Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, C. Meliani, in: Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, IEEE, 2013, pp. 76–78.
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Konferenzbeitrag
| Veröffentlicht
| Englisch
Autor*in
Wessel, Jan;
Schmalz, Klaus;
Cahill, Brian
;
Gastrock, Gunter;
Meliani, Chafik
;
Gastrock, Gunter;
Meliani, Chafikherausgebende Körperschaft
Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Experimental results of contactless and label-free characterization techniques of cell cultivation are presented. The two demonstrated approaches are compared at two frequencies, 7 GHz and 240 GHz in terms of sensitivity and applicability. At 7 GHz, measurements have been performed using a rat-race based characterizing system. Furthermore, the sensitivity of spectroscopy measurements at 240 GHz has been compared for two extracted parameters: phase and amplitude. The conducted experiments demonstrate that by selecting the proper characterization parameter, the presented techniques are suitable for cell cultivation monitoring in a pipe based microfluidic system with PTFE tubes. Especially, the use of higher frequencies enables a higher compactness.
Erscheinungsjahr
Titel des Konferenzbandes
2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications
Seite
76-78
Konferenz
2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications (PAWR)
Konferenzort
Austin, TX, USA
Konferenzdatum
2013-01-20 – 2013-01-20
ISBN
FH-PUB-ID
Zitieren
Wessel, Jan ; Schmalz, Klaus ; Cahill, Brian ; Gastrock, Gunter ; Meliani, Chafik: Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE) (Hrsg.): 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications : IEEE, 2013, S. 76–78
Wessel J, Schmalz K, Cahill B, Gastrock G, Meliani C. Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In: Institute of Electrical and Electronics Engineers (IEEE), ed. 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications. IEEE; 2013:76-78. doi:10.1109/PAWR.2013.6490194
Wessel, J., Schmalz, K., Cahill, B., Gastrock, G., & Meliani, C. (2013). Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz. In Institute of Electrical and Electronics Engineers (IEEE) (Ed.), 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications (pp. 76–78). Austin, TX, USA: IEEE. https://doi.org/10.1109/PAWR.2013.6490194
@inproceedings{Wessel_Schmalz_Cahill_Gastrock_Meliani_2013, title={Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz}, DOI={10.1109/PAWR.2013.6490194}, booktitle={2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications}, publisher={IEEE}, author={Wessel, Jan and Schmalz, Klaus and Cahill, Brian and Gastrock, Gunter and Meliani, Chafik}, editor={Institute of Electrical and Electronics Engineers (IEEE)Editor}, year={2013}, pages={76–78} }
Wessel, Jan, Klaus Schmalz, Brian Cahill, Gunter Gastrock, and Chafik Meliani. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” In 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, edited by Institute of Electrical and Electronics Engineers (IEEE), 76–78. IEEE, 2013. https://doi.org/10.1109/PAWR.2013.6490194.
J. Wessel, K. Schmalz, B. Cahill, G. Gastrock, and C. Meliani, “Contactless characterization of yeast cell cultivation at 7 GHz and 240 GHz,” in 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, Austin, TX, USA, 2013, pp. 76–78.
Wessel, Jan, et al. “Contactless Characterization of Yeast Cell Cultivation at 7 GHz and 240 GHz.” 2013 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, edited by Institute of Electrical and Electronics Engineers (IEEE), IEEE, 2013, pp. 76–78, doi:10.1109/PAWR.2013.6490194.
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