Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra
M. Wortmann, K. Viertel, M. Westphal, D. Graulich, Y. Yang, M. Gärner, J. Schmalhorst, N. Frese, T. Kuschel, Small Methods 8 (2024).
Artikel
| Veröffentlicht
| Englisch
Autor*in
Wortmann, Martin;
Viertel, Klaus
;
Westphal, Michael;
Graulich, Dominik;
Yang, Yang;
Gärner, Maik;
Schmalhorst, Jan;
Frese, Natalie;
Kuschel, Timo
;
Westphal, Michael;
Graulich, Dominik;
Yang, Yang;
Gärner, Maik;
Schmalhorst, Jan;
Frese, Natalie;
Kuschel, TimoErscheinungsjahr
Zeitschriftentitel
Small Methods
Band
8
Zeitschriftennummer
3
ISSN
eISSN
FH-PUB-ID
Zitieren
Wortmann, Martin ; Viertel, Klaus ; Westphal, Michael ; Graulich, Dominik ; Yang, Yang ; Gärner, Maik ; Schmalhorst, Jan ; Frese, Natalie ; u. a.: Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. In: Small Methods Bd. 8, Wiley (2024), Nr. 3
Wortmann M, Viertel K, Westphal M, et al. Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. Small Methods. 2024;8(3). doi:10.1002/smtd.202300944
Wortmann, M., Viertel, K., Westphal, M., Graulich, D., Yang, Y., Gärner, M., … Kuschel, T. (2024). Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra. Small Methods, 8(3). https://doi.org/10.1002/smtd.202300944
@article{Wortmann_Viertel_Westphal_Graulich_Yang_Gärner_Schmalhorst_Frese_Kuschel_2024, title={Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra}, volume={8}, DOI={10.1002/smtd.202300944}, number={3}, journal={Small Methods}, publisher={Wiley}, author={Wortmann, Martin and Viertel, Klaus and Westphal, Michael and Graulich, Dominik and Yang, Yang and Gärner, Maik and Schmalhorst, Jan and Frese, Natalie and Kuschel, Timo}, year={2024} }
Wortmann, Martin, Klaus Viertel, Michael Westphal, Dominik Graulich, Yang Yang, Maik Gärner, Jan Schmalhorst, Natalie Frese, and Timo Kuschel. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” Small Methods 8, no. 3 (2024). https://doi.org/10.1002/smtd.202300944.
M. Wortmann et al., “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra,” Small Methods, vol. 8, no. 3, 2024.
Wortmann, Martin, et al. “Sub‐Nanometer Depth Profiling of Native Metal Oxide Layers Within Single Fixed‐Angle X‐Ray Photoelectron Spectra.” Small Methods, vol. 8, no. 3, Wiley, 2024, doi:10.1002/smtd.202300944.
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