Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit
J.A. Weicht, F. Hamelmann, G. Behrens, Journal of Physics: Conference Series 682 (2016).
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Journal of Physics: Conference Series
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682
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012017
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Weicht, J A ; Hamelmann, Frank ; Behrens, Grit: Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. In: Journal of Physics: Conference Series Bd. 682, IOP Publishing (2016)
Weicht JA, Hamelmann F, Behrens G. Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. Journal of Physics: Conference Series. 2016;682. doi:10.1088/1742-6596/682/1/012017
Weicht, J. A., Hamelmann, F., & Behrens, G. (2016). Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit. Journal of Physics: Conference Series, 682. https://doi.org/10.1088/1742-6596/682/1/012017
@article{Weicht_Hamelmann_Behrens_2016, title={Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit}, volume={682}, DOI={10.1088/1742-6596/682/1/012017}, number={012017}, journal={Journal of Physics: Conference Series}, publisher={IOP Publishing}, author={Weicht, J A and Hamelmann, Frank and Behrens, Grit}, year={2016} }
Weicht, J A, Frank Hamelmann, and Grit Behrens. “Simulation of Light-Induced Degradation of Μc-Si in a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent Circuit.” Journal of Physics: Conference Series 682 (2016). https://doi.org/10.1088/1742-6596/682/1/012017.
J. A. Weicht, F. Hamelmann, and G. Behrens, “Simulation of light-induced degradation of μc-Si in a-Si/μc-Si tandem solar cells by the diode equivalent circuit,” Journal of Physics: Conference Series, vol. 682, 2016.
Weicht, J. A., et al. “Simulation of Light-Induced Degradation of Μc-Si in a-Si/Μc-Si Tandem Solar Cells by the Diode Equivalent Circuit.” Journal of Physics: Conference Series, vol. 682, 012017, IOP Publishing, 2016, doi:10.1088/1742-6596/682/1/012017.
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