Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, C. Meliani, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, IEEE, 2013, pp. 147–149.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Wessel, J.;
Schmalz, K.;
Cahill, Brian
;
Gastrock, G.;
Meliani, C.
;
Gastrock, G.;
Meliani, C.herausgebende Körperschaft
Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Experimental results of contactless and label-free characterization techniques of cell cultivation are presented. The two demonstrated approaches are compared at two frequencies, 7 GHz and 240 GHz in terms of sensitivity and applicability. At 7 GHz, measurements have been performed using a rat-race based characterizing system. Furthermore, the sensitivity of spectroscopy measurements at 240 GHz has been compared for two extracted parameters: phase and amplitude. The conducted experiments demonstrate that by selecting the proper characterization parameter, the presented techniques are suitable for cell cultivation monitoring in a pipe based microfluidic system with PTFE tubes. Especially, the use of higher frequencies enables a higher compactness.
Erscheinungsjahr
Titel des Konferenzbandes
2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
Seite
147-149
Konferenz
2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
Konferenzort
Austin, TX
Konferenzdatum
2013-01-21 – 2013-01-23
ISBN
FH-PUB-ID
Zitieren
Wessel, J. ; Schmalz, K. ; Cahill, Brian ; Gastrock, G. ; Meliani, C.: Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE) (Hrsg.): 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : IEEE, 2013, S. 147–149
Wessel J, Schmalz K, Cahill B, Gastrock G, Meliani C. Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE), ed. 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. IEEE; 2013:147-149. doi:10.1109/SiRF.2013.6489461
Wessel, J., Schmalz, K., Cahill, B., Gastrock, G., & Meliani, C. (2013). Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (pp. 147–149). Austin, TX : IEEE. https://doi.org/10.1109/SiRF.2013.6489461
@inproceedings{Wessel_Schmalz_Cahill_Gastrock_Meliani_2013, title={Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz}, DOI={10.1109/SiRF.2013.6489461}, booktitle={2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems}, publisher={IEEE}, author={Wessel, J. and Schmalz, K. and Cahill, Brian and Gastrock, G. and Meliani, C.}, editor={Institute of Electrical and Electronics Engineers (IEEE)Editor}, year={2013}, pages={147–149} }
Wessel, J., K. Schmalz, Brian Cahill, G. Gastrock, and C. Meliani. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” In 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, edited by Institute of Electrical and Electronics Engineers (IEEE), 147–49. IEEE, 2013. https://doi.org/10.1109/SiRF.2013.6489461.
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, and C. Meliani, “Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz,” in 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Austin, TX , 2013, pp. 147–149.
Wessel, J., et al. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” 2013 IEEE 13th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, edited by Institute of Electrical and Electronics Engineers (IEEE), IEEE, 2013, pp. 147–49, doi:10.1109/SiRF.2013.6489461.
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