Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, C. Meliani, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, IEEE, 2013, pp. 147–149.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Wessel, J.;
Schmalz, K.;
Cahill, Brian
;
Gastrock, G.;
Meliani, C.
;
Gastrock, G.;
Meliani, C.herausgebende Körperschaft
Institute of Electrical and Electronics Engineers (IEEE)
Erscheinungsjahr
Titel des Konferenzbandes
2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
Seite
147-149
Konferenz
2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
Konferenzort
Austin, TX
Konferenzdatum
2013-01-21 – 2013-01-23
ISBN
FH-PUB-ID
Zitieren
Wessel, J. ; Schmalz, K. ; Cahill, Brian ; Gastrock, G. ; Meliani, C.: Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE) (Hrsg.): 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : IEEE, 2013, S. 147–149
Wessel J, Schmalz K, Cahill B, Gastrock G, Meliani C. Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE), ed. 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. IEEE; 2013:147-149. doi:10.1109/SiRF.2013.6489461
Wessel, J., Schmalz, K., Cahill, B., Gastrock, G., & Meliani, C. (2013). Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (pp. 147–149). Austin, TX : IEEE. https://doi.org/10.1109/SiRF.2013.6489461
@inproceedings{Wessel_Schmalz_Cahill_Gastrock_Meliani_2013, title={Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz}, DOI={10.1109/SiRF.2013.6489461}, booktitle={2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems}, publisher={IEEE}, author={Wessel, J. and Schmalz, K. and Cahill, Brian and Gastrock, G. and Meliani, C.}, editor={Institute of Electrical and Electronics Engineers (IEEE)Editor}, year={2013}, pages={147–149} }
Wessel, J., K. Schmalz, Brian Cahill, G. Gastrock, and C. Meliani. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” In 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, edited by Institute of Electrical and Electronics Engineers (IEEE), 147–49. IEEE, 2013. https://doi.org/10.1109/SiRF.2013.6489461.
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, and C. Meliani, “Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz,” in 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Austin, TX , 2013, pp. 147–149.
Wessel, J., et al. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, edited by Institute of Electrical and Electronics Engineers (IEEE), IEEE, 2013, pp. 147–49, doi:10.1109/SiRF.2013.6489461.
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