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Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*

S. Sanaullah, H. Honda, K. Roy, A. Schneider, J. Waßmuth, T. Jungeblut, in: 2025 22nd International Learning and Technology Conference (L&T), IEEE, 2025, pp. 274–279.

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Konferenzbeitrag | Veröffentlicht | Englisch
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Abstract
The selection of optimal neural models in Spiking Neural Networks (SNNs) traditionally depends on a trial-and-error approach, which is both time-consuming and sometimes tends to suboptimal selection of the neural model. This research study explores the integration of Automated Machine Learning (AutoML) techniques into SNNs to simplify the process of designing an SNN model by automatically selecting the most optimal neural model. For example, in traditional neural networks, AutoML proves that it has the potential to significantly reduce the time and effort required to identify the best-performing architectures, by automating the selection and updating of loss functions and hyper-parametric values. To this end, we present a stand-alone framework for applying AutoML in SNNs, highlighting how this approach can improve accuracy, efficiency, and reliability in the selection process of optimal neural models, as these neural models are the core principle of designing SNN architecture. The proposed method not only accelerates the development of SNN models but also enhances their performance by systematically identifying optimal configurations that might be overlooked through manual methods. Therefore, to validate our approach, the proposed architecture was tested using different well-known benchmarks with different sets of neurons, ranging from 100 to 3000 neurons, and demonstrated state-of-the-art results in image classification tasks.
Erscheinungsjahr
Titel des Konferenzbandes
2025 22nd International Learning and Technology Conference (L&T)
Seite
274-279
Konferenz
2025 22nd International Learning and Technology Conference (L&T)
Konferenzort
Jeddah, Saudi Arabia
Konferenzdatum
2025-01-15 – 2025-01-16
FH-PUB-ID

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Sanaullah, Sanaullah ; Honda, Hirotada ; Roy, Kaushik ; Schneider, Axel ; Waßmuth, Joachim ; Jungeblut, Thorsten: Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*. In: 2025 22nd International Learning and Technology Conference (L&T) : IEEE, 2025, S. 274–279
Sanaullah S, Honda H, Roy K, Schneider A, Waßmuth J, Jungeblut T. Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*. In: 2025 22nd International Learning and Technology Conference (L&T). IEEE; 2025:274-279. doi:10.1109/LT64002.2025.10941536
Sanaullah, S., Honda, H., Roy, K., Schneider, A., Waßmuth, J., & Jungeblut, T. (2025). Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*. In 2025 22nd International Learning and Technology Conference (L&T) (pp. 274–279). Jeddah, Saudi Arabia: IEEE. https://doi.org/10.1109/LT64002.2025.10941536
@inproceedings{Sanaullah_Honda_Roy_Schneider_Waßmuth_Jungeblut_2025, title={Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*}, DOI={10.1109/LT64002.2025.10941536}, booktitle={2025 22nd International Learning and Technology Conference (L&T)}, publisher={IEEE}, author={Sanaullah, Sanaullah and Honda, Hirotada and Roy, Kaushik and Schneider, Axel and Waßmuth, Joachim and Jungeblut, Thorsten}, year={2025}, pages={274–279} }
Sanaullah, Sanaullah, Hirotada Honda, Kaushik Roy, Axel Schneider, Joachim Waßmuth, and Thorsten Jungeblut. “Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*.” In 2025 22nd International Learning and Technology Conference (L&T), 274–79. IEEE, 2025. https://doi.org/10.1109/LT64002.2025.10941536.
S. Sanaullah, H. Honda, K. Roy, A. Schneider, J. Waßmuth, and T. Jungeblut, “Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*,” in 2025 22nd International Learning and Technology Conference (L&T), Jeddah, Saudi Arabia, 2025, pp. 274–279.
Sanaullah, Sanaullah, et al. “Automating Neural Model Selection in Spiking Neural Networks Using AutoML Techniques*.” 2025 22nd International Learning and Technology Conference (L&T), IEEE, 2025, pp. 274–79, doi:10.1109/LT64002.2025.10941536.

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