: Platzner
- first_name: Sybille
  full_name: Hellebrand, Sybille
  last_name: Hellebrand
- first_name: Thorsten
  full_name: Jungeblut, Thorsten
  id: '242294'
  last_name: Jungeblut
  orcid: 0000-0001-7425-8766
  orcid_put_code_url: https://api.orcid.org/v2.0/0000-0001-7425-8766/work/217757504
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  alphadin: '<span style="font-variant:small-caps;">Sadeghi-Kohan, Somayeh</span>
    ; <span style="font-variant:small-caps;">Awais, Muhammad</span> ; <span style="font-variant:small-caps;">Ahmed,
    Qazi Arbab</span> ; <span style="font-variant:small-caps;">Platzner, Marco</span>
    ; <span style="font-variant:small-caps;">Hellebrand, Sybille</span> ; <span style="font-variant:small-caps;">Jungeblut,
    Thorsten</span> ; <span style="font-variant:small-caps;">Wunderlich, Hans-Joachim</span>:
    Reliability Assessment in Approximate Accelerator Synthesis. In: <i>2026 IEEE
    29th International Symposium on Design and Diagnostics of Electronic Circuits
    and Systems (DDECS)</i> : IEEE, 2026, S. 1–5'
  ama: 'Sadeghi-Kohan S, Awais M, Ahmed QA, et al. Reliability Assessment in Approximate
    Accelerator Synthesis. In: <i>2026 IEEE 29th International Symposium on Design
    and Diagnostics of Electronic Circuits and Systems (DDECS)</i>. IEEE; 2026:1-5.
    doi:<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a>'
  apa: 'Sadeghi-Kohan, S., Awais, M., Ahmed, Q. A., Platzner, M., Hellebrand, S.,
    Jungeblut, T., &#38; Wunderlich, H.-J. (2026). Reliability Assessment in Approximate
    Accelerator Synthesis. In <i>2026 IEEE 29th International Symposium on Design
    and Diagnostics of Electronic Circuits and Systems (DDECS)</i> (pp. 1–5). Bratislava,
    Slovakia: IEEE. <a href="https://doi.org/10.1109/DDECS69233.2026.11520985">https://doi.org/10.1109/DDECS69233.2026.11520985</a>'
  bibtex: '@inproceedings{Sadeghi-Kohan_Awais_Ahmed_Platzner_Hellebrand_Jungeblut_Wunderlich_2026,
    title={Reliability Assessment in Approximate Accelerator Synthesis}, DOI={<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a>},
    booktitle={2026 IEEE 29th International Symposium on Design and Diagnostics of
    Electronic Circuits and Systems (DDECS)}, publisher={IEEE}, author={Sadeghi-Kohan,
    Somayeh and Awais, Muhammad and Ahmed, Qazi Arbab and Platzner, Marco and Hellebrand,
    Sybille and Jungeblut, Thorsten and Wunderlich, Hans-Joachim}, year={2026}, pages={1–5}
    }'
  chicago: Sadeghi-Kohan, Somayeh, Muhammad Awais, Qazi Arbab Ahmed, Marco Platzner,
    Sybille Hellebrand, Thorsten Jungeblut, and Hans-Joachim Wunderlich. “Reliability
    Assessment in Approximate Accelerator Synthesis.” In <i>2026 IEEE 29th International
    Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)</i>,
    1–5. IEEE, 2026. <a href="https://doi.org/10.1109/DDECS69233.2026.11520985">https://doi.org/10.1109/DDECS69233.2026.11520985</a>.
  ieee: S. Sadeghi-Kohan <i>et al.</i>, “Reliability Assessment in Approximate Accelerator
    Synthesis,” in <i>2026 IEEE 29th International Symposium on Design and Diagnostics
    of Electronic Circuits and Systems (DDECS)</i>, Bratislava, Slovakia, 2026, pp.
    1–5.
  mla: Sadeghi-Kohan, Somayeh, et al. “Reliability Assessment in Approximate Accelerator
    Synthesis.” <i>2026 IEEE 29th International Symposium on Design and Diagnostics
    of Electronic Circuits and Systems (DDECS)</i>, IEEE, 2026, pp. 1–5, doi:<a href="https://doi.org/10.1109/DDECS69233.2026.11520985">10.1109/DDECS69233.2026.11520985</a>.
  short: 'S. Sadeghi-Kohan, M. Awais, Q.A. Ahmed, M. Platzner, S. Hellebrand, T. Jungeblut,
    H.-J. Wunderlich, in: 2026 IEEE 29th International Symposium on Design and Diagnostics
    of Electronic Circuits and Systems (DDECS), IEEE, 2026, pp. 1–5.'
conference:
  location: Bratislava, Slovakia
  name: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic
    Circuits and Systems (DDECS)
date_created: 2026-06-15T20:51:45Z
date_updated: 2026-06-15T20:52:13Z
department:
- _id: '103'
doi: 10.1109/DDECS69233.2026.11520985
language:
- iso: eng
page: 1-5
publication: 2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic
  Circuits and Systems (DDECS)
publication_identifier:
  eisbn:
  - 979-8-3315-8229-6
publication_status: published
publisher: IEEE
status: public
title: Reliability Assessment in Approximate Accelerator Synthesis
type: conference
user_id: '257333'
year: '2026'
...